Localization processes near the superconductor-insulator transition in Bi2Sr2-xLaxCuOy nanoscale thin films
Thin film Bi2Sr2 - xLaxCuOy (x = 0.6) was deposited onto SrTiO3 by using DC magnetron sputtering. The structural characterization was carried by X-ray diffraction and the transport properties were carried by resistivity and Hall Effect measurements. The underdoped system near superconductor-insulato...
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Veröffentlicht in: | Thin solid films 2010-11, Vol.519 (2), p.591-594 |
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