Localization processes near the superconductor-insulator transition in Bi2Sr2-xLaxCuOy nanoscale thin films

Thin film Bi2Sr2 - xLaxCuOy (x = 0.6) was deposited onto SrTiO3 by using DC magnetron sputtering. The structural characterization was carried by X-ray diffraction and the transport properties were carried by resistivity and Hall Effect measurements. The underdoped system near superconductor-insulato...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:Thin solid films 2010-11, Vol.519 (2), p.591-594
Hauptverfasser: MATEI, I, RAFFY, H, POP, A. V
Format: Artikel
Sprache:eng
Schlagworte:
Online-Zugang:Volltext
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!