Effect of annealing on the interfaces of giant-magnetoresistance spin-valve structures

Si/Ta/NiFe/Cu/NiFe/FeMn/Ta spin-valve layered structures were analyzed by x-ray reflectivity, before and after annealing at 240, 320, and 360 °C. Specularly reflected x-ray data were collected using a high-resolution reflectometer and were analyzed by least-squares refinement. The thicknesses of the...

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Veröffentlicht in:	Applied physics letters 1993-03, Vol.62 (13), p.1478-1480
Hauptverfasser:	Huang, T. C., Nozieres, J.-P., Speriosu, V. S., Gurney, B. A., Lefakis, H.
Format:	Artikel
Sprache:	eng
Schlagworte:	Physics
Online-Zugang:	Volltext
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