Domain formation mechanism of the Si(110) “ 16 × 2 ” reconstruction
The main factor that determines which of the two domains forms upon reconstruction of the Si(110) “16×2” surface has been investigated. Low-energy electron diffraction (LEED) and scanning tunneling microscopy (STM) images showed that the domain orientation was independent of the heating current dire...
Gespeichert in:
| Veröffentlicht in: | Physical review. B 2017-05, Vol.95 (20), p.205306, Article 205306 |
|---|---|
| Hauptverfasser: | , , , , , , , , |
| Format: | Artikel |
| Sprache: | eng |
| Schlagworte: | |
| Online-Zugang: | Volltext |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| container_end_page | |
|---|---|
| container_issue | 20 |
| container_start_page | 205306 |
| container_title | Physical review. B |
| container_volume | 95 |
| creator | Lewis, N. K. Clayburn, N. B. Brunkow, E. Gay, T. J. Lassailly, Y. Fujii, J. Vobornik, I. Flavell, W. R. Seddon, E. A. |
| description | The main factor that determines which of the two domains forms upon reconstruction of the Si(110) “16×2” surface has been investigated. Low-energy electron diffraction (LEED) and scanning tunneling microscopy (STM) images showed that the domain orientation was independent of the heating current direction used to induce the Si(110) “16×2” reconstruction. Reciprocal-space lattice models of the reconstruction allowed for the correct identification of domain orientations in the LEED images, and they confirmed that the reconstruction is two dimensionally chiral. It is proposed that the domain orientation upon surface reconstruction is determined by the direction of monatomic steps present on the Si(110) plane. This is determined in turn by the direction at which the surface is polished off-axis from the (110) plane. |
| doi_str_mv | 10.1103/PhysRevB.95.205306 |
| format | Article |
| fullrecord | <record><control><sourceid>proquest_hal_p</sourceid><recordid>TN_cdi_hal_primary_oai_HAL_hal_04378842v1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>2123715102</sourcerecordid><originalsourceid>FETCH-LOGICAL-c224t-fde838b094a7398d27f82759ecd26cdce3c6ae9f036fe439a5fd8d44b588bc703</originalsourceid><addsrcrecordid>eNo9kM1KAzEUhYMoWLQv4Crgxi5a8z_JstafCgXFn3VIMwkzpTOpybTQnW_hRp_GN_FJnDLa1T1cvnvu4QBwhtEIY0QvH4ttenKbq5HiI4I4ReIA9AgTaqiUUId7zdEx6Ke0QAhhgVSGVA9Mr0Nlyhr6ECvTlKGGlbOFqctUweBhUzj4XF60bwbw5_0TYgG_PyBp9ReMzoY6NXFtd3en4MibZXL9v3kCXm9vXibT4ezh7n4yng0tIawZ-txJKudIMZNRJXOSeUkyrpzNibC5ddQK45RHVHjHqDLc5zJnbM6lnNsM0RMw6HwLs9SrWFYmbnUwpZ6OZ3q3Q4xmUjKywS173rGrGN7WLjV6EdaxbuNpggnNMMeItBTpKBtDStH5vS1Gelew_i9YK667gukv99NvPw</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>2123715102</pqid></control><display><type>article</type><title>Domain formation mechanism of the Si(110) “ 16 × 2 ” reconstruction</title><source>American Physical Society Journals</source><creator>Lewis, N. K. ; Clayburn, N. B. ; Brunkow, E. ; Gay, T. J. ; Lassailly, Y. ; Fujii, J. ; Vobornik, I. ; Flavell, W. R. ; Seddon, E. A.</creator><creatorcontrib>Lewis, N. K. ; Clayburn, N. B. ; Brunkow, E. ; Gay, T. J. ; Lassailly, Y. ; Fujii, J. ; Vobornik, I. ; Flavell, W. R. ; Seddon, E. A.</creatorcontrib><description>The main factor that determines which of the two domains forms upon reconstruction of the Si(110) “16×2” surface has been investigated. Low-energy electron diffraction (LEED) and scanning tunneling microscopy (STM) images showed that the domain orientation was independent of the heating current direction used to induce the Si(110) “16×2” reconstruction. Reciprocal-space lattice models of the reconstruction allowed for the correct identification of domain orientations in the LEED images, and they confirmed that the reconstruction is two dimensionally chiral. It is proposed that the domain orientation upon surface reconstruction is determined by the direction of monatomic steps present on the Si(110) plane. This is determined in turn by the direction at which the surface is polished off-axis from the (110) plane.</description><identifier>ISSN: 2469-9950</identifier><identifier>EISSN: 2469-9969</identifier><identifier>DOI: 10.1103/PhysRevB.95.205306</identifier><language>eng</language><publisher>College Park: American Physical Society</publisher><subject>Crystal lattices ; Domains ; Image reconstruction ; Low energy electron diffraction ; Physics</subject><ispartof>Physical review. B, 2017-05, Vol.95 (20), p.205306, Article 205306</ispartof><rights>Copyright American Physical Society May 15, 2017</rights><rights>Distributed under a Creative Commons Attribution 4.0 International License</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c224t-fde838b094a7398d27f82759ecd26cdce3c6ae9f036fe439a5fd8d44b588bc703</citedby><cites>FETCH-LOGICAL-c224t-fde838b094a7398d27f82759ecd26cdce3c6ae9f036fe439a5fd8d44b588bc703</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>230,314,780,784,885,2876,2877,27924,27925</link.rule.ids><backlink>$$Uhttps://hal.science/hal-04378842$$DView record in HAL$$Hfree_for_read</backlink></links><search><creatorcontrib>Lewis, N. K.</creatorcontrib><creatorcontrib>Clayburn, N. B.</creatorcontrib><creatorcontrib>Brunkow, E.</creatorcontrib><creatorcontrib>Gay, T. J.</creatorcontrib><creatorcontrib>Lassailly, Y.</creatorcontrib><creatorcontrib>Fujii, J.</creatorcontrib><creatorcontrib>Vobornik, I.</creatorcontrib><creatorcontrib>Flavell, W. R.</creatorcontrib><creatorcontrib>Seddon, E. A.</creatorcontrib><title>Domain formation mechanism of the Si(110) “ 16 × 2 ” reconstruction</title><title>Physical review. B</title><description>The main factor that determines which of the two domains forms upon reconstruction of the Si(110) “16×2” surface has been investigated. Low-energy electron diffraction (LEED) and scanning tunneling microscopy (STM) images showed that the domain orientation was independent of the heating current direction used to induce the Si(110) “16×2” reconstruction. Reciprocal-space lattice models of the reconstruction allowed for the correct identification of domain orientations in the LEED images, and they confirmed that the reconstruction is two dimensionally chiral. It is proposed that the domain orientation upon surface reconstruction is determined by the direction of monatomic steps present on the Si(110) plane. This is determined in turn by the direction at which the surface is polished off-axis from the (110) plane.</description><subject>Crystal lattices</subject><subject>Domains</subject><subject>Image reconstruction</subject><subject>Low energy electron diffraction</subject><subject>Physics</subject><issn>2469-9950</issn><issn>2469-9969</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2017</creationdate><recordtype>article</recordtype><recordid>eNo9kM1KAzEUhYMoWLQv4Crgxi5a8z_JstafCgXFn3VIMwkzpTOpybTQnW_hRp_GN_FJnDLa1T1cvnvu4QBwhtEIY0QvH4ttenKbq5HiI4I4ReIA9AgTaqiUUId7zdEx6Ke0QAhhgVSGVA9Mr0Nlyhr6ECvTlKGGlbOFqctUweBhUzj4XF60bwbw5_0TYgG_PyBp9ReMzoY6NXFtd3en4MibZXL9v3kCXm9vXibT4ezh7n4yng0tIawZ-txJKudIMZNRJXOSeUkyrpzNibC5ddQK45RHVHjHqDLc5zJnbM6lnNsM0RMw6HwLs9SrWFYmbnUwpZ6OZ3q3Q4xmUjKywS173rGrGN7WLjV6EdaxbuNpggnNMMeItBTpKBtDStH5vS1Gelew_i9YK667gukv99NvPw</recordid><startdate>20170519</startdate><enddate>20170519</enddate><creator>Lewis, N. K.</creator><creator>Clayburn, N. B.</creator><creator>Brunkow, E.</creator><creator>Gay, T. J.</creator><creator>Lassailly, Y.</creator><creator>Fujii, J.</creator><creator>Vobornik, I.</creator><creator>Flavell, W. R.</creator><creator>Seddon, E. A.</creator><general>American Physical Society</general><scope>AAYXX</scope><scope>CITATION</scope><scope>7SR</scope><scope>7U5</scope><scope>8BQ</scope><scope>8FD</scope><scope>H8D</scope><scope>JG9</scope><scope>L7M</scope><scope>1XC</scope></search><sort><creationdate>20170519</creationdate><title>Domain formation mechanism of the Si(110) “ 16 × 2 ” reconstruction</title><author>Lewis, N. K. ; Clayburn, N. B. ; Brunkow, E. ; Gay, T. J. ; Lassailly, Y. ; Fujii, J. ; Vobornik, I. ; Flavell, W. R. ; Seddon, E. A.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c224t-fde838b094a7398d27f82759ecd26cdce3c6ae9f036fe439a5fd8d44b588bc703</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2017</creationdate><topic>Crystal lattices</topic><topic>Domains</topic><topic>Image reconstruction</topic><topic>Low energy electron diffraction</topic><topic>Physics</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Lewis, N. K.</creatorcontrib><creatorcontrib>Clayburn, N. B.</creatorcontrib><creatorcontrib>Brunkow, E.</creatorcontrib><creatorcontrib>Gay, T. J.</creatorcontrib><creatorcontrib>Lassailly, Y.</creatorcontrib><creatorcontrib>Fujii, J.</creatorcontrib><creatorcontrib>Vobornik, I.</creatorcontrib><creatorcontrib>Flavell, W. R.</creatorcontrib><creatorcontrib>Seddon, E. A.</creatorcontrib><collection>CrossRef</collection><collection>Engineered Materials Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>Aerospace Database</collection><collection>Materials Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>Hyper Article en Ligne (HAL)</collection><jtitle>Physical review. B</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Lewis, N. K.</au><au>Clayburn, N. B.</au><au>Brunkow, E.</au><au>Gay, T. J.</au><au>Lassailly, Y.</au><au>Fujii, J.</au><au>Vobornik, I.</au><au>Flavell, W. R.</au><au>Seddon, E. A.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Domain formation mechanism of the Si(110) “ 16 × 2 ” reconstruction</atitle><jtitle>Physical review. B</jtitle><date>2017-05-19</date><risdate>2017</risdate><volume>95</volume><issue>20</issue><spage>205306</spage><pages>205306-</pages><artnum>205306</artnum><issn>2469-9950</issn><eissn>2469-9969</eissn><abstract>The main factor that determines which of the two domains forms upon reconstruction of the Si(110) “16×2” surface has been investigated. Low-energy electron diffraction (LEED) and scanning tunneling microscopy (STM) images showed that the domain orientation was independent of the heating current direction used to induce the Si(110) “16×2” reconstruction. Reciprocal-space lattice models of the reconstruction allowed for the correct identification of domain orientations in the LEED images, and they confirmed that the reconstruction is two dimensionally chiral. It is proposed that the domain orientation upon surface reconstruction is determined by the direction of monatomic steps present on the Si(110) plane. This is determined in turn by the direction at which the surface is polished off-axis from the (110) plane.</abstract><cop>College Park</cop><pub>American Physical Society</pub><doi>10.1103/PhysRevB.95.205306</doi></addata></record> |
| fulltext | fulltext |
| identifier | ISSN: 2469-9950 |
| ispartof | Physical review. B, 2017-05, Vol.95 (20), p.205306, Article 205306 |
| issn | 2469-9950 2469-9969 |
| language | eng |
| recordid | cdi_hal_primary_oai_HAL_hal_04378842v1 |
| source | American Physical Society Journals |
| subjects | Crystal lattices Domains Image reconstruction Low energy electron diffraction Physics |
| title | Domain formation mechanism of the Si(110) “ 16 × 2 ” reconstruction |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-26T19%3A36%3A15IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_hal_p&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Domain%20formation%20mechanism%20of%20the%20Si(110)%20%E2%80%9C%2016%20%C3%97%202%20%E2%80%9D%20reconstruction&rft.jtitle=Physical%20review.%20B&rft.au=Lewis,%20N.%20K.&rft.date=2017-05-19&rft.volume=95&rft.issue=20&rft.spage=205306&rft.pages=205306-&rft.artnum=205306&rft.issn=2469-9950&rft.eissn=2469-9969&rft_id=info:doi/10.1103/PhysRevB.95.205306&rft_dat=%3Cproquest_hal_p%3E2123715102%3C/proquest_hal_p%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=2123715102&rft_id=info:pmid/&rfr_iscdi=true |