Mid-infrared Fourier-transform spectrometer based on metamaterial lateral cladding suspended silicon waveguides

Integrated mid-infrared micro-spectrometers have a great potential for applications in environmental monitoring and space exploration. Silicon-on-insulator (SOI) is a promising platform to tackle this integration challenge, owing to its unique capability for large volume and low-cost production of u...

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Veröffentlicht in:Optics letters 2022-02, Vol.47 (4), p.810-813
Hauptverfasser: Duong Dinh, Thi Thuy, Le Roux, Xavier, Koompai, Natnicha, Melati, Daniele, Montesinos-Ballester, Miguel, González-Andrade, David, Cheben, Pavel, Velasco, Aitor V, Cassan, Eric, Marris-Morini, Delphine, Vivien, Laurent, Alonso-Ramos, Carlos
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Sprache:eng
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Zusammenfassung:Integrated mid-infrared micro-spectrometers have a great potential for applications in environmental monitoring and space exploration. Silicon-on-insulator (SOI) is a promising platform to tackle this integration challenge, owing to its unique capability for large volume and low-cost production of ultra-compact photonic circuits. However, the use of SOI in the mid-infrared is restricted by the strong absorption of the buried oxide layer for wavelengths beyond 4 µm. Here, we overcome this limitation by utilizing metamaterial-cladded suspended silicon waveguides to implement a spatial heterodyne Fourier-transform (SHFT) spectrometer operating at wavelengths near 5.5 µm. The metamaterial-cladded geometry allows removal of the buried oxide layer, yielding measured propagation loss below 2 dB/cm at wavelengths between 5.3 and 5.7 µm. The SHFT spectrometer comprises 19 Mach-Zehnder interferometers with a maximum arm length imbalance of 200 µm, achieving a measured spectral resolution of 13 cm and a free spectral range of 100 cm at wavelengths near 5.5 µm.
ISSN:0146-9592
1539-4794
DOI:10.1364/OL.450719