New probes based on carbon nano-cones for scanning probe microscopies

•New scanning probe microscopy probes are fabricated from unique carbon-cone-bearing graphenic micro-objects.•Cone structure is fully characterized before and after various probe processing options.•Specific surface defects make the cones more sensitive to ion or electron irradiation than carbon nan...

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Veröffentlicht in:	Ultramicroscopy 2023-03, Vol.245, p.113667-113667, Article 113667
Hauptverfasser:	Cours, Robin, Paredes, Germercy, Masseboeuf, Aurélien, Ondarçuhu, Thierry, Seine, Grégory, Puech, Pascal, Arenal, Raul, Piazza, Fabrice, Monthioux, Marc
Format:	Artikel
Sprache:	eng
Schlagworte:	Carbon cone Engineering Sciences Focused ion beam processes Graphene Irradiation damages Micromanipulator Scanning probe microscopy
Online-Zugang:	Volltext
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