Penetration depth of electron-doped infinite-layer Sr 0.88 La 0.12 CuO 2 + x thin films

The in-plane penetration depth of Sr0.88La0.12CuO2+x thin films at various doping obtained from oxygenreduction has been measured, using ac-susceptibility measurements. For the higher doping samples, the superfluiddensity deviates strongly from the s-wave behavior, suggesting, in analogy with other...

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Veröffentlicht in:	Physical review. B 2010-10, Vol.82 (14), Article 144529
Hauptverfasser:	Fruchter, L., Jovanovic, V., Raffy, H., Labdi, Sid, Bouquet, F., Li, Z. Z.
Format:	Artikel
Sprache:	eng
Schlagworte:	Physics
Online-Zugang:	Volltext
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