Atomic Force Microscopy Studies of Carbon Nitride (CNx) Films Deposited on a Conducting Polymer Substrate
Carbon nitride films were deposited onto indium tin oxide and undoped polybithiophene substrates using direct-current reactive magnetron sputtering. The local morphology and electronic properties of the deposited films were investigated using phase-imaging (PI-AFM) and current-sensing atomic force m...
Gespeichert in:
| Veröffentlicht in: | Journal of physical chemistry. C 2010-11, Vol.114 (43), p.18474-18480 |
|---|---|
| Hauptverfasser: | , , , , |
| Format: | Artikel |
| Sprache: | eng |
| Schlagworte: | |
| Online-Zugang: | Volltext |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| container_end_page | 18480 |
|---|---|
| container_issue | 43 |
| container_start_page | 18474 |
| container_title | Journal of physical chemistry. C |
| container_volume | 114 |
| creator | Byers, J. C Tamiasso-Martinhon, P Deslouis, C Pailleret, A Semenikhin, O. A |
| description | Carbon nitride films were deposited onto indium tin oxide and undoped polybithiophene substrates using direct-current reactive magnetron sputtering. The local morphology and electronic properties of the deposited films were investigated using phase-imaging (PI-AFM) and current-sensing atomic force microscopy (CS-AFM). The deposited materials were found to be generally amorphous with many individual nanostructured bonding domains. The nature of the substrate was found to have a significant effect on the microscopic distribution of carbon nitride regions with the carbon nitride films showing some long-range order when deposited onto an undoped polybithiophene substrate. |
| doi_str_mv | 10.1021/jp103795c |
| format | Article |
| fullrecord | <record><control><sourceid>acs_hal_p</sourceid><recordid>TN_cdi_hal_primary_oai_HAL_hal_04120027v1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>b179318958</sourcerecordid><originalsourceid>FETCH-LOGICAL-a293t-8fb8ac0f0567483158a1f8e2b210688f5ebf7d80b0b63a1cc9014760067169da3</originalsourceid><addsrcrecordid>eNptkMFLwzAYxYMoOKcH_4NcBHeofmnaJj2OujlhTmF6LmmaaEbblCQV99-7MZkXT9_j4_cevIfQNYE7AjG53_QEKMtTeYJGJKdxxJI0PT3qhJ2jC-83ACkFQkfITINtjcRz66TCz0Y666Xtt3gdhtooj63GhXCV7fDKBGdqhW-L1fcEz03TevygeutNUDXeAQIXtqsHGUz3gV9ts22Vw-uh8sGJoC7RmRaNV1e_d4ze57O3YhEtXx6fiukyEnFOQ8R1xYUEDWnGEk5JygXRXMVVTCDjXKeq0qzmUEGVUUGkzIEkLAPIGMnyWtAxmhxyP0VT9s60wm1LK0y5mC7L_Q8SEgPE7Iv8sfva3il9NBAo93uWxz137M2BFdKXGzu4btfiH-4H3HJyxw</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype></control><display><type>article</type><title>Atomic Force Microscopy Studies of Carbon Nitride (CNx) Films Deposited on a Conducting Polymer Substrate</title><source>ACS Publications</source><creator>Byers, J. C ; Tamiasso-Martinhon, P ; Deslouis, C ; Pailleret, A ; Semenikhin, O. A</creator><creatorcontrib>Byers, J. C ; Tamiasso-Martinhon, P ; Deslouis, C ; Pailleret, A ; Semenikhin, O. A</creatorcontrib><description>Carbon nitride films were deposited onto indium tin oxide and undoped polybithiophene substrates using direct-current reactive magnetron sputtering. The local morphology and electronic properties of the deposited films were investigated using phase-imaging (PI-AFM) and current-sensing atomic force microscopy (CS-AFM). The deposited materials were found to be generally amorphous with many individual nanostructured bonding domains. The nature of the substrate was found to have a significant effect on the microscopic distribution of carbon nitride regions with the carbon nitride films showing some long-range order when deposited onto an undoped polybithiophene substrate.</description><identifier>ISSN: 1932-7447</identifier><identifier>EISSN: 1932-7455</identifier><identifier>DOI: 10.1021/jp103795c</identifier><language>eng</language><publisher>American Chemical Society</publisher><subject>C: Surfaces, Interfaces, Catalysis ; Chemical Physics ; Physics</subject><ispartof>Journal of physical chemistry. C, 2010-11, Vol.114 (43), p.18474-18480</ispartof><rights>Copyright © 2010 American Chemical Society</rights><rights>Distributed under a Creative Commons Attribution 4.0 International License</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-a293t-8fb8ac0f0567483158a1f8e2b210688f5ebf7d80b0b63a1cc9014760067169da3</citedby><cites>FETCH-LOGICAL-a293t-8fb8ac0f0567483158a1f8e2b210688f5ebf7d80b0b63a1cc9014760067169da3</cites><orcidid>0000-0002-4296-4188</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://pubs.acs.org/doi/pdf/10.1021/jp103795c$$EPDF$$P50$$Gacs$$H</linktopdf><linktohtml>$$Uhttps://pubs.acs.org/doi/10.1021/jp103795c$$EHTML$$P50$$Gacs$$H</linktohtml><link.rule.ids>230,314,776,780,881,2752,27053,27901,27902,56713,56763</link.rule.ids><backlink>$$Uhttps://cnrs.hal.science/hal-04120027$$DView record in HAL$$Hfree_for_read</backlink></links><search><creatorcontrib>Byers, J. C</creatorcontrib><creatorcontrib>Tamiasso-Martinhon, P</creatorcontrib><creatorcontrib>Deslouis, C</creatorcontrib><creatorcontrib>Pailleret, A</creatorcontrib><creatorcontrib>Semenikhin, O. A</creatorcontrib><title>Atomic Force Microscopy Studies of Carbon Nitride (CNx) Films Deposited on a Conducting Polymer Substrate</title><title>Journal of physical chemistry. C</title><addtitle>J. Phys. Chem. C</addtitle><description>Carbon nitride films were deposited onto indium tin oxide and undoped polybithiophene substrates using direct-current reactive magnetron sputtering. The local morphology and electronic properties of the deposited films were investigated using phase-imaging (PI-AFM) and current-sensing atomic force microscopy (CS-AFM). The deposited materials were found to be generally amorphous with many individual nanostructured bonding domains. The nature of the substrate was found to have a significant effect on the microscopic distribution of carbon nitride regions with the carbon nitride films showing some long-range order when deposited onto an undoped polybithiophene substrate.</description><subject>C: Surfaces, Interfaces, Catalysis</subject><subject>Chemical Physics</subject><subject>Physics</subject><issn>1932-7447</issn><issn>1932-7455</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2010</creationdate><recordtype>article</recordtype><recordid>eNptkMFLwzAYxYMoOKcH_4NcBHeofmnaJj2OujlhTmF6LmmaaEbblCQV99-7MZkXT9_j4_cevIfQNYE7AjG53_QEKMtTeYJGJKdxxJI0PT3qhJ2jC-83ACkFQkfITINtjcRz66TCz0Y666Xtt3gdhtooj63GhXCV7fDKBGdqhW-L1fcEz03TevygeutNUDXeAQIXtqsHGUz3gV9ts22Vw-uh8sGJoC7RmRaNV1e_d4ze57O3YhEtXx6fiukyEnFOQ8R1xYUEDWnGEk5JygXRXMVVTCDjXKeq0qzmUEGVUUGkzIEkLAPIGMnyWtAxmhxyP0VT9s60wm1LK0y5mC7L_Q8SEgPE7Iv8sfva3il9NBAo93uWxz137M2BFdKXGzu4btfiH-4H3HJyxw</recordid><startdate>20101104</startdate><enddate>20101104</enddate><creator>Byers, J. C</creator><creator>Tamiasso-Martinhon, P</creator><creator>Deslouis, C</creator><creator>Pailleret, A</creator><creator>Semenikhin, O. A</creator><general>American Chemical Society</general><scope>AAYXX</scope><scope>CITATION</scope><scope>1XC</scope><orcidid>https://orcid.org/0000-0002-4296-4188</orcidid></search><sort><creationdate>20101104</creationdate><title>Atomic Force Microscopy Studies of Carbon Nitride (CNx) Films Deposited on a Conducting Polymer Substrate</title><author>Byers, J. C ; Tamiasso-Martinhon, P ; Deslouis, C ; Pailleret, A ; Semenikhin, O. A</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-a293t-8fb8ac0f0567483158a1f8e2b210688f5ebf7d80b0b63a1cc9014760067169da3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2010</creationdate><topic>C: Surfaces, Interfaces, Catalysis</topic><topic>Chemical Physics</topic><topic>Physics</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Byers, J. C</creatorcontrib><creatorcontrib>Tamiasso-Martinhon, P</creatorcontrib><creatorcontrib>Deslouis, C</creatorcontrib><creatorcontrib>Pailleret, A</creatorcontrib><creatorcontrib>Semenikhin, O. A</creatorcontrib><collection>CrossRef</collection><collection>Hyper Article en Ligne (HAL)</collection><jtitle>Journal of physical chemistry. C</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Byers, J. C</au><au>Tamiasso-Martinhon, P</au><au>Deslouis, C</au><au>Pailleret, A</au><au>Semenikhin, O. A</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Atomic Force Microscopy Studies of Carbon Nitride (CNx) Films Deposited on a Conducting Polymer Substrate</atitle><jtitle>Journal of physical chemistry. C</jtitle><addtitle>J. Phys. Chem. C</addtitle><date>2010-11-04</date><risdate>2010</risdate><volume>114</volume><issue>43</issue><spage>18474</spage><epage>18480</epage><pages>18474-18480</pages><issn>1932-7447</issn><eissn>1932-7455</eissn><abstract>Carbon nitride films were deposited onto indium tin oxide and undoped polybithiophene substrates using direct-current reactive magnetron sputtering. The local morphology and electronic properties of the deposited films were investigated using phase-imaging (PI-AFM) and current-sensing atomic force microscopy (CS-AFM). The deposited materials were found to be generally amorphous with many individual nanostructured bonding domains. The nature of the substrate was found to have a significant effect on the microscopic distribution of carbon nitride regions with the carbon nitride films showing some long-range order when deposited onto an undoped polybithiophene substrate.</abstract><pub>American Chemical Society</pub><doi>10.1021/jp103795c</doi><tpages>7</tpages><orcidid>https://orcid.org/0000-0002-4296-4188</orcidid></addata></record> |
| fulltext | fulltext |
| identifier | ISSN: 1932-7447 |
| ispartof | Journal of physical chemistry. C, 2010-11, Vol.114 (43), p.18474-18480 |
| issn | 1932-7447 1932-7455 |
| language | eng |
| recordid | cdi_hal_primary_oai_HAL_hal_04120027v1 |
| source | ACS Publications |
| subjects | C: Surfaces, Interfaces, Catalysis Chemical Physics Physics |
| title | Atomic Force Microscopy Studies of Carbon Nitride (CNx) Films Deposited on a Conducting Polymer Substrate |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-05T03%3A45%3A04IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-acs_hal_p&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Atomic%20Force%20Microscopy%20Studies%20of%20Carbon%20Nitride%20(CNx)%20Films%20Deposited%20on%20a%20Conducting%20Polymer%20Substrate&rft.jtitle=Journal%20of%20physical%20chemistry.%20C&rft.au=Byers,%20J.%20C&rft.date=2010-11-04&rft.volume=114&rft.issue=43&rft.spage=18474&rft.epage=18480&rft.pages=18474-18480&rft.issn=1932-7447&rft.eissn=1932-7455&rft_id=info:doi/10.1021/jp103795c&rft_dat=%3Cacs_hal_p%3Eb179318958%3C/acs_hal_p%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |