An Analytical Approach to Calculate Soft Error Rate Induced by Atmospheric Neutrons

In the atmosphere, it is generally understood that neutrons are the main contributor to the soft error rate (SER) in electronic devices. These particles are indeed able to trigger nuclear reactions in the sensitive regions of the devices, leading to secondary ions that may ionize the matter sufficie...

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Veröffentlicht in:Electronics (Basel) 2023-01, Vol.12 (1), p.104
Hauptverfasser: Wrobel, Frédéric, Aguiar, Ygor, Marques, Cleiton, Lerner, Giuseppe, García Alía, Rubén, Saigné, Frédéric, Boch, Jérôme
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Sprache:eng
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