An Analytical Approach to Calculate Soft Error Rate Induced by Atmospheric Neutrons
In the atmosphere, it is generally understood that neutrons are the main contributor to the soft error rate (SER) in electronic devices. These particles are indeed able to trigger nuclear reactions in the sensitive regions of the devices, leading to secondary ions that may ionize the matter sufficie...
Gespeichert in:
Veröffentlicht in: | Electronics (Basel) 2023-01, Vol.12 (1), p.104 |
---|---|
Hauptverfasser: | , , , , , , |
Format: | Artikel |
Sprache: | eng |
Schlagworte: | |
Online-Zugang: | Volltext |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
Schreiben Sie den ersten Kommentar!