Pressure-Induced Valence Anomaly in TmTe Probed by Resonant Inelastic X-Ray Scattering

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Veröffentlicht in:Physical review letters 2008-09, Vol.101 (12), Article 127401
Hauptverfasser: Jarrige, I., Rueff, J.-P., Shieh, S. R., Taguchi, M., Ohishi, Y., Matsumura, T., Wang, C.-P., Ishii, H., Hiraoka, N., Cai, Y. Q.
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container_issue 12
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container_title Physical review letters
container_volume 101
creator Jarrige, I.
Rueff, J.-P.
Shieh, S. R.
Taguchi, M.
Ohishi, Y.
Matsumura, T.
Wang, C.-P.
Ishii, H.
Hiraoka, N.
Cai, Y. Q.
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subjects Condensed Matter
Physics
Strongly Correlated Electrons
title Pressure-Induced Valence Anomaly in TmTe Probed by Resonant Inelastic X-Ray Scattering
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