Pressure-Induced Valence Anomaly in TmTe Probed by Resonant Inelastic X-Ray Scattering
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Veröffentlicht in: | Physical review letters 2008-09, Vol.101 (12), Article 127401 |
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container_title | Physical review letters |
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creator | Jarrige, I. Rueff, J.-P. Shieh, S. R. Taguchi, M. Ohishi, Y. Matsumura, T. Wang, C.-P. Ishii, H. Hiraoka, N. Cai, Y. Q. |
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doi_str_mv | 10.1103/PhysRevLett.101.127401 |
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title | Pressure-Induced Valence Anomaly in TmTe Probed by Resonant Inelastic X-Ray Scattering |
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