Machine Learning Support for Fault Diagnosis of System-On-Chip

This book provides a state-of-the-art guide to Machine Learning (ML)-based techniques that have been shown to be highly efficient for diagnosis of failures in electronic circuits and systems. The methods discussed can be used for volume diagnosis after manufacturing or for diagnosis of customer retu...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	Girard, Patrick, Blanton, Shawn, Wang, Li-C
Format:	Buch
Sprache:	eng
Schlagworte:	Circuits and Systems Electric fault location Engineering Engineering Sciences Fault location (Engineering) Machine learning Micro and nanotechnologies Microelectronics Processor Architectures Systems on a chip
Online-Zugang:	Volltext
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