Etched track profiles for relativistic 7 GeV silicon and 17.48 GeV Nickel ions in PADC detector: The case study of convex track walls

650 μm thick PADC foils are exposed to 7 GeV Silicon and 17.48 GeV Nickel accelerated ions at particle fluence of about 1000 cm−2. The relativistic ions passed through the entire thickness of the PADC foils and created latent tracks that were etched sequentially under strong etching conditions (NaOH...

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Veröffentlicht in:	Radiation physics and chemistry (Oxford, England : 1993) England : 1993), 2021-10, Vol.187, p.109566, Article 109566
Hauptverfasser:	Fromm, M., Abu-Shady, M., Groetz, J.E., Awad, E.M.
Format:	Artikel
Sprache:	eng
Schlagworte:	Case studies Chemical Sciences Concave walls Depth-dependent bulk etch rate Diameters Etching Ethanol Fluence Foils Mathematical analysis Nickel or physical chemistry Photomicrographs Relativistic effects Silicon Swift heavy ions Theoretical and Track etching Track profiles
Online-Zugang:	Volltext
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