Innovative Transient Study of Tri-Bandpass Negative Group Delay Applied to Microstrip Barcode-Circuit
A transient study of bandpass (BP) negative group delay (NGD) function is devoted in this paper. The transient analysis is applied to an original topology of NGD barcode-shape microstrip circuit. The performed investigation explains how to realize the transient analysis of tri-band NGD circuit. The...
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| Veröffentlicht in: | IEEE access 2021, Vol.9, p.115030-115041 |
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| creator | Wu, Lili Wan, Fayu Mefteh, Rym Assila Belhadj Vauche, Remy Chan, George Zhou, Xiang Haddad, Fayrouz Rahajandraibe, Wenceslas Ravelo, Blaise |
| description | A transient study of bandpass (BP) negative group delay (NGD) function is devoted in this paper. The transient analysis is applied to an original topology of NGD barcode-shape microstrip circuit. The performed investigation explains how to realize the transient analysis of tri-band NGD circuit. The time-domain (TD) parametrization of the test is established from the BP-NGD specifications of the circuit under test (CUT) based on the S-parameter model. The input signal is a Gaussian pulse characterized in function of the NGD bandwidth (BW) and center frequency. The feasibility of the BP-NGD transient study is illustrated with experimentation based on ultra-wide band (UWB) pulse generator. As proof-of-concept, barcode NGD circuit exhibiting tri-band NGD value-center frequency-bandwidth, (−5.9 ns, 2.128 GHz, 20 MHz), (−7.4 ns, 2.3 GHz, 14 MHz) and (−4.8 ns, 2.42 GHz, 14 MHz) has been fabricated and tested. The transient simulations and experiences confirm that the output signal envelopes of the barcode NGD prototype present leading and tailing edges in time-advance of input ones when the carrier frequency is set equal to the NGD center frequency. |
| doi_str_mv | 10.1109/ACCESS.2021.3105040 |
| format | Article |
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The transient analysis is applied to an original topology of NGD barcode-shape microstrip circuit. The performed investigation explains how to realize the transient analysis of tri-band NGD circuit. The time-domain (TD) parametrization of the test is established from the BP-NGD specifications of the circuit under test (CUT) based on the S-parameter model. The input signal is a Gaussian pulse characterized in function of the NGD bandwidth (BW) and center frequency. The feasibility of the BP-NGD transient study is illustrated with experimentation based on ultra-wide band (UWB) pulse generator. As proof-of-concept, barcode NGD circuit exhibiting tri-band NGD value-center frequency-bandwidth, (−5.9 ns, 2.128 GHz, 20 MHz), (−7.4 ns, 2.3 GHz, 14 MHz) and (−4.8 ns, 2.42 GHz, 14 MHz) has been fabricated and tested. The transient simulations and experiences confirm that the output signal envelopes of the barcode NGD prototype present leading and tailing edges in time-advance of input ones when the carrier frequency is set equal to the NGD center frequency.</description><identifier>ISSN: 2169-3536</identifier><identifier>EISSN: 2169-3536</identifier><identifier>DOI: 10.1109/ACCESS.2021.3105040</identifier><identifier>CODEN: IAECCG</identifier><language>eng</language><publisher>Piscataway: IEEE</publisher><subject>Bandpass ; bandpass (BP) negative group delay (NGD) ; Bandwidths ; Bar codes ; barcode topology ; Carrier frequencies ; Circuits ; Coupled lines (CLs) ; distributed circuit ; Engineering Sciences ; Experimentation ; Group delay ; microwave circuit ; Microwave circuits ; Microwave communication ; Microwave filters ; Microwave measurement ; Microwave transistors ; modelling method ; Parameterization ; Pulse generators ; time-domain experimentation ; Topology ; Transient analysis ; Ultrawideband</subject><ispartof>IEEE access, 2021, Vol.9, p.115030-115041</ispartof><rights>Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2021</rights><rights>Distributed under a Creative Commons Attribution 4.0 International License</rights><lds50>peer_reviewed</lds50><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed><cites>FETCH-LOGICAL-c392t-857f5ace5c5c38f4872a79283da09e90e4356f4d176d20dac0f6aee018bf3ebb3</cites><orcidid>0000-0002-5626-6065 ; 0000-0002-0082-6916 ; 0000-0003-2821-7212 ; 0000-0003-3413-8369 ; 0000-0002-0870-9204 ; 0000-0003-1508-5927 ; 0000-0001-7334-5016</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/9514541$$EHTML$$P50$$Gieee$$Hfree_for_read</linktohtml><link.rule.ids>230,314,776,780,860,881,2096,4010,27610,27900,27901,27902,54908</link.rule.ids><backlink>$$Uhttps://hal.science/hal-03494715$$DView record in HAL$$Hfree_for_read</backlink></links><search><creatorcontrib>Wu, Lili</creatorcontrib><creatorcontrib>Wan, Fayu</creatorcontrib><creatorcontrib>Mefteh, Rym Assila Belhadj</creatorcontrib><creatorcontrib>Vauche, Remy</creatorcontrib><creatorcontrib>Chan, George</creatorcontrib><creatorcontrib>Zhou, Xiang</creatorcontrib><creatorcontrib>Haddad, Fayrouz</creatorcontrib><creatorcontrib>Rahajandraibe, Wenceslas</creatorcontrib><creatorcontrib>Ravelo, Blaise</creatorcontrib><title>Innovative Transient Study of Tri-Bandpass Negative Group Delay Applied to Microstrip Barcode-Circuit</title><title>IEEE access</title><addtitle>Access</addtitle><description>A transient study of bandpass (BP) negative group delay (NGD) function is devoted in this paper. The transient analysis is applied to an original topology of NGD barcode-shape microstrip circuit. The performed investigation explains how to realize the transient analysis of tri-band NGD circuit. The time-domain (TD) parametrization of the test is established from the BP-NGD specifications of the circuit under test (CUT) based on the S-parameter model. The input signal is a Gaussian pulse characterized in function of the NGD bandwidth (BW) and center frequency. The feasibility of the BP-NGD transient study is illustrated with experimentation based on ultra-wide band (UWB) pulse generator. As proof-of-concept, barcode NGD circuit exhibiting tri-band NGD value-center frequency-bandwidth, (−5.9 ns, 2.128 GHz, 20 MHz), (−7.4 ns, 2.3 GHz, 14 MHz) and (−4.8 ns, 2.42 GHz, 14 MHz) has been fabricated and tested. The transient simulations and experiences confirm that the output signal envelopes of the barcode NGD prototype present leading and tailing edges in time-advance of input ones when the carrier frequency is set equal to the NGD center frequency.</description><subject>Bandpass</subject><subject>bandpass (BP) negative group delay (NGD)</subject><subject>Bandwidths</subject><subject>Bar codes</subject><subject>barcode topology</subject><subject>Carrier frequencies</subject><subject>Circuits</subject><subject>Coupled lines (CLs)</subject><subject>distributed circuit</subject><subject>Engineering Sciences</subject><subject>Experimentation</subject><subject>Group delay</subject><subject>microwave circuit</subject><subject>Microwave circuits</subject><subject>Microwave communication</subject><subject>Microwave filters</subject><subject>Microwave measurement</subject><subject>Microwave transistors</subject><subject>modelling method</subject><subject>Parameterization</subject><subject>Pulse generators</subject><subject>time-domain experimentation</subject><subject>Topology</subject><subject>Transient analysis</subject><subject>Ultrawideband</subject><issn>2169-3536</issn><issn>2169-3536</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2021</creationdate><recordtype>article</recordtype><sourceid>ESBDL</sourceid><sourceid>RIE</sourceid><sourceid>DOA</sourceid><recordid>eNpVkUtr3DAUhU1poSHNL8hG0FUXnuppycuJm8fAtF1MuhYa6SrV4FquZA_Mv6-mDiG5G10O53yge6rqmuAVIbj9uu66291uRTElK0awwBy_qy4oadqaCda8f7V_rK5yPuAyqkhCXlSwGYZ4NFM4AnpMZsgBhgntptmdUPRFCvWNGdxockY_4Gkx3qc4j-gb9OaE1uPYB3Boiuh7sCnmKYUR3Zhko4O6C8nOYfpUffCmz3D1_F5Wv-5uH7uHevvzftOtt7VlLZ1qJaQXxoKwwjLluZLUyJYq5gxuocXAmWg8d0Q2jmJnLPaNAcBE7T2D_Z5dVpuF66I56DGFPyaddDRB_xdietImTcH2oCmnHGg5gnOcAwfjQSnaCOVloxiThfVlYf02_RvUw3qrzxpmvOWSiCMp3s-Ld0zx7wx50oc4p6F8VVPRcEqlILy42OI6nykn8C9YgvW5Sr1Uqc9V6ucqS-p6SQUAeEm0BSg4Yf8AwQOZBQ</recordid><startdate>2021</startdate><enddate>2021</enddate><creator>Wu, Lili</creator><creator>Wan, Fayu</creator><creator>Mefteh, Rym Assila Belhadj</creator><creator>Vauche, Remy</creator><creator>Chan, George</creator><creator>Zhou, Xiang</creator><creator>Haddad, Fayrouz</creator><creator>Rahajandraibe, Wenceslas</creator><creator>Ravelo, Blaise</creator><general>IEEE</general><general>The Institute of Electrical and Electronics Engineers, Inc. (IEEE)</general><scope>97E</scope><scope>ESBDL</scope><scope>RIA</scope><scope>RIE</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SC</scope><scope>7SP</scope><scope>7SR</scope><scope>8BQ</scope><scope>8FD</scope><scope>JG9</scope><scope>JQ2</scope><scope>L7M</scope><scope>L~C</scope><scope>L~D</scope><scope>1XC</scope><scope>DOA</scope><orcidid>https://orcid.org/0000-0002-5626-6065</orcidid><orcidid>https://orcid.org/0000-0002-0082-6916</orcidid><orcidid>https://orcid.org/0000-0003-2821-7212</orcidid><orcidid>https://orcid.org/0000-0003-3413-8369</orcidid><orcidid>https://orcid.org/0000-0002-0870-9204</orcidid><orcidid>https://orcid.org/0000-0003-1508-5927</orcidid><orcidid>https://orcid.org/0000-0001-7334-5016</orcidid></search><sort><creationdate>2021</creationdate><title>Innovative Transient Study of Tri-Bandpass Negative Group Delay Applied to Microstrip Barcode-Circuit</title><author>Wu, Lili ; Wan, Fayu ; Mefteh, Rym Assila Belhadj ; Vauche, Remy ; Chan, George ; Zhou, Xiang ; Haddad, Fayrouz ; Rahajandraibe, Wenceslas ; Ravelo, Blaise</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c392t-857f5ace5c5c38f4872a79283da09e90e4356f4d176d20dac0f6aee018bf3ebb3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2021</creationdate><topic>Bandpass</topic><topic>bandpass (BP) negative group delay (NGD)</topic><topic>Bandwidths</topic><topic>Bar codes</topic><topic>barcode topology</topic><topic>Carrier frequencies</topic><topic>Circuits</topic><topic>Coupled lines (CLs)</topic><topic>distributed circuit</topic><topic>Engineering Sciences</topic><topic>Experimentation</topic><topic>Group delay</topic><topic>microwave circuit</topic><topic>Microwave circuits</topic><topic>Microwave communication</topic><topic>Microwave filters</topic><topic>Microwave measurement</topic><topic>Microwave transistors</topic><topic>modelling method</topic><topic>Parameterization</topic><topic>Pulse generators</topic><topic>time-domain experimentation</topic><topic>Topology</topic><topic>Transient analysis</topic><topic>Ultrawideband</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Wu, Lili</creatorcontrib><creatorcontrib>Wan, Fayu</creatorcontrib><creatorcontrib>Mefteh, Rym Assila Belhadj</creatorcontrib><creatorcontrib>Vauche, Remy</creatorcontrib><creatorcontrib>Chan, George</creatorcontrib><creatorcontrib>Zhou, Xiang</creatorcontrib><creatorcontrib>Haddad, Fayrouz</creatorcontrib><creatorcontrib>Rahajandraibe, Wenceslas</creatorcontrib><creatorcontrib>Ravelo, Blaise</creatorcontrib><collection>IEEE All-Society Periodicals Package (ASPP) 2005-present</collection><collection>IEEE Open Access Journals</collection><collection>IEEE All-Society Periodicals Package (ASPP) 1998-Present</collection><collection>IEEE Electronic Library (IEL)</collection><collection>CrossRef</collection><collection>Computer and Information Systems Abstracts</collection><collection>Electronics & Communications Abstracts</collection><collection>Engineered Materials Abstracts</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>Materials Research Database</collection><collection>ProQuest Computer Science Collection</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>Computer and Information Systems Abstracts Academic</collection><collection>Computer and Information Systems Abstracts Professional</collection><collection>Hyper Article en Ligne (HAL)</collection><collection>DOAJ Directory of Open Access Journals</collection><jtitle>IEEE access</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Wu, Lili</au><au>Wan, Fayu</au><au>Mefteh, Rym Assila Belhadj</au><au>Vauche, Remy</au><au>Chan, George</au><au>Zhou, Xiang</au><au>Haddad, Fayrouz</au><au>Rahajandraibe, Wenceslas</au><au>Ravelo, Blaise</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Innovative Transient Study of Tri-Bandpass Negative Group Delay Applied to Microstrip Barcode-Circuit</atitle><jtitle>IEEE access</jtitle><stitle>Access</stitle><date>2021</date><risdate>2021</risdate><volume>9</volume><spage>115030</spage><epage>115041</epage><pages>115030-115041</pages><issn>2169-3536</issn><eissn>2169-3536</eissn><coden>IAECCG</coden><abstract>A transient study of bandpass (BP) negative group delay (NGD) function is devoted in this paper. The transient analysis is applied to an original topology of NGD barcode-shape microstrip circuit. The performed investigation explains how to realize the transient analysis of tri-band NGD circuit. The time-domain (TD) parametrization of the test is established from the BP-NGD specifications of the circuit under test (CUT) based on the S-parameter model. The input signal is a Gaussian pulse characterized in function of the NGD bandwidth (BW) and center frequency. The feasibility of the BP-NGD transient study is illustrated with experimentation based on ultra-wide band (UWB) pulse generator. As proof-of-concept, barcode NGD circuit exhibiting tri-band NGD value-center frequency-bandwidth, (−5.9 ns, 2.128 GHz, 20 MHz), (−7.4 ns, 2.3 GHz, 14 MHz) and (−4.8 ns, 2.42 GHz, 14 MHz) has been fabricated and tested. The transient simulations and experiences confirm that the output signal envelopes of the barcode NGD prototype present leading and tailing edges in time-advance of input ones when the carrier frequency is set equal to the NGD center frequency.</abstract><cop>Piscataway</cop><pub>IEEE</pub><doi>10.1109/ACCESS.2021.3105040</doi><tpages>12</tpages><orcidid>https://orcid.org/0000-0002-5626-6065</orcidid><orcidid>https://orcid.org/0000-0002-0082-6916</orcidid><orcidid>https://orcid.org/0000-0003-2821-7212</orcidid><orcidid>https://orcid.org/0000-0003-3413-8369</orcidid><orcidid>https://orcid.org/0000-0002-0870-9204</orcidid><orcidid>https://orcid.org/0000-0003-1508-5927</orcidid><orcidid>https://orcid.org/0000-0001-7334-5016</orcidid><oa>free_for_read</oa></addata></record> |
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| subjects | Bandpass bandpass (BP) negative group delay (NGD) Bandwidths Bar codes barcode topology Carrier frequencies Circuits Coupled lines (CLs) distributed circuit Engineering Sciences Experimentation Group delay microwave circuit Microwave circuits Microwave communication Microwave filters Microwave measurement Microwave transistors modelling method Parameterization Pulse generators time-domain experimentation Topology Transient analysis Ultrawideband |
| title | Innovative Transient Study of Tri-Bandpass Negative Group Delay Applied to Microstrip Barcode-Circuit |
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