Experimental analysis of the electromagnetic instruction skip fault model and consequences for software countermeasures
Microcontrollers storing valuable data or using security functions are vulnerable to fault injection attacks. Among the various types of faults, instruction skips induced at runtime proved to be effective against identification routines or encryption algorithms. Until recently, most research works a...
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Veröffentlicht in: | Microelectronics and reliability 2021-06, Vol.121, p.114133, Article 114133 |
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container_title | Microelectronics and reliability |
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creator | Dutertre, Jean-Max Menu, Alexandre Potin, Olivier Rigaud, Jean-Baptiste Danger, Jean-Luc |
description | Microcontrollers storing valuable data or using security functions are vulnerable to fault injection attacks. Among the various types of faults, instruction skips induced at runtime proved to be effective against identification routines or encryption algorithms. Until recently, most research works assessed a fault model that consists in a single instruction skip, i.e. the ability to prevent one chosen instruction in a program from being executed. We question this fault model for EM fault injection on experimental basis and report the possibility to induce several consecutive instructions skips. Such an extended fault model proved to be effective against a duplication-based software countermeasure as our experiments revealed. |
doi_str_mv | 10.1016/j.microrel.2021.114133 |
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subjects | EM fault injection Engineering Sciences Fault model Hardware attacks Micro and nanotechnologies Microelectronics |
title | Experimental analysis of the electromagnetic instruction skip fault model and consequences for software countermeasures |
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