Design for a high resolution electron energy loss microscope
•Design of a high resolution electron energy loss microscope.•Intense cold electron source.•Sub-micron spatial resolution and meV energy resolution.•Real space mapping of vibrational levels.•Reciprocal space mapping of phonon dispersion. An electron optical column has been designed for High Resoluti...
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| Veröffentlicht in: | Ultramicroscopy 2019-12, Vol.207, p.112848-112848, Article 112848 |
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| container_title | Ultramicroscopy |
| container_volume | 207 |
| creator | Mankos, Marian Shadman, Khashayar Hahn, Raphaël Picard, Yan J. Comparat, Daniel Fedchenko, Olena Schönhense, Gerd Amiaud, Lionel Lafosse, Anne Barrett, Nick |
| description | •Design of a high resolution electron energy loss microscope.•Intense cold electron source.•Sub-micron spatial resolution and meV energy resolution.•Real space mapping of vibrational levels.•Reciprocal space mapping of phonon dispersion.
An electron optical column has been designed for High Resolution Electron Energy Loss Microscopy (HREELM). The column is composed of electron lenses and a beam separator that are placed between an electron source based on a laser excited cesium atom beam and a time-of-flight (ToF) spectrometer or a hemispherical analyzer (HSA). The instrument will be able to perform full field low energy electron imaging of surfaces with sub-micron spatial resolution and meV energy resolution necessary for the analysis of local vibrational spectra. Thus, non-contact, real space mapping of microscopic variations in vibrational levels will be made possible. A second imaging mode will allow for the mapping of the phonon dispersion relations from microscopic regions defined by an appropriate field aperture. |
| doi_str_mv | 10.1016/j.ultramic.2019.112848 |
| format | Article |
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An electron optical column has been designed for High Resolution Electron Energy Loss Microscopy (HREELM). The column is composed of electron lenses and a beam separator that are placed between an electron source based on a laser excited cesium atom beam and a time-of-flight (ToF) spectrometer or a hemispherical analyzer (HSA). The instrument will be able to perform full field low energy electron imaging of surfaces with sub-micron spatial resolution and meV energy resolution necessary for the analysis of local vibrational spectra. Thus, non-contact, real space mapping of microscopic variations in vibrational levels will be made possible. A second imaging mode will allow for the mapping of the phonon dispersion relations from microscopic regions defined by an appropriate field aperture.</description><identifier>ISSN: 0304-3991</identifier><identifier>EISSN: 1879-2723</identifier><identifier>DOI: 10.1016/j.ultramic.2019.112848</identifier><identifier>PMID: 31606484</identifier><language>eng</language><publisher>Netherlands: Elsevier B.V</publisher><subject>Atomic Physics ; EELS ; imaging ; Instrumentation and Detectors ; LEEM ; Physics ; surface</subject><ispartof>Ultramicroscopy, 2019-12, Vol.207, p.112848-112848, Article 112848</ispartof><rights>2019 Elsevier B.V.</rights><rights>Copyright © 2019 Elsevier B.V. All rights reserved.</rights><rights>Distributed under a Creative Commons Attribution 4.0 International License</rights><lds50>peer_reviewed</lds50><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c450t-2105503b311a13657340ec26c023ed773e778c350867ee6d8a647d03cb6afb133</citedby><cites>FETCH-LOGICAL-c450t-2105503b311a13657340ec26c023ed773e778c350867ee6d8a647d03cb6afb133</cites><orcidid>0000-0002-8921-2901 ; 0000-0002-8228-0805 ; 0000-0002-3579-3675 ; 0000-0002-2842-488X</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://www.sciencedirect.com/science/article/pii/S0304399119300907$$EHTML$$P50$$Gelsevier$$H</linktohtml><link.rule.ids>230,314,776,780,881,3537,27901,27902,65534</link.rule.ids><backlink>$$Uhttps://www.ncbi.nlm.nih.gov/pubmed/31606484$$D View this record in MEDLINE/PubMed$$Hfree_for_read</backlink><backlink>$$Uhttps://hal.science/hal-03021258$$DView record in HAL$$Hfree_for_read</backlink></links><search><creatorcontrib>Mankos, Marian</creatorcontrib><creatorcontrib>Shadman, Khashayar</creatorcontrib><creatorcontrib>Hahn, Raphaël</creatorcontrib><creatorcontrib>Picard, Yan J.</creatorcontrib><creatorcontrib>Comparat, Daniel</creatorcontrib><creatorcontrib>Fedchenko, Olena</creatorcontrib><creatorcontrib>Schönhense, Gerd</creatorcontrib><creatorcontrib>Amiaud, Lionel</creatorcontrib><creatorcontrib>Lafosse, Anne</creatorcontrib><creatorcontrib>Barrett, Nick</creatorcontrib><title>Design for a high resolution electron energy loss microscope</title><title>Ultramicroscopy</title><addtitle>Ultramicroscopy</addtitle><description>•Design of a high resolution electron energy loss microscope.•Intense cold electron source.•Sub-micron spatial resolution and meV energy resolution.•Real space mapping of vibrational levels.•Reciprocal space mapping of phonon dispersion.
An electron optical column has been designed for High Resolution Electron Energy Loss Microscopy (HREELM). The column is composed of electron lenses and a beam separator that are placed between an electron source based on a laser excited cesium atom beam and a time-of-flight (ToF) spectrometer or a hemispherical analyzer (HSA). The instrument will be able to perform full field low energy electron imaging of surfaces with sub-micron spatial resolution and meV energy resolution necessary for the analysis of local vibrational spectra. Thus, non-contact, real space mapping of microscopic variations in vibrational levels will be made possible. A second imaging mode will allow for the mapping of the phonon dispersion relations from microscopic regions defined by an appropriate field aperture.</description><subject>Atomic Physics</subject><subject>EELS</subject><subject>imaging</subject><subject>Instrumentation and Detectors</subject><subject>LEEM</subject><subject>Physics</subject><subject>surface</subject><issn>0304-3991</issn><issn>1879-2723</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2019</creationdate><recordtype>article</recordtype><recordid>eNqFkMFO4zAQhq0VK-iyvALKEQ4pM7ZjuxIHELCwUiUu7NlynWnrKo27doLE25MowJXTjEbfzK_5GDtHmCOgutrN-6ZLbh_8nAMu5ojcSPODzdDoRck1F0dsBgJkKRYLPGG_ct4BAII0x-xEoAIljZyx63vKYdMW65gKV2zDZlskyrHpuxDbghryXRqbltLmrWhizsWQmWL28UC_2c-1azKdfdRT9u_Pw8vdU7l8fvx7d7ssvaygKzlCVYFYCUSHQlVaSCDPlQcuqNZakNbGiwqM0kSqNk5JXYPwK-XWKxTilF1Od7eusYcU9i692eiCfbpd2nE2PMqRV-YVB_ZiYg8p_u8pd3YfsqemcS3FPlsuoJKaazmiakLHf3Ki9ddtBDtatjv7admOlu1keVg8_8joV3uqv9Y-tQ7AzQTQYOU1ULLZB2o91SENRm0dw3cZ7zbAjvM</recordid><startdate>20191201</startdate><enddate>20191201</enddate><creator>Mankos, Marian</creator><creator>Shadman, Khashayar</creator><creator>Hahn, Raphaël</creator><creator>Picard, Yan J.</creator><creator>Comparat, Daniel</creator><creator>Fedchenko, Olena</creator><creator>Schönhense, Gerd</creator><creator>Amiaud, Lionel</creator><creator>Lafosse, Anne</creator><creator>Barrett, Nick</creator><general>Elsevier B.V</general><general>Elsevier</general><scope>NPM</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7X8</scope><scope>1XC</scope><scope>VOOES</scope><orcidid>https://orcid.org/0000-0002-8921-2901</orcidid><orcidid>https://orcid.org/0000-0002-8228-0805</orcidid><orcidid>https://orcid.org/0000-0002-3579-3675</orcidid><orcidid>https://orcid.org/0000-0002-2842-488X</orcidid></search><sort><creationdate>20191201</creationdate><title>Design for a high resolution electron energy loss microscope</title><author>Mankos, Marian ; Shadman, Khashayar ; Hahn, Raphaël ; Picard, Yan J. ; Comparat, Daniel ; Fedchenko, Olena ; Schönhense, Gerd ; Amiaud, Lionel ; Lafosse, Anne ; Barrett, Nick</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c450t-2105503b311a13657340ec26c023ed773e778c350867ee6d8a647d03cb6afb133</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2019</creationdate><topic>Atomic Physics</topic><topic>EELS</topic><topic>imaging</topic><topic>Instrumentation and Detectors</topic><topic>LEEM</topic><topic>Physics</topic><topic>surface</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Mankos, Marian</creatorcontrib><creatorcontrib>Shadman, Khashayar</creatorcontrib><creatorcontrib>Hahn, Raphaël</creatorcontrib><creatorcontrib>Picard, Yan J.</creatorcontrib><creatorcontrib>Comparat, Daniel</creatorcontrib><creatorcontrib>Fedchenko, Olena</creatorcontrib><creatorcontrib>Schönhense, Gerd</creatorcontrib><creatorcontrib>Amiaud, Lionel</creatorcontrib><creatorcontrib>Lafosse, Anne</creatorcontrib><creatorcontrib>Barrett, Nick</creatorcontrib><collection>PubMed</collection><collection>CrossRef</collection><collection>MEDLINE - Academic</collection><collection>Hyper Article en Ligne (HAL)</collection><collection>Hyper Article en Ligne (HAL) (Open Access)</collection><jtitle>Ultramicroscopy</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Mankos, Marian</au><au>Shadman, Khashayar</au><au>Hahn, Raphaël</au><au>Picard, Yan J.</au><au>Comparat, Daniel</au><au>Fedchenko, Olena</au><au>Schönhense, Gerd</au><au>Amiaud, Lionel</au><au>Lafosse, Anne</au><au>Barrett, Nick</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Design for a high resolution electron energy loss microscope</atitle><jtitle>Ultramicroscopy</jtitle><addtitle>Ultramicroscopy</addtitle><date>2019-12-01</date><risdate>2019</risdate><volume>207</volume><spage>112848</spage><epage>112848</epage><pages>112848-112848</pages><artnum>112848</artnum><issn>0304-3991</issn><eissn>1879-2723</eissn><abstract>•Design of a high resolution electron energy loss microscope.•Intense cold electron source.•Sub-micron spatial resolution and meV energy resolution.•Real space mapping of vibrational levels.•Reciprocal space mapping of phonon dispersion.
An electron optical column has been designed for High Resolution Electron Energy Loss Microscopy (HREELM). The column is composed of electron lenses and a beam separator that are placed between an electron source based on a laser excited cesium atom beam and a time-of-flight (ToF) spectrometer or a hemispherical analyzer (HSA). The instrument will be able to perform full field low energy electron imaging of surfaces with sub-micron spatial resolution and meV energy resolution necessary for the analysis of local vibrational spectra. Thus, non-contact, real space mapping of microscopic variations in vibrational levels will be made possible. A second imaging mode will allow for the mapping of the phonon dispersion relations from microscopic regions defined by an appropriate field aperture.</abstract><cop>Netherlands</cop><pub>Elsevier B.V</pub><pmid>31606484</pmid><doi>10.1016/j.ultramic.2019.112848</doi><tpages>1</tpages><orcidid>https://orcid.org/0000-0002-8921-2901</orcidid><orcidid>https://orcid.org/0000-0002-8228-0805</orcidid><orcidid>https://orcid.org/0000-0002-3579-3675</orcidid><orcidid>https://orcid.org/0000-0002-2842-488X</orcidid><oa>free_for_read</oa></addata></record> |
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| language | eng |
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| source | Elsevier ScienceDirect Journals |
| subjects | Atomic Physics EELS imaging Instrumentation and Detectors LEEM Physics surface |
| title | Design for a high resolution electron energy loss microscope |
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