Influence of glass composition on secondary ion mass spectrometry instrumental mass fractionation for Si and Ca isotopic analyses
Rationale In situ secondary ion mass spectrometry (SIMS) analysis requires the use of standards to unravel the instrumental mass fractionation (IMF) induced by the analytical procedures. Part of this IMF might be caused by the nature of the sample and the differences in composition and structure bet...
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creator | Tissandier, Laurent Rollion‐Bard, Claire |
description | Rationale
In situ secondary ion mass spectrometry (SIMS) analysis requires the use of standards to unravel the instrumental mass fractionation (IMF) induced by the analytical procedures. Part of this IMF might be caused by the nature of the sample and the differences in composition and structure between the sample and the standards. This “matrix effect” has been tentatively corrected for by using standards with chemical compositions equivalent to the samples, or by the empirical use of chemical parameters. However, these corrections can only be applied to a narrow compositional range and fail to take proper account of the matrix effect when a wider chemical field is tested.
Methods
We synthesized a series of glasses whose compositions span a very large part of the NCMAS (Na2O‐CaO‐MgO‐Al2O3‐SiO2) system. Si and Ca isotopic analyses were performed on two ion microprobes (Cameca IMS‐1270 and IMS‐1280).
Results
The matrix effect observed may reach 20‰ between extreme compositions and cannot be accounted for by the previously used “chemical” parameters (e.g. SiO2, SiO2/(SiO2 + Al2O3)) nor by the NBO/T parameter. It therefore appears necessary to consider not only the structure of the glasses, but also the nature of the different atoms. Consequently, we assessed the use of another concept, the optical basicity, based on the electronegativities of the constitutive elements of glass.
Conclusions
We show that this parameter significantly improves the efficiency of the matrix‐effect correction and that it can be applied across the entire NCMAS compositional range studied here. Furthermore, the use of optical basicity reduces the number of glass standards required for a reliable isotopic study, and it can also be used to probe the structure of the glass. Copyright © 2016 John Wiley & Sons, Ltd. |
doi_str_mv | 10.1002/rcm.7799 |
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In situ secondary ion mass spectrometry (SIMS) analysis requires the use of standards to unravel the instrumental mass fractionation (IMF) induced by the analytical procedures. Part of this IMF might be caused by the nature of the sample and the differences in composition and structure between the sample and the standards. This “matrix effect” has been tentatively corrected for by using standards with chemical compositions equivalent to the samples, or by the empirical use of chemical parameters. However, these corrections can only be applied to a narrow compositional range and fail to take proper account of the matrix effect when a wider chemical field is tested.
Methods
We synthesized a series of glasses whose compositions span a very large part of the NCMAS (Na2O‐CaO‐MgO‐Al2O3‐SiO2) system. Si and Ca isotopic analyses were performed on two ion microprobes (Cameca IMS‐1270 and IMS‐1280).
Results
The matrix effect observed may reach 20‰ between extreme compositions and cannot be accounted for by the previously used “chemical” parameters (e.g. SiO2, SiO2/(SiO2 + Al2O3)) nor by the NBO/T parameter. It therefore appears necessary to consider not only the structure of the glasses, but also the nature of the different atoms. Consequently, we assessed the use of another concept, the optical basicity, based on the electronegativities of the constitutive elements of glass.
Conclusions
We show that this parameter significantly improves the efficiency of the matrix‐effect correction and that it can be applied across the entire NCMAS compositional range studied here. Furthermore, the use of optical basicity reduces the number of glass standards required for a reliable isotopic study, and it can also be used to probe the structure of the glass. Copyright © 2016 John Wiley & Sons, Ltd.</description><identifier>ISSN: 0951-4198</identifier><identifier>EISSN: 1097-0231</identifier><identifier>DOI: 10.1002/rcm.7799</identifier><identifier>PMID: 27891713</identifier><language>eng</language><publisher>England: Wiley Subscription Services, Inc</publisher><subject>Composition effects ; Fractionation ; Glass ; Optical basicity ; Parameters ; Sciences of the Universe ; Secondary ion mass spectrometry ; Silicon dioxide</subject><ispartof>Rapid communications in mass spectrometry, 2017-02, Vol.31 (4), p.351-361</ispartof><rights>Copyright © 2016 John Wiley & Sons, Ltd.</rights><rights>Copyright © 2017 John Wiley & Sons, Ltd.</rights><rights>Distributed under a Creative Commons Attribution 4.0 International License</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c4169-fa9df0d16234f88c519325588aef55e3dd1645ea5a0cab02e31ffff63b05cec83</citedby><cites>FETCH-LOGICAL-c4169-fa9df0d16234f88c519325588aef55e3dd1645ea5a0cab02e31ffff63b05cec83</cites><orcidid>0000-0001-7503-8116 ; 0000-0002-9115-0367</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://onlinelibrary.wiley.com/doi/pdf/10.1002%2Frcm.7799$$EPDF$$P50$$Gwiley$$H</linktopdf><linktohtml>$$Uhttps://onlinelibrary.wiley.com/doi/full/10.1002%2Frcm.7799$$EHTML$$P50$$Gwiley$$H</linktohtml><link.rule.ids>230,314,780,784,885,1417,27924,27925,45574,45575</link.rule.ids><backlink>$$Uhttps://www.ncbi.nlm.nih.gov/pubmed/27891713$$D View this record in MEDLINE/PubMed$$Hfree_for_read</backlink><backlink>$$Uhttps://hal.univ-lorraine.fr/hal-02975245$$DView record in HAL$$Hfree_for_read</backlink></links><search><creatorcontrib>Tissandier, Laurent</creatorcontrib><creatorcontrib>Rollion‐Bard, Claire</creatorcontrib><title>Influence of glass composition on secondary ion mass spectrometry instrumental mass fractionation for Si and Ca isotopic analyses</title><title>Rapid communications in mass spectrometry</title><addtitle>Rapid Commun Mass Spectrom</addtitle><description>Rationale
In situ secondary ion mass spectrometry (SIMS) analysis requires the use of standards to unravel the instrumental mass fractionation (IMF) induced by the analytical procedures. Part of this IMF might be caused by the nature of the sample and the differences in composition and structure between the sample and the standards. This “matrix effect” has been tentatively corrected for by using standards with chemical compositions equivalent to the samples, or by the empirical use of chemical parameters. However, these corrections can only be applied to a narrow compositional range and fail to take proper account of the matrix effect when a wider chemical field is tested.
Methods
We synthesized a series of glasses whose compositions span a very large part of the NCMAS (Na2O‐CaO‐MgO‐Al2O3‐SiO2) system. Si and Ca isotopic analyses were performed on two ion microprobes (Cameca IMS‐1270 and IMS‐1280).
Results
The matrix effect observed may reach 20‰ between extreme compositions and cannot be accounted for by the previously used “chemical” parameters (e.g. SiO2, SiO2/(SiO2 + Al2O3)) nor by the NBO/T parameter. It therefore appears necessary to consider not only the structure of the glasses, but also the nature of the different atoms. Consequently, we assessed the use of another concept, the optical basicity, based on the electronegativities of the constitutive elements of glass.
Conclusions
We show that this parameter significantly improves the efficiency of the matrix‐effect correction and that it can be applied across the entire NCMAS compositional range studied here. Furthermore, the use of optical basicity reduces the number of glass standards required for a reliable isotopic study, and it can also be used to probe the structure of the glass. Copyright © 2016 John Wiley & Sons, Ltd.</description><subject>Composition effects</subject><subject>Fractionation</subject><subject>Glass</subject><subject>Optical basicity</subject><subject>Parameters</subject><subject>Sciences of the Universe</subject><subject>Secondary ion mass spectrometry</subject><subject>Silicon dioxide</subject><issn>0951-4198</issn><issn>1097-0231</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2017</creationdate><recordtype>article</recordtype><recordid>eNqNkV9rFDEUxYModq2Cn0AGfNGHqTfJZCZ5LIu2hRXBP88hm7nRlMxkTGaUffSbN9OtFQTBEAg593cPyT2EPKdwRgHYm2SHs65T6gHZUFBdDYzTh2QDStC6oUqekCc5XwNQKhg8Jiesk4p2lG_Ir6vRhQVHi1V01ddgcq5sHKaY_ezjWJWd0caxN-lQrcKwEnlCO6c44LyqY57TMuA4m3Asu2Ts2m1uLVxM1SdfmbGvtqbyOc5x8rbcTThkzE_JI2dCxmd35yn58u7t5-1lvftwcbU939W2oa2qnVG9g562jDdOSiuo4kwIKQ06IZD3pdQINMKANXtgyKkrq-V7EBat5Kfk9dH3mwl6Sn4oP9LReH15vtOrBkx1gjXiBy3sqyM7pfh9wTzrwWeLIZgR45I1lWXYsqVd-x9o03DRSg4FffkXeh2XVMawUi0oYADdH0ObYs4J3f1jKeg1bV3S1mvaBX1xZ7jsB-zvwd_xFqA-Aj99wMM_jfTH7ftbwxsS1rR8</recordid><startdate>20170228</startdate><enddate>20170228</enddate><creator>Tissandier, Laurent</creator><creator>Rollion‐Bard, Claire</creator><general>Wiley Subscription Services, Inc</general><general>Wiley</general><scope>NPM</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SR</scope><scope>7U5</scope><scope>8BQ</scope><scope>8FD</scope><scope>JG9</scope><scope>JQ2</scope><scope>L7M</scope><scope>7X8</scope><scope>1XC</scope><orcidid>https://orcid.org/0000-0001-7503-8116</orcidid><orcidid>https://orcid.org/0000-0002-9115-0367</orcidid></search><sort><creationdate>20170228</creationdate><title>Influence of glass composition on secondary ion mass spectrometry instrumental mass fractionation for Si and Ca isotopic analyses</title><author>Tissandier, Laurent ; Rollion‐Bard, Claire</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c4169-fa9df0d16234f88c519325588aef55e3dd1645ea5a0cab02e31ffff63b05cec83</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2017</creationdate><topic>Composition effects</topic><topic>Fractionation</topic><topic>Glass</topic><topic>Optical basicity</topic><topic>Parameters</topic><topic>Sciences of the Universe</topic><topic>Secondary ion mass spectrometry</topic><topic>Silicon dioxide</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Tissandier, Laurent</creatorcontrib><creatorcontrib>Rollion‐Bard, Claire</creatorcontrib><collection>PubMed</collection><collection>CrossRef</collection><collection>Engineered Materials Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>Materials Research Database</collection><collection>ProQuest Computer Science Collection</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>MEDLINE - Academic</collection><collection>Hyper Article en Ligne (HAL)</collection><jtitle>Rapid communications in mass spectrometry</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Tissandier, Laurent</au><au>Rollion‐Bard, Claire</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Influence of glass composition on secondary ion mass spectrometry instrumental mass fractionation for Si and Ca isotopic analyses</atitle><jtitle>Rapid communications in mass spectrometry</jtitle><addtitle>Rapid Commun Mass Spectrom</addtitle><date>2017-02-28</date><risdate>2017</risdate><volume>31</volume><issue>4</issue><spage>351</spage><epage>361</epage><pages>351-361</pages><issn>0951-4198</issn><eissn>1097-0231</eissn><abstract>Rationale
In situ secondary ion mass spectrometry (SIMS) analysis requires the use of standards to unravel the instrumental mass fractionation (IMF) induced by the analytical procedures. Part of this IMF might be caused by the nature of the sample and the differences in composition and structure between the sample and the standards. This “matrix effect” has been tentatively corrected for by using standards with chemical compositions equivalent to the samples, or by the empirical use of chemical parameters. However, these corrections can only be applied to a narrow compositional range and fail to take proper account of the matrix effect when a wider chemical field is tested.
Methods
We synthesized a series of glasses whose compositions span a very large part of the NCMAS (Na2O‐CaO‐MgO‐Al2O3‐SiO2) system. Si and Ca isotopic analyses were performed on two ion microprobes (Cameca IMS‐1270 and IMS‐1280).
Results
The matrix effect observed may reach 20‰ between extreme compositions and cannot be accounted for by the previously used “chemical” parameters (e.g. SiO2, SiO2/(SiO2 + Al2O3)) nor by the NBO/T parameter. It therefore appears necessary to consider not only the structure of the glasses, but also the nature of the different atoms. Consequently, we assessed the use of another concept, the optical basicity, based on the electronegativities of the constitutive elements of glass.
Conclusions
We show that this parameter significantly improves the efficiency of the matrix‐effect correction and that it can be applied across the entire NCMAS compositional range studied here. Furthermore, the use of optical basicity reduces the number of glass standards required for a reliable isotopic study, and it can also be used to probe the structure of the glass. Copyright © 2016 John Wiley & Sons, Ltd.</abstract><cop>England</cop><pub>Wiley Subscription Services, Inc</pub><pmid>27891713</pmid><doi>10.1002/rcm.7799</doi><tpages>11</tpages><orcidid>https://orcid.org/0000-0001-7503-8116</orcidid><orcidid>https://orcid.org/0000-0002-9115-0367</orcidid></addata></record> |
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subjects | Composition effects Fractionation Glass Optical basicity Parameters Sciences of the Universe Secondary ion mass spectrometry Silicon dioxide |
title | Influence of glass composition on secondary ion mass spectrometry instrumental mass fractionation for Si and Ca isotopic analyses |
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