Performance Assessment of Probes Dedicated to the Monitoring of Surface Particle Contamination
Surface probes, based on airflow particle detachment coupled with optical particle counter, are actually available to measure the particle cleanliness of surfaces in cleanroom. No reliable data exits dealing with the performance assessment of these probes in unstuck and counting particles deposited...
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Veröffentlicht in: | Particle & particle systems characterization 2012-08, Vol.29 (3), p.156-166 |
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description | Surface probes, based on airflow particle detachment coupled with optical particle counter, are actually available to measure the particle cleanliness of surfaces in cleanroom. No reliable data exits dealing with the performance assessment of these probes in unstuck and counting particles deposited on surfaces. This work presents a method for determining the efficiency of instruments dedicated to particle surface cleanliness measurements. The method is based on the realisation of standard particle deposits by sedimentation and analysis of whole of the contaminated surface by microscopy combined with a micrometric displacement bench. The method is used to assess a trial surface probe with 30 μm and 80 μm glass beads deposited on transparent (glass) or opaque (aluminium) surfaces at concentrations ranging from 1 particle·cm–2 to 50 particles·cm–2. The results obtained show that the overall efficiency of the instrument tested is less than 5 %. The detailed analysis of results shows that this low value is mainly due to poor efficiency of sampling and detection of particles in the optical counter. When analysed in terms of particle detachment efficiency, the results agree qualitatively with a force balance analysis taking into account the friction by airflow and the distribution of adhesion forces of glass particles to glass substrates or rough aluminium substrates. Such result shows that airflow based surface probes for particle cleanliness measurements should be systematically qualified for representative conditions of operations whereas analytical microscopy measurements could be considered as reference.
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doi_str_mv | 10.1002/ppsc.201200005 |
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No .</description><subject>Airflow</subject><subject>Aluminium</subject><subject>Aluminum</subject><subject>Cleanliness</subject><subject>cleanroom</subject><subject>contamination</subject><subject>counting efficiency</subject><subject>Deposition</subject><subject>Detachment</subject><subject>Glass</subject><subject>Microscopy</subject><subject>optical particle counter</subject><subject>Physics</subject><subject>surface cleanliness measurement</subject><issn>0934-0866</issn><issn>1521-4117</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2012</creationdate><recordtype>article</recordtype><recordid>eNqFkc-L1DAUx4MoOI5ePRe86KGzSZqkzXGo7g-Y1cIseDOk6aubtU3GJKPuf2-GyiBezOVB-Hwe770vQq8J3hCM6cXhEM2GYkJxfvwJWhFOSckIqZ-iFZYVK3EjxHP0IsaHTAhOxAp96SCMPszaGSi2MUKMM7hU-LHogu8hFu9hsEYnGIrki3QPxa13Nvlg3dcTtT-GUWe30yFZM0HRepf0bJ1O1ruX6Nmopwiv_tQ1urv8cNdel7tPVzftdlcaRikv86SATUU562UDPWsGBlQ3tDEMMiEaXdd0EGNlBNdCS8rqoe-BC9NDQ0y1Ru-Wtvd6UodgZx0elddWXW936vSHqcSSSfGDZPbtwh6C_36EmNRso4Fp0g78MSrSYMxkw_LF1ujNP-iDPwaXF1GkFiIzFRGZ2iyUCT7GAON5AoLVKRl1Skadk8mCXISfdoLH_9Cq6_bt3265uDYm-HV2dfimRF3VXH3-eKX2kuPL21aqtvoNLOugaA</recordid><startdate>201208</startdate><enddate>201208</enddate><creator>Pecault, Isabelle Tovena</creator><creator>Gensdarmes, François</creator><creator>Basso, Guillaume</creator><creator>Sommer, Francoise</creator><general>WILEY-VCH Verlag</general><general>WILEY‐VCH Verlag</general><general>Wiley Subscription Services, Inc</general><general>Wiley-VCH Verlag</general><scope>BSCLL</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SR</scope><scope>7U5</scope><scope>8BQ</scope><scope>8FD</scope><scope>JG9</scope><scope>L7M</scope><scope>1XC</scope><orcidid>https://orcid.org/0000-0001-6491-8054</orcidid></search><sort><creationdate>201208</creationdate><title>Performance Assessment of Probes Dedicated to the Monitoring of Surface Particle Contamination</title><author>Pecault, Isabelle Tovena ; Gensdarmes, François ; Basso, Guillaume ; Sommer, Francoise</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c4225-152e0c3254b98eb48d4e2a828c4ec4268a772d6f3c65a6a9247dbbe56cbe81c3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2012</creationdate><topic>Airflow</topic><topic>Aluminium</topic><topic>Aluminum</topic><topic>Cleanliness</topic><topic>cleanroom</topic><topic>contamination</topic><topic>counting efficiency</topic><topic>Deposition</topic><topic>Detachment</topic><topic>Glass</topic><topic>Microscopy</topic><topic>optical particle counter</topic><topic>Physics</topic><topic>surface cleanliness measurement</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Pecault, Isabelle Tovena</creatorcontrib><creatorcontrib>Gensdarmes, François</creatorcontrib><creatorcontrib>Basso, Guillaume</creatorcontrib><creatorcontrib>Sommer, Francoise</creatorcontrib><collection>Istex</collection><collection>CrossRef</collection><collection>Engineered Materials Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>Materials Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>Hyper Article en Ligne (HAL)</collection><jtitle>Particle & particle systems characterization</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Pecault, Isabelle Tovena</au><au>Gensdarmes, François</au><au>Basso, Guillaume</au><au>Sommer, Francoise</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Performance Assessment of Probes Dedicated to the Monitoring of Surface Particle Contamination</atitle><jtitle>Particle & particle systems characterization</jtitle><addtitle>Part. Part. Syst. Charact</addtitle><date>2012-08</date><risdate>2012</risdate><volume>29</volume><issue>3</issue><spage>156</spage><epage>166</epage><pages>156-166</pages><issn>0934-0866</issn><eissn>1521-4117</eissn><abstract>Surface probes, based on airflow particle detachment coupled with optical particle counter, are actually available to measure the particle cleanliness of surfaces in cleanroom. No reliable data exits dealing with the performance assessment of these probes in unstuck and counting particles deposited on surfaces. This work presents a method for determining the efficiency of instruments dedicated to particle surface cleanliness measurements. The method is based on the realisation of standard particle deposits by sedimentation and analysis of whole of the contaminated surface by microscopy combined with a micrometric displacement bench. The method is used to assess a trial surface probe with 30 μm and 80 μm glass beads deposited on transparent (glass) or opaque (aluminium) surfaces at concentrations ranging from 1 particle·cm–2 to 50 particles·cm–2. The results obtained show that the overall efficiency of the instrument tested is less than 5 %. The detailed analysis of results shows that this low value is mainly due to poor efficiency of sampling and detection of particles in the optical counter. When analysed in terms of particle detachment efficiency, the results agree qualitatively with a force balance analysis taking into account the friction by airflow and the distribution of adhesion forces of glass particles to glass substrates or rough aluminium substrates. Such result shows that airflow based surface probes for particle cleanliness measurements should be systematically qualified for representative conditions of operations whereas analytical microscopy measurements could be considered as reference.
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subjects | Airflow Aluminium Aluminum Cleanliness cleanroom contamination counting efficiency Deposition Detachment Glass Microscopy optical particle counter Physics surface cleanliness measurement |
title | Performance Assessment of Probes Dedicated to the Monitoring of Surface Particle Contamination |
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