Transfer impedance calculations of electronic noise in two-terminal semiconductor structures
The time-domain formulation of the transfer-impedance method is developed to calculate the impedance field of two-terminal semiconductor structures. The voltage noise spectrum associated with velocity fluctuations is then calculated for overmicron and submicron n+nn+ GaAs diodes in the framework of...
Gespeichert in:
Veröffentlicht in: | Journal of applied physics 1998-02, Vol.83 (4), p.2052-2066 |
---|---|
Hauptverfasser: | , , , , , , , , , |
Format: | Artikel |
Sprache: | eng |
Schlagworte: | |
Online-Zugang: | Volltext |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
container_end_page | 2066 |
---|---|
container_issue | 4 |
container_start_page | 2052 |
container_title | Journal of applied physics |
container_volume | 83 |
creator | Starikov, E. Shiktorov, P. Gružinskis, V. Varani, L. Vaissiere, J. C. Nougier, J. P. González, T. Mateos, J. Pardo, D. Reggiani, L. |
description | The time-domain formulation of the transfer-impedance method is developed to calculate the impedance field of two-terminal semiconductor structures. The voltage noise spectrum associated with velocity fluctuations is then calculated for overmicron and submicron n+nn+ GaAs diodes in the framework of a closed hydrodynamic approach based on the velocity and energy conservation equations. Transit-time effects are found to influence substantially the noise spectrum in a wide frequency range above 10 GHz. The good agreement found with Monte Carlo simulations validates the proposed theoretical approach. |
doi_str_mv | 10.1063/1.366938 |
format | Article |
fullrecord | <record><control><sourceid>hal_cross</sourceid><recordid>TN_cdi_hal_primary_oai_HAL_hal_02394571v1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>oai_HAL_hal_02394571v1</sourcerecordid><originalsourceid>FETCH-LOGICAL-c259t-df7e9d376bad54d546845aa45c972f9be2a95bc032766ed63f538992ca6dfa413</originalsourceid><addsrcrecordid>eNo9UEtLAzEYDKJgrYI_IUc9bM1jk2yOpagVCl7qTVi-5oGR3aQkWcV_b0tFGJhhmJnDIHRLyYISyR_ogkupeXeGZpR0ulFCkHM0I4TRptNKX6KrUj4JobTjeobetxli8S7jMO6dhWgcNjCYaYAaUiw4eewGZ2pOMRgcUygOh4jrd2qqy2OIMODixmBStJOpKeNS80FM2ZVrdOFhKO7mj-fo7elxu1o3m9fnl9Vy0xgmdG2sV05bruQOrGgPkF0rAFphtGJe7xwDLXaGcKakdFZyL3inNTMgrYeW8jm6P-1-wNDvcxgh__QJQr9ebvqjRxjXrVD065i9O2VNTqVk5_8LlPTHB3vanx7kvzLSZGM</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype></control><display><type>article</type><title>Transfer impedance calculations of electronic noise in two-terminal semiconductor structures</title><source>AIP Digital Archive</source><creator>Starikov, E. ; Shiktorov, P. ; Gružinskis, V. ; Varani, L. ; Vaissiere, J. C. ; Nougier, J. P. ; González, T. ; Mateos, J. ; Pardo, D. ; Reggiani, L.</creator><creatorcontrib>Starikov, E. ; Shiktorov, P. ; Gružinskis, V. ; Varani, L. ; Vaissiere, J. C. ; Nougier, J. P. ; González, T. ; Mateos, J. ; Pardo, D. ; Reggiani, L.</creatorcontrib><description>The time-domain formulation of the transfer-impedance method is developed to calculate the impedance field of two-terminal semiconductor structures. The voltage noise spectrum associated with velocity fluctuations is then calculated for overmicron and submicron n+nn+ GaAs diodes in the framework of a closed hydrodynamic approach based on the velocity and energy conservation equations. Transit-time effects are found to influence substantially the noise spectrum in a wide frequency range above 10 GHz. The good agreement found with Monte Carlo simulations validates the proposed theoretical approach.</description><identifier>ISSN: 0021-8979</identifier><identifier>EISSN: 1089-7550</identifier><identifier>DOI: 10.1063/1.366938</identifier><language>eng</language><publisher>American Institute of Physics</publisher><subject>Computational Physics ; Condensed Matter ; Electronics ; Engineering Sciences ; Materials Science ; Physics</subject><ispartof>Journal of applied physics, 1998-02, Vol.83 (4), p.2052-2066</ispartof><rights>Distributed under a Creative Commons Attribution 4.0 International License</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c259t-df7e9d376bad54d546845aa45c972f9be2a95bc032766ed63f538992ca6dfa413</citedby><cites>FETCH-LOGICAL-c259t-df7e9d376bad54d546845aa45c972f9be2a95bc032766ed63f538992ca6dfa413</cites><orcidid>0000-0002-0963-0987 ; 0000-0002-3085-9997 ; 0000-0002-3706-3211 ; 0000-0003-4041-7145</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>230,314,780,784,885,27924,27925</link.rule.ids><backlink>$$Uhttps://hal.science/hal-02394571$$DView record in HAL$$Hfree_for_read</backlink></links><search><creatorcontrib>Starikov, E.</creatorcontrib><creatorcontrib>Shiktorov, P.</creatorcontrib><creatorcontrib>Gružinskis, V.</creatorcontrib><creatorcontrib>Varani, L.</creatorcontrib><creatorcontrib>Vaissiere, J. C.</creatorcontrib><creatorcontrib>Nougier, J. P.</creatorcontrib><creatorcontrib>González, T.</creatorcontrib><creatorcontrib>Mateos, J.</creatorcontrib><creatorcontrib>Pardo, D.</creatorcontrib><creatorcontrib>Reggiani, L.</creatorcontrib><title>Transfer impedance calculations of electronic noise in two-terminal semiconductor structures</title><title>Journal of applied physics</title><description>The time-domain formulation of the transfer-impedance method is developed to calculate the impedance field of two-terminal semiconductor structures. The voltage noise spectrum associated with velocity fluctuations is then calculated for overmicron and submicron n+nn+ GaAs diodes in the framework of a closed hydrodynamic approach based on the velocity and energy conservation equations. Transit-time effects are found to influence substantially the noise spectrum in a wide frequency range above 10 GHz. The good agreement found with Monte Carlo simulations validates the proposed theoretical approach.</description><subject>Computational Physics</subject><subject>Condensed Matter</subject><subject>Electronics</subject><subject>Engineering Sciences</subject><subject>Materials Science</subject><subject>Physics</subject><issn>0021-8979</issn><issn>1089-7550</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1998</creationdate><recordtype>article</recordtype><recordid>eNo9UEtLAzEYDKJgrYI_IUc9bM1jk2yOpagVCl7qTVi-5oGR3aQkWcV_b0tFGJhhmJnDIHRLyYISyR_ogkupeXeGZpR0ulFCkHM0I4TRptNKX6KrUj4JobTjeobetxli8S7jMO6dhWgcNjCYaYAaUiw4eewGZ2pOMRgcUygOh4jrd2qqy2OIMODixmBStJOpKeNS80FM2ZVrdOFhKO7mj-fo7elxu1o3m9fnl9Vy0xgmdG2sV05bruQOrGgPkF0rAFphtGJe7xwDLXaGcKakdFZyL3inNTMgrYeW8jm6P-1-wNDvcxgh__QJQr9ebvqjRxjXrVD065i9O2VNTqVk5_8LlPTHB3vanx7kvzLSZGM</recordid><startdate>19980215</startdate><enddate>19980215</enddate><creator>Starikov, E.</creator><creator>Shiktorov, P.</creator><creator>Gružinskis, V.</creator><creator>Varani, L.</creator><creator>Vaissiere, J. C.</creator><creator>Nougier, J. P.</creator><creator>González, T.</creator><creator>Mateos, J.</creator><creator>Pardo, D.</creator><creator>Reggiani, L.</creator><general>American Institute of Physics</general><scope>AAYXX</scope><scope>CITATION</scope><scope>1XC</scope><orcidid>https://orcid.org/0000-0002-0963-0987</orcidid><orcidid>https://orcid.org/0000-0002-3085-9997</orcidid><orcidid>https://orcid.org/0000-0002-3706-3211</orcidid><orcidid>https://orcid.org/0000-0003-4041-7145</orcidid></search><sort><creationdate>19980215</creationdate><title>Transfer impedance calculations of electronic noise in two-terminal semiconductor structures</title><author>Starikov, E. ; Shiktorov, P. ; Gružinskis, V. ; Varani, L. ; Vaissiere, J. C. ; Nougier, J. P. ; González, T. ; Mateos, J. ; Pardo, D. ; Reggiani, L.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c259t-df7e9d376bad54d546845aa45c972f9be2a95bc032766ed63f538992ca6dfa413</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1998</creationdate><topic>Computational Physics</topic><topic>Condensed Matter</topic><topic>Electronics</topic><topic>Engineering Sciences</topic><topic>Materials Science</topic><topic>Physics</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Starikov, E.</creatorcontrib><creatorcontrib>Shiktorov, P.</creatorcontrib><creatorcontrib>Gružinskis, V.</creatorcontrib><creatorcontrib>Varani, L.</creatorcontrib><creatorcontrib>Vaissiere, J. C.</creatorcontrib><creatorcontrib>Nougier, J. P.</creatorcontrib><creatorcontrib>González, T.</creatorcontrib><creatorcontrib>Mateos, J.</creatorcontrib><creatorcontrib>Pardo, D.</creatorcontrib><creatorcontrib>Reggiani, L.</creatorcontrib><collection>CrossRef</collection><collection>Hyper Article en Ligne (HAL)</collection><jtitle>Journal of applied physics</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Starikov, E.</au><au>Shiktorov, P.</au><au>Gružinskis, V.</au><au>Varani, L.</au><au>Vaissiere, J. C.</au><au>Nougier, J. P.</au><au>González, T.</au><au>Mateos, J.</au><au>Pardo, D.</au><au>Reggiani, L.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Transfer impedance calculations of electronic noise in two-terminal semiconductor structures</atitle><jtitle>Journal of applied physics</jtitle><date>1998-02-15</date><risdate>1998</risdate><volume>83</volume><issue>4</issue><spage>2052</spage><epage>2066</epage><pages>2052-2066</pages><issn>0021-8979</issn><eissn>1089-7550</eissn><abstract>The time-domain formulation of the transfer-impedance method is developed to calculate the impedance field of two-terminal semiconductor structures. The voltage noise spectrum associated with velocity fluctuations is then calculated for overmicron and submicron n+nn+ GaAs diodes in the framework of a closed hydrodynamic approach based on the velocity and energy conservation equations. Transit-time effects are found to influence substantially the noise spectrum in a wide frequency range above 10 GHz. The good agreement found with Monte Carlo simulations validates the proposed theoretical approach.</abstract><pub>American Institute of Physics</pub><doi>10.1063/1.366938</doi><tpages>15</tpages><orcidid>https://orcid.org/0000-0002-0963-0987</orcidid><orcidid>https://orcid.org/0000-0002-3085-9997</orcidid><orcidid>https://orcid.org/0000-0002-3706-3211</orcidid><orcidid>https://orcid.org/0000-0003-4041-7145</orcidid></addata></record> |
fulltext | fulltext |
identifier | ISSN: 0021-8979 |
ispartof | Journal of applied physics, 1998-02, Vol.83 (4), p.2052-2066 |
issn | 0021-8979 1089-7550 |
language | eng |
recordid | cdi_hal_primary_oai_HAL_hal_02394571v1 |
source | AIP Digital Archive |
subjects | Computational Physics Condensed Matter Electronics Engineering Sciences Materials Science Physics |
title | Transfer impedance calculations of electronic noise in two-terminal semiconductor structures |
url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-27T19%3A36%3A39IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-hal_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Transfer%20impedance%20calculations%20of%20electronic%20noise%20in%20two-terminal%20semiconductor%20structures&rft.jtitle=Journal%20of%20applied%20physics&rft.au=Starikov,%20E.&rft.date=1998-02-15&rft.volume=83&rft.issue=4&rft.spage=2052&rft.epage=2066&rft.pages=2052-2066&rft.issn=0021-8979&rft.eissn=1089-7550&rft_id=info:doi/10.1063/1.366938&rft_dat=%3Chal_cross%3Eoai_HAL_hal_02394571v1%3C/hal_cross%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |