Transverse magnetoresistance induced by electron-surface scattering on thin gold films: Experiment and theory

We report new experimental data regarding the transverse magnetoresistance measured in a family of thin gold films of different thickness with the electric field E oriented perpendicular to the magnetic field B (both fields contained within the plane of the film), as well as a theoretical descriptio...

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Veröffentlicht in:Applied surface science 2014-01, Vol.289, p.167-172
Hauptverfasser: Oyarzún, Simón, Henríquez, Ricardo, Suárez, Marco Antonio, Moraga, Luis, Kremer, Germán, Munoz, Raúl C.
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container_end_page 172
container_issue
container_start_page 167
container_title Applied surface science
container_volume 289
creator Oyarzún, Simón
Henríquez, Ricardo
Suárez, Marco Antonio
Moraga, Luis
Kremer, Germán
Munoz, Raúl C.
description We report new experimental data regarding the transverse magnetoresistance measured in a family of thin gold films of different thickness with the electric field E oriented perpendicular to the magnetic field B (both fields contained within the plane of the film), as well as a theoretical description of size effects based upon a solution of Boltzmann Transport Equation. The measurements were performed at low temperatures T (4K≤T≤50K) under magnetic field strengths B (1.5T≤B≤9T). The magnetoresistance signal can be univocally identified as arising from electron-surface scattering, for the Hall mobility at 4K depends linearly on film thickness. The magnetoresistance signal exhibits a marked thickness dependence, and its curvature as a function of magnetic field B varies with film thickness. The theoretical description of the magnetic field dependence of the magnetoresistance requires a Hall field that varies with the thickness of the film; this Hall field is tuned to reproduce the experimental data.
doi_str_mv 10.1016/j.apsusc.2013.10.128
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fullrecord <record><control><sourceid>proquest_hal_p</sourceid><recordid>TN_cdi_hal_primary_oai_HAL_hal_02309856v1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><els_id>S0169433213019879</els_id><sourcerecordid>1685762366</sourcerecordid><originalsourceid>FETCH-LOGICAL-c403t-1661f408811240cd5500f5ec962efa44039698124214f14250d20c90c0df87ea3</originalsourceid><addsrcrecordid>eNp9kc1uEzEUhUcVlRpa3oCFN0iwmGB7bMfDAqmqCkWKxKasLWNfp45m7OA7EzVvj8NUXbKydM93f3xO07xndM0oU5_3a3vAGd2aU9atz1WuL5oV05uulVKLN82qYn0ruo5fNW8R95RWZNOtmvGx2IRHKAhktLsEUy6AESebHJCY_OzAk98nAgO4qeTU4lyCrRo6O01QYtqRnMj0FBPZ5cGTEIcRv5D750MVR0gTsclXHXI53TSXwQ4I717e6-bXt_vHu4d2-_P7j7vbbesE7aaWKcWCoFozxgV1XkpKgwTXKw7Bisr0qtdV40wEJriknlPXU0d90Buw3XXzaZn7ZAdzqGfYcjLZRvNwuzXnGuUd7bVUR1bZjwt7KPnPDDiZMaKDYbAJ8oyGKS03indKVVQsqCsZsUB4nc2oOSdh9mZJwpyT-FflurZ9eNlgq2lDqI67iK-9XMv6MSUr93XhoFpzjFAMugg1Bx9LNd_4HP-_6C_2FqCg</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>1685762366</pqid></control><display><type>article</type><title>Transverse magnetoresistance induced by electron-surface scattering on thin gold films: Experiment and theory</title><source>Access via ScienceDirect (Elsevier)</source><creator>Oyarzún, Simón ; Henríquez, Ricardo ; Suárez, Marco Antonio ; Moraga, Luis ; Kremer, Germán ; Munoz, Raúl C.</creator><creatorcontrib>Oyarzún, Simón ; Henríquez, Ricardo ; Suárez, Marco Antonio ; Moraga, Luis ; Kremer, Germán ; Munoz, Raúl C.</creatorcontrib><description>We report new experimental data regarding the transverse magnetoresistance measured in a family of thin gold films of different thickness with the electric field E oriented perpendicular to the magnetic field B (both fields contained within the plane of the film), as well as a theoretical description of size effects based upon a solution of Boltzmann Transport Equation. The measurements were performed at low temperatures T (4K≤T≤50K) under magnetic field strengths B (1.5T≤B≤9T). The magnetoresistance signal can be univocally identified as arising from electron-surface scattering, for the Hall mobility at 4K depends linearly on film thickness. The magnetoresistance signal exhibits a marked thickness dependence, and its curvature as a function of magnetic field B varies with film thickness. The theoretical description of the magnetic field dependence of the magnetoresistance requires a Hall field that varies with the thickness of the film; this Hall field is tuned to reproduce the experimental data.</description><identifier>ISSN: 0169-4332</identifier><identifier>EISSN: 1873-5584</identifier><identifier>DOI: 10.1016/j.apsusc.2013.10.128</identifier><language>eng</language><publisher>Amsterdam: Elsevier B.V</publisher><subject>Boltzmann transport equation ; Chemical Sciences ; Condensed matter: electronic structure, electrical, magnetic, and optical properties ; Condensed matter: structure, mechanical and thermal properties ; Cross-disciplinary physics: materials science; rheology ; Effects ; Electron-surface scattering ; Engineering Sciences ; Exact sciences and technology ; Film thickness ; Gold ; Magnetic fields ; Magnetomorphic ; Magnetoresistance ; Magnetoresistivity ; Mathematical analysis ; Physics ; Scattering ; Size effects ; Thin films ; Transverse magnetoresistance</subject><ispartof>Applied surface science, 2014-01, Vol.289, p.167-172</ispartof><rights>2013 Elsevier B.V.</rights><rights>2015 INIST-CNRS</rights><rights>Attribution - NonCommercial - NoDerivatives</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c403t-1661f408811240cd5500f5ec962efa44039698124214f14250d20c90c0df87ea3</citedby><cites>FETCH-LOGICAL-c403t-1661f408811240cd5500f5ec962efa44039698124214f14250d20c90c0df87ea3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://dx.doi.org/10.1016/j.apsusc.2013.10.128$$EHTML$$P50$$Gelsevier$$H</linktohtml><link.rule.ids>230,314,780,784,885,3550,27924,27925,45995</link.rule.ids><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&amp;idt=28596265$$DView record in Pascal Francis$$Hfree_for_read</backlink><backlink>$$Uhttps://univ-lyon1.hal.science/hal-02309856$$DView record in HAL$$Hfree_for_read</backlink></links><search><creatorcontrib>Oyarzún, Simón</creatorcontrib><creatorcontrib>Henríquez, Ricardo</creatorcontrib><creatorcontrib>Suárez, Marco Antonio</creatorcontrib><creatorcontrib>Moraga, Luis</creatorcontrib><creatorcontrib>Kremer, Germán</creatorcontrib><creatorcontrib>Munoz, Raúl C.</creatorcontrib><title>Transverse magnetoresistance induced by electron-surface scattering on thin gold films: Experiment and theory</title><title>Applied surface science</title><description>We report new experimental data regarding the transverse magnetoresistance measured in a family of thin gold films of different thickness with the electric field E oriented perpendicular to the magnetic field B (both fields contained within the plane of the film), as well as a theoretical description of size effects based upon a solution of Boltzmann Transport Equation. The measurements were performed at low temperatures T (4K≤T≤50K) under magnetic field strengths B (1.5T≤B≤9T). The magnetoresistance signal can be univocally identified as arising from electron-surface scattering, for the Hall mobility at 4K depends linearly on film thickness. The magnetoresistance signal exhibits a marked thickness dependence, and its curvature as a function of magnetic field B varies with film thickness. The theoretical description of the magnetic field dependence of the magnetoresistance requires a Hall field that varies with the thickness of the film; this Hall field is tuned to reproduce the experimental data.</description><subject>Boltzmann transport equation</subject><subject>Chemical Sciences</subject><subject>Condensed matter: electronic structure, electrical, magnetic, and optical properties</subject><subject>Condensed matter: structure, mechanical and thermal properties</subject><subject>Cross-disciplinary physics: materials science; rheology</subject><subject>Effects</subject><subject>Electron-surface scattering</subject><subject>Engineering Sciences</subject><subject>Exact sciences and technology</subject><subject>Film thickness</subject><subject>Gold</subject><subject>Magnetic fields</subject><subject>Magnetomorphic</subject><subject>Magnetoresistance</subject><subject>Magnetoresistivity</subject><subject>Mathematical analysis</subject><subject>Physics</subject><subject>Scattering</subject><subject>Size effects</subject><subject>Thin films</subject><subject>Transverse magnetoresistance</subject><issn>0169-4332</issn><issn>1873-5584</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2014</creationdate><recordtype>article</recordtype><recordid>eNp9kc1uEzEUhUcVlRpa3oCFN0iwmGB7bMfDAqmqCkWKxKasLWNfp45m7OA7EzVvj8NUXbKydM93f3xO07xndM0oU5_3a3vAGd2aU9atz1WuL5oV05uulVKLN82qYn0ruo5fNW8R95RWZNOtmvGx2IRHKAhktLsEUy6AESebHJCY_OzAk98nAgO4qeTU4lyCrRo6O01QYtqRnMj0FBPZ5cGTEIcRv5D750MVR0gTsclXHXI53TSXwQ4I717e6-bXt_vHu4d2-_P7j7vbbesE7aaWKcWCoFozxgV1XkpKgwTXKw7Bisr0qtdV40wEJriknlPXU0d90Buw3XXzaZn7ZAdzqGfYcjLZRvNwuzXnGuUd7bVUR1bZjwt7KPnPDDiZMaKDYbAJ8oyGKS03indKVVQsqCsZsUB4nc2oOSdh9mZJwpyT-FflurZ9eNlgq2lDqI67iK-9XMv6MSUr93XhoFpzjFAMugg1Bx9LNd_4HP-_6C_2FqCg</recordid><startdate>20140115</startdate><enddate>20140115</enddate><creator>Oyarzún, Simón</creator><creator>Henríquez, Ricardo</creator><creator>Suárez, Marco Antonio</creator><creator>Moraga, Luis</creator><creator>Kremer, Germán</creator><creator>Munoz, Raúl C.</creator><general>Elsevier B.V</general><general>Elsevier</general><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SR</scope><scope>7U5</scope><scope>8BQ</scope><scope>8FD</scope><scope>JG9</scope><scope>L7M</scope><scope>1XC</scope></search><sort><creationdate>20140115</creationdate><title>Transverse magnetoresistance induced by electron-surface scattering on thin gold films: Experiment and theory</title><author>Oyarzún, Simón ; Henríquez, Ricardo ; Suárez, Marco Antonio ; Moraga, Luis ; Kremer, Germán ; Munoz, Raúl C.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c403t-1661f408811240cd5500f5ec962efa44039698124214f14250d20c90c0df87ea3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2014</creationdate><topic>Boltzmann transport equation</topic><topic>Chemical Sciences</topic><topic>Condensed matter: electronic structure, electrical, magnetic, and optical properties</topic><topic>Condensed matter: structure, mechanical and thermal properties</topic><topic>Cross-disciplinary physics: materials science; rheology</topic><topic>Effects</topic><topic>Electron-surface scattering</topic><topic>Engineering Sciences</topic><topic>Exact sciences and technology</topic><topic>Film thickness</topic><topic>Gold</topic><topic>Magnetic fields</topic><topic>Magnetomorphic</topic><topic>Magnetoresistance</topic><topic>Magnetoresistivity</topic><topic>Mathematical analysis</topic><topic>Physics</topic><topic>Scattering</topic><topic>Size effects</topic><topic>Thin films</topic><topic>Transverse magnetoresistance</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Oyarzún, Simón</creatorcontrib><creatorcontrib>Henríquez, Ricardo</creatorcontrib><creatorcontrib>Suárez, Marco Antonio</creatorcontrib><creatorcontrib>Moraga, Luis</creatorcontrib><creatorcontrib>Kremer, Germán</creatorcontrib><creatorcontrib>Munoz, Raúl C.</creatorcontrib><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>Engineered Materials Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>Materials Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>Hyper Article en Ligne (HAL)</collection><jtitle>Applied surface science</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Oyarzún, Simón</au><au>Henríquez, Ricardo</au><au>Suárez, Marco Antonio</au><au>Moraga, Luis</au><au>Kremer, Germán</au><au>Munoz, Raúl C.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Transverse magnetoresistance induced by electron-surface scattering on thin gold films: Experiment and theory</atitle><jtitle>Applied surface science</jtitle><date>2014-01-15</date><risdate>2014</risdate><volume>289</volume><spage>167</spage><epage>172</epage><pages>167-172</pages><issn>0169-4332</issn><eissn>1873-5584</eissn><abstract>We report new experimental data regarding the transverse magnetoresistance measured in a family of thin gold films of different thickness with the electric field E oriented perpendicular to the magnetic field B (both fields contained within the plane of the film), as well as a theoretical description of size effects based upon a solution of Boltzmann Transport Equation. The measurements were performed at low temperatures T (4K≤T≤50K) under magnetic field strengths B (1.5T≤B≤9T). The magnetoresistance signal can be univocally identified as arising from electron-surface scattering, for the Hall mobility at 4K depends linearly on film thickness. The magnetoresistance signal exhibits a marked thickness dependence, and its curvature as a function of magnetic field B varies with film thickness. The theoretical description of the magnetic field dependence of the magnetoresistance requires a Hall field that varies with the thickness of the film; this Hall field is tuned to reproduce the experimental data.</abstract><cop>Amsterdam</cop><pub>Elsevier B.V</pub><doi>10.1016/j.apsusc.2013.10.128</doi><tpages>6</tpages></addata></record>
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subjects Boltzmann transport equation
Chemical Sciences
Condensed matter: electronic structure, electrical, magnetic, and optical properties
Condensed matter: structure, mechanical and thermal properties
Cross-disciplinary physics: materials science
rheology
Effects
Electron-surface scattering
Engineering Sciences
Exact sciences and technology
Film thickness
Gold
Magnetic fields
Magnetomorphic
Magnetoresistance
Magnetoresistivity
Mathematical analysis
Physics
Scattering
Size effects
Thin films
Transverse magnetoresistance
title Transverse magnetoresistance induced by electron-surface scattering on thin gold films: Experiment and theory
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-25T20%3A12%3A38IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_hal_p&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Transverse%20magnetoresistance%20induced%20by%20electron-surface%20scattering%20on%20thin%20gold%20films:%20Experiment%20and%20theory&rft.jtitle=Applied%20surface%20science&rft.au=Oyarz%C3%BAn,%20Sim%C3%B3n&rft.date=2014-01-15&rft.volume=289&rft.spage=167&rft.epage=172&rft.pages=167-172&rft.issn=0169-4332&rft.eissn=1873-5584&rft_id=info:doi/10.1016/j.apsusc.2013.10.128&rft_dat=%3Cproquest_hal_p%3E1685762366%3C/proquest_hal_p%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=1685762366&rft_id=info:pmid/&rft_els_id=S0169433213019879&rfr_iscdi=true