Electron paramagnetic resonance tagged high-resolution excitation spectroscopy of NV-centers in 4H-SiC

We show that electron paramagnetic resonance (EPR) tagged high resolution photoexcitation spectroscopy is a powerful method for the correlation of zero phonon photoluminescence spectra with atomic point defects. Applied to the case of NV centers in 4 H -SiC it allows to associate the photoluminescen...

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Veröffentlicht in:	Physical review. B 2018-12, Vol.98 (21), p.1
Hauptverfasser:	Zargaleh, S A, von Bardeleben, H J, Cantin, J L, Gerstmann, U, Hameau, S, Eblé, B, Gao, Weibo
Format:	Artikel
Sprache:	eng
Schlagworte:	Condensed Matter Electron paramagnetic resonance Electronic devices Energy resolution Excitation spectra High resolution Material properties Optical communication Photoexcitation Photoluminescence Physics Point defects Spectroscopy Spectrum analysis
Online-Zugang:	Volltext
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