Antiferromagnetic thickness and temperature dependence of the exchange bias properties of Co/IrMn nanodots and continuous films: A Monte Carlo study
•Our results are successfully compared to experimental data on Co/IrMn bilayers.•Our model takes into account disordered phases at the interface and at the edges.•HE (nanodots)
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container_title | Journal of magnetism and magnetic materials |
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creator | Kanso, H. Patte, R. Ledue, D. |
description | •Our results are successfully compared to experimental data on Co/IrMn bilayers.•Our model takes into account disordered phases at the interface and at the edges.•HE (nanodots) |
doi_str_mv | 10.1016/j.jmmm.2019.165543 |
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fullrecord | <record><control><sourceid>proquest_hal_p</sourceid><recordid>TN_cdi_hal_primary_oai_HAL_hal_02185087v1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><els_id>S0304885319309412</els_id><sourcerecordid>2307387058</sourcerecordid><originalsourceid>FETCH-LOGICAL-c472t-95a1476994e5ce3fed844068f1bef2e26e190f295a72dd9ea3770ffc28c779123</originalsourceid><addsrcrecordid>eNp9kc1u1DAUhS0EEkPpC7CyxIpFpv5JYgexGY0orTQVG7q2XPu64zCxB9up6HvwwHUUxJKVpevvHN_jg9AHSraU0P5q3I7TNG0ZocOW9l3X8ldoQ6XgTSv6_jXaEE7aRsqOv0Xvch4JIbSV_Qb92YXiHaQUJ_0YoHiDy9GbnwFyxjpYXGA6Q9JlToAtnCFYCAZwdJUDDL_NUYdHwA9eZ3xOsbLFQ17u9_HqNt0FHHSINpbVzsT6XpjjnLHzpyl_xjt8V2eA9zqdIs5lts_v0RunTxku_54X6P7664_9TXP4_u12vzs0phWsNEOnaY03DC10BrgDK9uW9NLRB3AMWA90II5VTDBrB9BcCOKcYdIIMVDGL9Cn1feoT-qc_KTTs4raq5vdQS0zwqjsiBRPtLIfV7aG_DVDLmqMcwp1PcU4EVwK0slKsZUyKeacwP2zpUQtTalRLU2ppSm1NlVFX1YR1KxPHpLKxi-_bH0CU5SN_n_yF8Opnhs</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>2307387058</pqid></control><display><type>article</type><title>Antiferromagnetic thickness and temperature dependence of the exchange bias properties of Co/IrMn nanodots and continuous films: A Monte Carlo study</title><source>Elsevier ScienceDirect Journals Complete</source><creator>Kanso, H. ; Patte, R. ; Ledue, D.</creator><creatorcontrib>Kanso, H. ; Patte, R. ; Ledue, D.</creatorcontrib><description>•Our results are successfully compared to experimental data on Co/IrMn bilayers.•Our model takes into account disordered phases at the interface and at the edges.•HE (nanodots) < HE (continuous films) for small AF thicknesses and larger for larger ones.•Comprehensive description of the AF thickness and T effects on the EB properties.
Motivated by the challenge of understanding the complex influence of the antiferromagnetic (AF) thickness and the temperature on exchange bias (EB) properties, and by the necessity of miniaturization of devices, we investigate EB properties of Co/IrMn nanodots and of continuous films by using kinetic Monte Carlo simulations. To that purpose, we use a granular model, which takes into account disordered interfacial phases in the AF layer and, in the case of nanodots, disordered phases at the edges in the AF layer. Our results show that the AF thickness dependence of the exchange field HE (measured at room temperature) in both nanodots and continuous films exhibits a maximum in agreement with experimental results. We explain these results in terms of superparamagnetic and blocked grains in the AF layer at room temperature and also not polarized AF grains during the initial field-cooling. The simulated values of HE in nanodots are smaller than that in continuous films for small AF thicknesses and larger for larger ones due to the contribution of the disordered phases at the edges in the AF layer. Also, we investigate the temperature and AF thickness effects on HE and on the coercive field HC. We found that HE slightly decreases at low temperatures due to the disordered interfacial phases. Importantly, at the maximum blocking temperature of the AF grains, HE vanishes and HC exhibits a maximum. Our numerical results are successfully compared to experimental data on Co/IrMn bilayers for various IrMn thicknesses and all temperatures. In addition, our results indicate that HE is smaller in nanodots at low measurement temperature due to the presence of disordered phases at the edges. Concerning HC, our data show that it can be either larger or smaller in nanodots depending on the measurement temperature.</description><identifier>ISSN: 0304-8853</identifier><identifier>EISSN: 1873-4766</identifier><identifier>DOI: 10.1016/j.jmmm.2019.165543</identifier><language>eng</language><publisher>Amsterdam: Elsevier B.V</publisher><subject>Antiferromagnetism ; Bias ; Bilayers ; Coercivity ; Computer simulation ; Condensed Matter ; Exchanging ; Miniaturization ; Phases ; Physics ; Properties (attributes) ; Temperature ; Temperature dependence ; Thickness</subject><ispartof>Journal of magnetism and magnetic materials, 2019-12, Vol.491, p.165543, Article 165543</ispartof><rights>2019 Elsevier B.V.</rights><rights>Copyright Elsevier BV Dec 1, 2019</rights><rights>Attribution - NonCommercial</rights><lds50>peer_reviewed</lds50><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c472t-95a1476994e5ce3fed844068f1bef2e26e190f295a72dd9ea3770ffc28c779123</citedby><cites>FETCH-LOGICAL-c472t-95a1476994e5ce3fed844068f1bef2e26e190f295a72dd9ea3770ffc28c779123</cites><orcidid>0000-0002-8274-2483</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://dx.doi.org/10.1016/j.jmmm.2019.165543$$EHTML$$P50$$Gelsevier$$H</linktohtml><link.rule.ids>230,314,780,784,885,3550,27924,27925,45995</link.rule.ids><backlink>$$Uhttps://normandie-univ.hal.science/hal-02185087$$DView record in HAL$$Hfree_for_read</backlink></links><search><creatorcontrib>Kanso, H.</creatorcontrib><creatorcontrib>Patte, R.</creatorcontrib><creatorcontrib>Ledue, D.</creatorcontrib><title>Antiferromagnetic thickness and temperature dependence of the exchange bias properties of Co/IrMn nanodots and continuous films: A Monte Carlo study</title><title>Journal of magnetism and magnetic materials</title><description>•Our results are successfully compared to experimental data on Co/IrMn bilayers.•Our model takes into account disordered phases at the interface and at the edges.•HE (nanodots) < HE (continuous films) for small AF thicknesses and larger for larger ones.•Comprehensive description of the AF thickness and T effects on the EB properties.
Motivated by the challenge of understanding the complex influence of the antiferromagnetic (AF) thickness and the temperature on exchange bias (EB) properties, and by the necessity of miniaturization of devices, we investigate EB properties of Co/IrMn nanodots and of continuous films by using kinetic Monte Carlo simulations. To that purpose, we use a granular model, which takes into account disordered interfacial phases in the AF layer and, in the case of nanodots, disordered phases at the edges in the AF layer. Our results show that the AF thickness dependence of the exchange field HE (measured at room temperature) in both nanodots and continuous films exhibits a maximum in agreement with experimental results. We explain these results in terms of superparamagnetic and blocked grains in the AF layer at room temperature and also not polarized AF grains during the initial field-cooling. The simulated values of HE in nanodots are smaller than that in continuous films for small AF thicknesses and larger for larger ones due to the contribution of the disordered phases at the edges in the AF layer. Also, we investigate the temperature and AF thickness effects on HE and on the coercive field HC. We found that HE slightly decreases at low temperatures due to the disordered interfacial phases. Importantly, at the maximum blocking temperature of the AF grains, HE vanishes and HC exhibits a maximum. Our numerical results are successfully compared to experimental data on Co/IrMn bilayers for various IrMn thicknesses and all temperatures. In addition, our results indicate that HE is smaller in nanodots at low measurement temperature due to the presence of disordered phases at the edges. Concerning HC, our data show that it can be either larger or smaller in nanodots depending on the measurement temperature.</description><subject>Antiferromagnetism</subject><subject>Bias</subject><subject>Bilayers</subject><subject>Coercivity</subject><subject>Computer simulation</subject><subject>Condensed Matter</subject><subject>Exchanging</subject><subject>Miniaturization</subject><subject>Phases</subject><subject>Physics</subject><subject>Properties (attributes)</subject><subject>Temperature</subject><subject>Temperature dependence</subject><subject>Thickness</subject><issn>0304-8853</issn><issn>1873-4766</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2019</creationdate><recordtype>article</recordtype><recordid>eNp9kc1u1DAUhS0EEkPpC7CyxIpFpv5JYgexGY0orTQVG7q2XPu64zCxB9up6HvwwHUUxJKVpevvHN_jg9AHSraU0P5q3I7TNG0ZocOW9l3X8ldoQ6XgTSv6_jXaEE7aRsqOv0Xvch4JIbSV_Qb92YXiHaQUJ_0YoHiDy9GbnwFyxjpYXGA6Q9JlToAtnCFYCAZwdJUDDL_NUYdHwA9eZ3xOsbLFQ17u9_HqNt0FHHSINpbVzsT6XpjjnLHzpyl_xjt8V2eA9zqdIs5lts_v0RunTxku_54X6P7664_9TXP4_u12vzs0phWsNEOnaY03DC10BrgDK9uW9NLRB3AMWA90II5VTDBrB9BcCOKcYdIIMVDGL9Cn1feoT-qc_KTTs4raq5vdQS0zwqjsiBRPtLIfV7aG_DVDLmqMcwp1PcU4EVwK0slKsZUyKeacwP2zpUQtTalRLU2ppSm1NlVFX1YR1KxPHpLKxi-_bH0CU5SN_n_yF8Opnhs</recordid><startdate>20191201</startdate><enddate>20191201</enddate><creator>Kanso, H.</creator><creator>Patte, R.</creator><creator>Ledue, D.</creator><general>Elsevier B.V</general><general>Elsevier BV</general><general>Elsevier</general><scope>AAYXX</scope><scope>CITATION</scope><scope>7SR</scope><scope>7U5</scope><scope>8BQ</scope><scope>8FD</scope><scope>JG9</scope><scope>L7M</scope><scope>1XC</scope><scope>VOOES</scope><orcidid>https://orcid.org/0000-0002-8274-2483</orcidid></search><sort><creationdate>20191201</creationdate><title>Antiferromagnetic thickness and temperature dependence of the exchange bias properties of Co/IrMn nanodots and continuous films: A Monte Carlo study</title><author>Kanso, H. ; Patte, R. ; Ledue, D.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c472t-95a1476994e5ce3fed844068f1bef2e26e190f295a72dd9ea3770ffc28c779123</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2019</creationdate><topic>Antiferromagnetism</topic><topic>Bias</topic><topic>Bilayers</topic><topic>Coercivity</topic><topic>Computer simulation</topic><topic>Condensed Matter</topic><topic>Exchanging</topic><topic>Miniaturization</topic><topic>Phases</topic><topic>Physics</topic><topic>Properties (attributes)</topic><topic>Temperature</topic><topic>Temperature dependence</topic><topic>Thickness</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Kanso, H.</creatorcontrib><creatorcontrib>Patte, R.</creatorcontrib><creatorcontrib>Ledue, D.</creatorcontrib><collection>CrossRef</collection><collection>Engineered Materials Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>Materials Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>Hyper Article en Ligne (HAL)</collection><collection>Hyper Article en Ligne (HAL) (Open Access)</collection><jtitle>Journal of magnetism and magnetic materials</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Kanso, H.</au><au>Patte, R.</au><au>Ledue, D.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Antiferromagnetic thickness and temperature dependence of the exchange bias properties of Co/IrMn nanodots and continuous films: A Monte Carlo study</atitle><jtitle>Journal of magnetism and magnetic materials</jtitle><date>2019-12-01</date><risdate>2019</risdate><volume>491</volume><spage>165543</spage><pages>165543-</pages><artnum>165543</artnum><issn>0304-8853</issn><eissn>1873-4766</eissn><abstract>•Our results are successfully compared to experimental data on Co/IrMn bilayers.•Our model takes into account disordered phases at the interface and at the edges.•HE (nanodots) < HE (continuous films) for small AF thicknesses and larger for larger ones.•Comprehensive description of the AF thickness and T effects on the EB properties.
Motivated by the challenge of understanding the complex influence of the antiferromagnetic (AF) thickness and the temperature on exchange bias (EB) properties, and by the necessity of miniaturization of devices, we investigate EB properties of Co/IrMn nanodots and of continuous films by using kinetic Monte Carlo simulations. To that purpose, we use a granular model, which takes into account disordered interfacial phases in the AF layer and, in the case of nanodots, disordered phases at the edges in the AF layer. Our results show that the AF thickness dependence of the exchange field HE (measured at room temperature) in both nanodots and continuous films exhibits a maximum in agreement with experimental results. We explain these results in terms of superparamagnetic and blocked grains in the AF layer at room temperature and also not polarized AF grains during the initial field-cooling. The simulated values of HE in nanodots are smaller than that in continuous films for small AF thicknesses and larger for larger ones due to the contribution of the disordered phases at the edges in the AF layer. Also, we investigate the temperature and AF thickness effects on HE and on the coercive field HC. We found that HE slightly decreases at low temperatures due to the disordered interfacial phases. Importantly, at the maximum blocking temperature of the AF grains, HE vanishes and HC exhibits a maximum. Our numerical results are successfully compared to experimental data on Co/IrMn bilayers for various IrMn thicknesses and all temperatures. In addition, our results indicate that HE is smaller in nanodots at low measurement temperature due to the presence of disordered phases at the edges. Concerning HC, our data show that it can be either larger or smaller in nanodots depending on the measurement temperature.</abstract><cop>Amsterdam</cop><pub>Elsevier B.V</pub><doi>10.1016/j.jmmm.2019.165543</doi><orcidid>https://orcid.org/0000-0002-8274-2483</orcidid><oa>free_for_read</oa></addata></record> |
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subjects | Antiferromagnetism Bias Bilayers Coercivity Computer simulation Condensed Matter Exchanging Miniaturization Phases Physics Properties (attributes) Temperature Temperature dependence Thickness |
title | Antiferromagnetic thickness and temperature dependence of the exchange bias properties of Co/IrMn nanodots and continuous films: A Monte Carlo study |
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