Direct Insight into Ce-Silicates/Si-Nanoclusters Snowman-Like Janus Nanoparticles Formation in Ce-Doped SiO x Thin Layers

The present work reports a nanoscale chemical and structural study on the influence of Ce content in Ce-doped SiO1.5 thin films via atom probe tomography (APT). Using this technique, we can explore 3D mapping of the atomic distribution inside a material. Such an investigation is crucial to optimize...

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Veröffentlicht in:	Journal of physical chemistry. C 2017-06, Vol.121 (22), p.12447-12453
Hauptverfasser:	Beainy, Georges, Weimmerskirch-Aubatin, Jennifer, Stoffel, Mathieu, Vergnat, Michel, Rinnert, Hervé, Pareige, Philippe, Talbot, Etienne
Format:	Artikel
Sprache:	eng
Schlagworte:	Condensed Matter Materials Science Physics
Online-Zugang:	Volltext
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