Comprehensive description of the electro-optic effects in strained silicon waveguides

We present a novel and comprehensive analysis method that considers both the plasma-dispersion effect and the strain-induced Pockels effect to faithfully describe the electro-optic effects taking place in a strained silicon waveguide under an applied voltage. The change in carrier distribution arisi...

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Veröffentlicht in:Journal of applied physics 2017-10, Vol.122 (15)
Hauptverfasser: Damas, Pedro, Berciano, Mathias, Marcaud, Guillaume, Alonso Ramos, Carlos, Marris-Morini, Delphine, Cassan, Eric, Vivien, Laurent
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container_issue 15
container_start_page
container_title Journal of applied physics
container_volume 122
creator Damas, Pedro
Berciano, Mathias
Marcaud, Guillaume
Alonso Ramos, Carlos
Marris-Morini, Delphine
Cassan, Eric
Vivien, Laurent
description We present a novel and comprehensive analysis method that considers both the plasma-dispersion effect and the strain-induced Pockels effect to faithfully describe the electro-optic effects taking place in a strained silicon waveguide under an applied voltage. The change in carrier distribution arising from the application of a voltage leads to a redistribution of the electrostatic field which deeply affects the strain-induced Pockels effect. By simulating the strain gradient distribution inside the waveguide together with the free carrier concentration in silicon, we were able to describe that the effective index change due to the Pockels effect in strained silicon waveguides and the applied voltage have a nonlinear relationship.
doi_str_mv 10.1063/1.4985836
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fullrecord <record><control><sourceid>proquest_hal_p</sourceid><recordid>TN_cdi_hal_primary_oai_HAL_hal_01878844v1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>2116012070</sourcerecordid><originalsourceid>FETCH-LOGICAL-c396t-67b79b7d39e8400efbcd80aab1007e5123d7181120a15e3df4b02efdbaced9023</originalsourceid><addsrcrecordid>eNqdkE1LxDAQhoMouH4c_AcFTwrVmaZtkqMsfsGCFz2HNJm4kbWpSXfFf2-XFb17GmZ45pnhZewM4Qqh5dd4VSvZSN7usRmCVKVoGthnM4AKS6mEOmRHOb8BIEquZuxlHt-HREvqc9hQ4SjbFIYxxL6IvhiXVNCK7JhiGaepLcj7qc1F6Is8JhN6ckUOq2CnhU-zodd1mBwn7MCbVabTn3rMXu5un-cP5eLp_nF-sygtV-1YtqITqhOOK5I1APnOOgnGdAggqMGKO4ESsQKDDXHn6w4q8q4zlpyCih-zi513aVZ6SOHdpC8dTdAPNwu9nQFKIWVdb3Biz3fskOLHmvKo3-I69dN7ukJsYboi4M9oU8w5kf_VIuhtwhr1T8ITe7ljsw2j2Wb2P3gT0x-oB-f5NzHoid8</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>2116012070</pqid></control><display><type>article</type><title>Comprehensive description of the electro-optic effects in strained silicon waveguides</title><source>AIP Journals Complete</source><source>Alma/SFX Local Collection</source><creator>Damas, Pedro ; Berciano, Mathias ; Marcaud, Guillaume ; Alonso Ramos, Carlos ; Marris-Morini, Delphine ; Cassan, Eric ; Vivien, Laurent</creator><creatorcontrib>Damas, Pedro ; Berciano, Mathias ; Marcaud, Guillaume ; Alonso Ramos, Carlos ; Marris-Morini, Delphine ; Cassan, Eric ; Vivien, Laurent</creatorcontrib><description>We present a novel and comprehensive analysis method that considers both the plasma-dispersion effect and the strain-induced Pockels effect to faithfully describe the electro-optic effects taking place in a strained silicon waveguide under an applied voltage. The change in carrier distribution arising from the application of a voltage leads to a redistribution of the electrostatic field which deeply affects the strain-induced Pockels effect. By simulating the strain gradient distribution inside the waveguide together with the free carrier concentration in silicon, we were able to describe that the effective index change due to the Pockels effect in strained silicon waveguides and the applied voltage have a nonlinear relationship.</description><identifier>ISSN: 0021-8979</identifier><identifier>EISSN: 1089-7550</identifier><identifier>DOI: 10.1063/1.4985836</identifier><identifier>CODEN: JAPIAU</identifier><language>eng</language><publisher>Melville: American Institute of Physics</publisher><subject>Applied physics ; Carrier density ; Concentration gradient ; Electric potential ; Physics ; Silicon ; Waveguides</subject><ispartof>Journal of applied physics, 2017-10, Vol.122 (15)</ispartof><rights>Author(s)</rights><rights>2017 Author(s). Published by AIP Publishing.</rights><rights>Distributed under a Creative Commons Attribution 4.0 International License</rights><lds50>peer_reviewed</lds50><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c396t-67b79b7d39e8400efbcd80aab1007e5123d7181120a15e3df4b02efdbaced9023</citedby><cites>FETCH-LOGICAL-c396t-67b79b7d39e8400efbcd80aab1007e5123d7181120a15e3df4b02efdbaced9023</cites><orcidid>0000-0003-2802-7689 ; 0000-0002-1324-5029 ; 0000-0002-2980-7225 ; 0000-0002-4445-5651 ; 0000-0002-4694-7262</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://pubs.aip.org/jap/article-lookup/doi/10.1063/1.4985836$$EHTML$$P50$$Gscitation$$H</linktohtml><link.rule.ids>230,314,776,780,790,881,4497,27903,27904,76131</link.rule.ids><backlink>$$Uhttps://hal.science/hal-01878844$$DView record in HAL$$Hfree_for_read</backlink></links><search><creatorcontrib>Damas, Pedro</creatorcontrib><creatorcontrib>Berciano, Mathias</creatorcontrib><creatorcontrib>Marcaud, Guillaume</creatorcontrib><creatorcontrib>Alonso Ramos, Carlos</creatorcontrib><creatorcontrib>Marris-Morini, Delphine</creatorcontrib><creatorcontrib>Cassan, Eric</creatorcontrib><creatorcontrib>Vivien, Laurent</creatorcontrib><title>Comprehensive description of the electro-optic effects in strained silicon waveguides</title><title>Journal of applied physics</title><description>We present a novel and comprehensive analysis method that considers both the plasma-dispersion effect and the strain-induced Pockels effect to faithfully describe the electro-optic effects taking place in a strained silicon waveguide under an applied voltage. The change in carrier distribution arising from the application of a voltage leads to a redistribution of the electrostatic field which deeply affects the strain-induced Pockels effect. By simulating the strain gradient distribution inside the waveguide together with the free carrier concentration in silicon, we were able to describe that the effective index change due to the Pockels effect in strained silicon waveguides and the applied voltage have a nonlinear relationship.</description><subject>Applied physics</subject><subject>Carrier density</subject><subject>Concentration gradient</subject><subject>Electric potential</subject><subject>Physics</subject><subject>Silicon</subject><subject>Waveguides</subject><issn>0021-8979</issn><issn>1089-7550</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2017</creationdate><recordtype>article</recordtype><recordid>eNqdkE1LxDAQhoMouH4c_AcFTwrVmaZtkqMsfsGCFz2HNJm4kbWpSXfFf2-XFb17GmZ45pnhZewM4Qqh5dd4VSvZSN7usRmCVKVoGthnM4AKS6mEOmRHOb8BIEquZuxlHt-HREvqc9hQ4SjbFIYxxL6IvhiXVNCK7JhiGaepLcj7qc1F6Is8JhN6ckUOq2CnhU-zodd1mBwn7MCbVabTn3rMXu5un-cP5eLp_nF-sygtV-1YtqITqhOOK5I1APnOOgnGdAggqMGKO4ESsQKDDXHn6w4q8q4zlpyCih-zi513aVZ6SOHdpC8dTdAPNwu9nQFKIWVdb3Biz3fskOLHmvKo3-I69dN7ukJsYboi4M9oU8w5kf_VIuhtwhr1T8ITe7ljsw2j2Wb2P3gT0x-oB-f5NzHoid8</recordid><startdate>20171021</startdate><enddate>20171021</enddate><creator>Damas, Pedro</creator><creator>Berciano, Mathias</creator><creator>Marcaud, Guillaume</creator><creator>Alonso Ramos, Carlos</creator><creator>Marris-Morini, Delphine</creator><creator>Cassan, Eric</creator><creator>Vivien, Laurent</creator><general>American Institute of Physics</general><scope>AAYXX</scope><scope>CITATION</scope><scope>8FD</scope><scope>H8D</scope><scope>L7M</scope><scope>1XC</scope><scope>VOOES</scope><orcidid>https://orcid.org/0000-0003-2802-7689</orcidid><orcidid>https://orcid.org/0000-0002-1324-5029</orcidid><orcidid>https://orcid.org/0000-0002-2980-7225</orcidid><orcidid>https://orcid.org/0000-0002-4445-5651</orcidid><orcidid>https://orcid.org/0000-0002-4694-7262</orcidid></search><sort><creationdate>20171021</creationdate><title>Comprehensive description of the electro-optic effects in strained silicon waveguides</title><author>Damas, Pedro ; Berciano, Mathias ; Marcaud, Guillaume ; Alonso Ramos, Carlos ; Marris-Morini, Delphine ; Cassan, Eric ; Vivien, Laurent</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c396t-67b79b7d39e8400efbcd80aab1007e5123d7181120a15e3df4b02efdbaced9023</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2017</creationdate><topic>Applied physics</topic><topic>Carrier density</topic><topic>Concentration gradient</topic><topic>Electric potential</topic><topic>Physics</topic><topic>Silicon</topic><topic>Waveguides</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Damas, Pedro</creatorcontrib><creatorcontrib>Berciano, Mathias</creatorcontrib><creatorcontrib>Marcaud, Guillaume</creatorcontrib><creatorcontrib>Alonso Ramos, Carlos</creatorcontrib><creatorcontrib>Marris-Morini, Delphine</creatorcontrib><creatorcontrib>Cassan, Eric</creatorcontrib><creatorcontrib>Vivien, Laurent</creatorcontrib><collection>CrossRef</collection><collection>Technology Research Database</collection><collection>Aerospace Database</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>Hyper Article en Ligne (HAL)</collection><collection>Hyper Article en Ligne (HAL) (Open Access)</collection><jtitle>Journal of applied physics</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Damas, Pedro</au><au>Berciano, Mathias</au><au>Marcaud, Guillaume</au><au>Alonso Ramos, Carlos</au><au>Marris-Morini, Delphine</au><au>Cassan, Eric</au><au>Vivien, Laurent</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Comprehensive description of the electro-optic effects in strained silicon waveguides</atitle><jtitle>Journal of applied physics</jtitle><date>2017-10-21</date><risdate>2017</risdate><volume>122</volume><issue>15</issue><issn>0021-8979</issn><eissn>1089-7550</eissn><coden>JAPIAU</coden><abstract>We present a novel and comprehensive analysis method that considers both the plasma-dispersion effect and the strain-induced Pockels effect to faithfully describe the electro-optic effects taking place in a strained silicon waveguide under an applied voltage. The change in carrier distribution arising from the application of a voltage leads to a redistribution of the electrostatic field which deeply affects the strain-induced Pockels effect. By simulating the strain gradient distribution inside the waveguide together with the free carrier concentration in silicon, we were able to describe that the effective index change due to the Pockels effect in strained silicon waveguides and the applied voltage have a nonlinear relationship.</abstract><cop>Melville</cop><pub>American Institute of Physics</pub><doi>10.1063/1.4985836</doi><tpages>7</tpages><orcidid>https://orcid.org/0000-0003-2802-7689</orcidid><orcidid>https://orcid.org/0000-0002-1324-5029</orcidid><orcidid>https://orcid.org/0000-0002-2980-7225</orcidid><orcidid>https://orcid.org/0000-0002-4445-5651</orcidid><orcidid>https://orcid.org/0000-0002-4694-7262</orcidid><oa>free_for_read</oa></addata></record>
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subjects Applied physics
Carrier density
Concentration gradient
Electric potential
Physics
Silicon
Waveguides
title Comprehensive description of the electro-optic effects in strained silicon waveguides
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-22T06%3A36%3A02IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_hal_p&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Comprehensive%20description%20of%20the%20electro-optic%20effects%20in%20strained%20silicon%20waveguides&rft.jtitle=Journal%20of%20applied%20physics&rft.au=Damas,%20Pedro&rft.date=2017-10-21&rft.volume=122&rft.issue=15&rft.issn=0021-8979&rft.eissn=1089-7550&rft.coden=JAPIAU&rft_id=info:doi/10.1063/1.4985836&rft_dat=%3Cproquest_hal_p%3E2116012070%3C/proquest_hal_p%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=2116012070&rft_id=info:pmid/&rfr_iscdi=true