KxNa1−xNbO3 perovskite thin films grown by pulsed laser deposition on R-plane sapphire for tunable microwave devices

K x Na 1− x NbO 3 thin films with x  = 0.5 and x  = 0.7 were deposited by pulsed laser deposition onto R-cut sapphire substrates to be suitable for microwave applications. The 500–800-nm-thick films present a preferential (100) orientation. The ω -scans show a weak mosaicity (full-width at half-maxi...

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Veröffentlicht in:	Journal of materials science 2018-09, Vol.53 (18), p.13042-13052
Hauptverfasser:	Aspe, B., Cissé, F., Castel, X., Demange, V., Députier, S., Ollivier, S., Bouquet, V., Joanny, L., Sauleau, R., Guilloux-Viry, M.
Format:	Artikel
Sprache:	eng
Schlagworte:	Characterization and Evaluation of Materials Chemistry and Materials Science Classical Mechanics Crystallography and Scattering Methods Electromagnetism Electronic Materials Engineering Sciences Materials Materials Science Micro and nanotechnologies Microelectronics Polymer Sciences Solid Mechanics
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