High quality nano-patterned thin films of the coordination compound {Fe(pyrazine)[Pt(CN)4]} deposited layer-by-layer
An optimised procedure was developed for the layer-by-layer deposition of the Hofmann clathrate-like coordination compound {Fe(pyrazine)[Pt(CN)4]} either as continuous or as nano-patterned thin films. Characterization of the thickness and topography of the thin films by atomic force microscopy (AFM)...
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Veröffentlicht in: | New journal of chemistry 2011-01, Vol.35 (10), p.2089-2094 |
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container_issue | 10 |
container_start_page | 2089 |
container_title | New journal of chemistry |
container_volume | 35 |
creator | Bartual-Murgui, Carlos Salmon, Lionel Akou, Amal Thibault, Christophe Molnár, Gábor Mahfoud, Tarik Sekkat, Zouheir Real, José Antonio Bousseksou, Azzedine |
description | An optimised procedure was developed for the layer-by-layer deposition of the Hofmann clathrate-like coordination compound {Fe(pyrazine)[Pt(CN)4]} either as continuous or as nano-patterned thin films. Characterization of the thickness and topography of the thin films by atomic force microscopy (AFM) and by surface plasmon resonance (SPR) spectroscopy, which also yields the layer's refractive index and losses, are reported. We found that the films are of good optical quality and the results of both AFM and SPR experiments are in good agreement with the theoretical predictions of the films thicknesses. |
doi_str_mv | 10.1039/c1nj20212j |
format | Article |
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Characterization of the thickness and topography of the thin films by atomic force microscopy (AFM) and by surface plasmon resonance (SPR) spectroscopy, which also yields the layer's refractive index and losses, are reported. 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source | Royal Society Of Chemistry Journals 2008-; Alma/SFX Local Collection |
subjects | Engineering Sciences Micro and nanotechnologies Microelectronics |
title | High quality nano-patterned thin films of the coordination compound {Fe(pyrazine)[Pt(CN)4]} deposited layer-by-layer |
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