Supercapacitor ageing at constant temperature and constant voltage and thermal shock
This paper presents supercapacitor ageing according to the voltage, the temperature and thermal shock tests. To investigate this effect, a test bench of accelerated supercapacitor calendar ageing was carried out. Experimental tests are realized at constant temperature when the supercapacitors are po...
Gespeichert in:
| Veröffentlicht in: | Microelectronics and reliability 2010-09, Vol.50 (9), p.1783-1788 |
|---|---|
| Hauptverfasser: | , , , , , , |
| Format: | Artikel |
| Sprache: | eng |
| Schlagworte: | |
| Online-Zugang: | Volltext |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| container_end_page | 1788 |
|---|---|
| container_issue | 9 |
| container_start_page | 1783 |
| container_title | Microelectronics and reliability |
| container_volume | 50 |
| creator | Gualous, H. Gallay, R. Alcicek, G. Tala-Ighil, B. Oukaour, A. Boudart, B. Makany, Ph |
| description | This paper presents supercapacitor ageing according to the voltage, the temperature and thermal shock tests. To investigate this effect, a test bench of accelerated supercapacitor calendar ageing was carried out. Experimental tests are realized at constant temperature when the supercapacitors are polarized at the maximum voltage. To quantify the supercapacitor ageing, the equivalent series resistance (ESR) and the equivalent capacitance (C) are measured using the DC and AC characterization. To lead to the determination of the supercapacitor lifetime, Arrhenius law, that describes the effect of temperature on the velocity of a chemical reaction, is considered. Finally, experimental results of supercapacitor thermal shock are presented. |
| doi_str_mv | 10.1016/j.microrel.2010.07.144 |
| format | Article |
| fullrecord | <record><control><sourceid>proquest_hal_p</sourceid><recordid>TN_cdi_hal_primary_oai_HAL_hal_01646990v1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><els_id>S0026271410004178</els_id><sourcerecordid>901676329</sourcerecordid><originalsourceid>FETCH-LOGICAL-c408t-a1a9d24f41b61859bd31c3d8829d6ded29abe53d33dba24b0c2adbffb4bf44b23</originalsourceid><addsrcrecordid>eNqFkE1P3DAQhq2qlbql_QtVLgj1kK2_SOIbCEGptBIHQOJmje0J6yWJF9u7Uv89ThfosaeR3nnmQw8h3xldMsqan5vl6G0MEYclpyWk7ZJJ-YEsWNfyWkn28JEsKOVNzVsmP5MvKW0opS1lbEHubndbjBa2YH0OsYJH9NNjBbmyYUoZplxlHAsCeRexgsn9a-zDkAv_N8xrjCMMVVoH-_SVfOphSPjttR6R-6vLu4vrenXz6_fF-aq2kna5BgbKcdlLZhrWnSrjBLPCdR1XrnHouAKDp8IJ4Qxwaajl4EzfG2l6KQ0XR-THYe8aBr2NfoT4Rwfw-vp8pees6JGNUnTPCntyYLcxPO8wZT36ZHEYYMKwS1oVtm0EV4VsDmSRmlLE_n01o3o2rjf6zbiejWva6mK8DB6_noBkYegjTNan92kuxCx9fvvswGFxs_cYdbIeJ4vOR7RZu-D_d-oFQ36b3Q</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>901676329</pqid></control><display><type>article</type><title>Supercapacitor ageing at constant temperature and constant voltage and thermal shock</title><source>Elsevier ScienceDirect Journals</source><creator>Gualous, H. ; Gallay, R. ; Alcicek, G. ; Tala-Ighil, B. ; Oukaour, A. ; Boudart, B. ; Makany, Ph</creator><creatorcontrib>Gualous, H. ; Gallay, R. ; Alcicek, G. ; Tala-Ighil, B. ; Oukaour, A. ; Boudart, B. ; Makany, Ph</creatorcontrib><description>This paper presents supercapacitor ageing according to the voltage, the temperature and thermal shock tests. To investigate this effect, a test bench of accelerated supercapacitor calendar ageing was carried out. Experimental tests are realized at constant temperature when the supercapacitors are polarized at the maximum voltage. To quantify the supercapacitor ageing, the equivalent series resistance (ESR) and the equivalent capacitance (C) are measured using the DC and AC characterization. To lead to the determination of the supercapacitor lifetime, Arrhenius law, that describes the effect of temperature on the velocity of a chemical reaction, is considered. Finally, experimental results of supercapacitor thermal shock are presented.</description><identifier>ISSN: 0026-2714</identifier><identifier>EISSN: 1872-941X</identifier><identifier>DOI: 10.1016/j.microrel.2010.07.144</identifier><identifier>CODEN: MCRLAS</identifier><language>eng</language><publisher>Kidlington: Elsevier Ltd</publisher><subject>Aging ; Applied sciences ; Capacitors ; Chemical reactions ; Dielectric, amorphous and glass solid devices ; Electric potential ; Electric power ; Electronics ; Engineering Sciences ; Equivalence ; Exact sciences and technology ; Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices ; Supercapacitors ; Thermal shock ; Voltage</subject><ispartof>Microelectronics and reliability, 2010-09, Vol.50 (9), p.1783-1788</ispartof><rights>2010 Elsevier Ltd</rights><rights>2015 INIST-CNRS</rights><rights>Distributed under a Creative Commons Attribution 4.0 International License</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c408t-a1a9d24f41b61859bd31c3d8829d6ded29abe53d33dba24b0c2adbffb4bf44b23</citedby><cites>FETCH-LOGICAL-c408t-a1a9d24f41b61859bd31c3d8829d6ded29abe53d33dba24b0c2adbffb4bf44b23</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://www.sciencedirect.com/science/article/pii/S0026271410004178$$EHTML$$P50$$Gelsevier$$H</linktohtml><link.rule.ids>230,309,310,314,776,780,785,786,881,3537,23909,23910,25118,27901,27902,65306</link.rule.ids><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=23307012$$DView record in Pascal Francis$$Hfree_for_read</backlink><backlink>$$Uhttps://hal.science/hal-01646990$$DView record in HAL$$Hfree_for_read</backlink></links><search><creatorcontrib>Gualous, H.</creatorcontrib><creatorcontrib>Gallay, R.</creatorcontrib><creatorcontrib>Alcicek, G.</creatorcontrib><creatorcontrib>Tala-Ighil, B.</creatorcontrib><creatorcontrib>Oukaour, A.</creatorcontrib><creatorcontrib>Boudart, B.</creatorcontrib><creatorcontrib>Makany, Ph</creatorcontrib><title>Supercapacitor ageing at constant temperature and constant voltage and thermal shock</title><title>Microelectronics and reliability</title><description>This paper presents supercapacitor ageing according to the voltage, the temperature and thermal shock tests. To investigate this effect, a test bench of accelerated supercapacitor calendar ageing was carried out. Experimental tests are realized at constant temperature when the supercapacitors are polarized at the maximum voltage. To quantify the supercapacitor ageing, the equivalent series resistance (ESR) and the equivalent capacitance (C) are measured using the DC and AC characterization. To lead to the determination of the supercapacitor lifetime, Arrhenius law, that describes the effect of temperature on the velocity of a chemical reaction, is considered. Finally, experimental results of supercapacitor thermal shock are presented.</description><subject>Aging</subject><subject>Applied sciences</subject><subject>Capacitors</subject><subject>Chemical reactions</subject><subject>Dielectric, amorphous and glass solid devices</subject><subject>Electric potential</subject><subject>Electric power</subject><subject>Electronics</subject><subject>Engineering Sciences</subject><subject>Equivalence</subject><subject>Exact sciences and technology</subject><subject>Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices</subject><subject>Supercapacitors</subject><subject>Thermal shock</subject><subject>Voltage</subject><issn>0026-2714</issn><issn>1872-941X</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2010</creationdate><recordtype>article</recordtype><recordid>eNqFkE1P3DAQhq2qlbql_QtVLgj1kK2_SOIbCEGptBIHQOJmje0J6yWJF9u7Uv89ThfosaeR3nnmQw8h3xldMsqan5vl6G0MEYclpyWk7ZJJ-YEsWNfyWkn28JEsKOVNzVsmP5MvKW0opS1lbEHubndbjBa2YH0OsYJH9NNjBbmyYUoZplxlHAsCeRexgsn9a-zDkAv_N8xrjCMMVVoH-_SVfOphSPjttR6R-6vLu4vrenXz6_fF-aq2kna5BgbKcdlLZhrWnSrjBLPCdR1XrnHouAKDp8IJ4Qxwaajl4EzfG2l6KQ0XR-THYe8aBr2NfoT4Rwfw-vp8pees6JGNUnTPCntyYLcxPO8wZT36ZHEYYMKwS1oVtm0EV4VsDmSRmlLE_n01o3o2rjf6zbiejWva6mK8DB6_noBkYegjTNan92kuxCx9fvvswGFxs_cYdbIeJ4vOR7RZu-D_d-oFQ36b3Q</recordid><startdate>20100901</startdate><enddate>20100901</enddate><creator>Gualous, H.</creator><creator>Gallay, R.</creator><creator>Alcicek, G.</creator><creator>Tala-Ighil, B.</creator><creator>Oukaour, A.</creator><creator>Boudart, B.</creator><creator>Makany, Ph</creator><general>Elsevier Ltd</general><general>Elsevier</general><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>8FD</scope><scope>L7M</scope><scope>1XC</scope></search><sort><creationdate>20100901</creationdate><title>Supercapacitor ageing at constant temperature and constant voltage and thermal shock</title><author>Gualous, H. ; Gallay, R. ; Alcicek, G. ; Tala-Ighil, B. ; Oukaour, A. ; Boudart, B. ; Makany, Ph</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c408t-a1a9d24f41b61859bd31c3d8829d6ded29abe53d33dba24b0c2adbffb4bf44b23</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2010</creationdate><topic>Aging</topic><topic>Applied sciences</topic><topic>Capacitors</topic><topic>Chemical reactions</topic><topic>Dielectric, amorphous and glass solid devices</topic><topic>Electric potential</topic><topic>Electric power</topic><topic>Electronics</topic><topic>Engineering Sciences</topic><topic>Equivalence</topic><topic>Exact sciences and technology</topic><topic>Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices</topic><topic>Supercapacitors</topic><topic>Thermal shock</topic><topic>Voltage</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Gualous, H.</creatorcontrib><creatorcontrib>Gallay, R.</creatorcontrib><creatorcontrib>Alcicek, G.</creatorcontrib><creatorcontrib>Tala-Ighil, B.</creatorcontrib><creatorcontrib>Oukaour, A.</creatorcontrib><creatorcontrib>Boudart, B.</creatorcontrib><creatorcontrib>Makany, Ph</creatorcontrib><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>Hyper Article en Ligne (HAL)</collection><jtitle>Microelectronics and reliability</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Gualous, H.</au><au>Gallay, R.</au><au>Alcicek, G.</au><au>Tala-Ighil, B.</au><au>Oukaour, A.</au><au>Boudart, B.</au><au>Makany, Ph</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Supercapacitor ageing at constant temperature and constant voltage and thermal shock</atitle><jtitle>Microelectronics and reliability</jtitle><date>2010-09-01</date><risdate>2010</risdate><volume>50</volume><issue>9</issue><spage>1783</spage><epage>1788</epage><pages>1783-1788</pages><issn>0026-2714</issn><eissn>1872-941X</eissn><coden>MCRLAS</coden><abstract>This paper presents supercapacitor ageing according to the voltage, the temperature and thermal shock tests. To investigate this effect, a test bench of accelerated supercapacitor calendar ageing was carried out. Experimental tests are realized at constant temperature when the supercapacitors are polarized at the maximum voltage. To quantify the supercapacitor ageing, the equivalent series resistance (ESR) and the equivalent capacitance (C) are measured using the DC and AC characterization. To lead to the determination of the supercapacitor lifetime, Arrhenius law, that describes the effect of temperature on the velocity of a chemical reaction, is considered. Finally, experimental results of supercapacitor thermal shock are presented.</abstract><cop>Kidlington</cop><pub>Elsevier Ltd</pub><doi>10.1016/j.microrel.2010.07.144</doi><tpages>6</tpages></addata></record> |
| fulltext | fulltext |
| identifier | ISSN: 0026-2714 |
| ispartof | Microelectronics and reliability, 2010-09, Vol.50 (9), p.1783-1788 |
| issn | 0026-2714 1872-941X |
| language | eng |
| recordid | cdi_hal_primary_oai_HAL_hal_01646990v1 |
| source | Elsevier ScienceDirect Journals |
| subjects | Aging Applied sciences Capacitors Chemical reactions Dielectric, amorphous and glass solid devices Electric potential Electric power Electronics Engineering Sciences Equivalence Exact sciences and technology Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices Supercapacitors Thermal shock Voltage |
| title | Supercapacitor ageing at constant temperature and constant voltage and thermal shock |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-09T15%3A51%3A28IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_hal_p&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Supercapacitor%20ageing%20at%20constant%20temperature%20and%20constant%20voltage%20and%20thermal%20shock&rft.jtitle=Microelectronics%20and%20reliability&rft.au=Gualous,%20H.&rft.date=2010-09-01&rft.volume=50&rft.issue=9&rft.spage=1783&rft.epage=1788&rft.pages=1783-1788&rft.issn=0026-2714&rft.eissn=1872-941X&rft.coden=MCRLAS&rft_id=info:doi/10.1016/j.microrel.2010.07.144&rft_dat=%3Cproquest_hal_p%3E901676329%3C/proquest_hal_p%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=901676329&rft_id=info:pmid/&rft_els_id=S0026271410004178&rfr_iscdi=true |