Dielectric thin films for maximized absorption with standard quality black surfaces

Dielectric thin films for maximized absorption with standard quality black surfaces

Optical coatings deposited on rough black surfaces permit one to reduce scattering and increase absorption with broadband properties. To optimize the optogeometrical parameters (thickness, refractive index) of the coating, to obtain the best performances, it is necessary to know the refractive index...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:Applied Optics 1998-01, Vol.37 (1), p.103-105
Hauptverfasser: Giovannini, H, Amra, C
Format: Artikel
Sprache:eng
Schlagworte:
Electromagnetism
Engineering Sciences
Optics
Photonic
Physics
Online-Zugang:Volltext
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page 105
container_issue 1
container_start_page 103
container_title Applied Optics
container_volume 37
creator Giovannini, H
Amra, C
description Optical coatings deposited on rough black surfaces permit one to reduce scattering and increase absorption with broadband properties. To optimize the optogeometrical parameters (thickness, refractive index) of the coating, to obtain the best performances, it is necessary to know the refractive index of the bare surface. For this purpose we use both theoretical and experimental approaches. It is shown that with our method the total amount of scattered light from a common standard black surface can be reduced by a factor of 10. An absorption of greater than 99.5% is obtained.
doi_str_mv 10.1364/AO.37.000103
format Article
fullrecord <record><control><sourceid>proquest_hal_p</sourceid><recordid>TN_cdi_hal_primary_oai_HAL_hal_01324172v1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>734187247</sourcerecordid><originalsourceid>FETCH-LOGICAL-c322t-f9eb0b7d646d71332a547409735f0468b8b2b2f0d8c6720abab87dc8b434debc3</originalsourceid><addsrcrecordid>eNpFkEtLAzEURoMoVqs715KdCE7NayaZ5VAfFQpdqOAu5DU0Oo82mVHrr7dliq7ux-VwFgeAC4wmmGbstlhMKJ8ghDCiB-AEpzRPWErI4W6neYKJeBuB0xjfEaIpy_kxGGFBMpFm2Ql4vvOucqYL3sBu6RtY-qqOsGwDrNW3r_2Ps1Dp2IZV59sGfvluCWOnGquCheteVb7bQF0p8wFjH0plXDwDR6Wqojvf3zF4fbh_mc6S-eLxaVrME0MJ6ZIydxppbjOWWY4pJSplnKGc07RELBNaaKJJiawwGSdIaaUFt0ZoRpl12tAxuB68S1XJVfC1ChvZKi9nxVzufghTwjAnn3jLXg3sKrTr3sVO1j4aV1WqcW0fJacMC04Y35I3A2lCG2Nw5Z8aI7krLouFpFwOxbf45V7c69rZf3ifmP4Cpb57XQ</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>734187247</pqid></control><display><type>article</type><title>Dielectric thin films for maximized absorption with standard quality black surfaces</title><source>Alma/SFX Local Collection</source><source>Optica Publishing Group Journals</source><creator>Giovannini, H ; Amra, C</creator><creatorcontrib>Giovannini, H ; Amra, C</creatorcontrib><description>Optical coatings deposited on rough black surfaces permit one to reduce scattering and increase absorption with broadband properties. To optimize the optogeometrical parameters (thickness, refractive index) of the coating, to obtain the best performances, it is necessary to know the refractive index of the bare surface. For this purpose we use both theoretical and experimental approaches. It is shown that with our method the total amount of scattered light from a common standard black surface can be reduced by a factor of 10. An absorption of greater than 99.5% is obtained.</description><identifier>ISSN: 1559-128X</identifier><identifier>ISSN: 0003-6935</identifier><identifier>EISSN: 1539-4522</identifier><identifier>EISSN: 2155-3165</identifier><identifier>DOI: 10.1364/AO.37.000103</identifier><identifier>PMID: 18268566</identifier><language>eng</language><publisher>United States: Optical Society of America</publisher><subject>Electromagnetism ; Engineering Sciences ; Optics ; Photonic ; Physics</subject><ispartof>Applied Optics, 1998-01, Vol.37 (1), p.103-105</ispartof><rights>Distributed under a Creative Commons Attribution 4.0 International License</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c322t-f9eb0b7d646d71332a547409735f0468b8b2b2f0d8c6720abab87dc8b434debc3</citedby><cites>FETCH-LOGICAL-c322t-f9eb0b7d646d71332a547409735f0468b8b2b2f0d8c6720abab87dc8b434debc3</cites><orcidid>0000-0002-4618-5931</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>230,314,780,784,885,4024,27923,27924,27925</link.rule.ids><backlink>$$Uhttps://www.ncbi.nlm.nih.gov/pubmed/18268566$$D View this record in MEDLINE/PubMed$$Hfree_for_read</backlink><backlink>$$Uhttps://hal.science/hal-01324172$$DView record in HAL$$Hfree_for_read</backlink></links><search><creatorcontrib>Giovannini, H</creatorcontrib><creatorcontrib>Amra, C</creatorcontrib><title>Dielectric thin films for maximized absorption with standard quality black surfaces</title><title>Applied Optics</title><addtitle>Appl Opt</addtitle><description>Optical coatings deposited on rough black surfaces permit one to reduce scattering and increase absorption with broadband properties. To optimize the optogeometrical parameters (thickness, refractive index) of the coating, to obtain the best performances, it is necessary to know the refractive index of the bare surface. For this purpose we use both theoretical and experimental approaches. It is shown that with our method the total amount of scattered light from a common standard black surface can be reduced by a factor of 10. An absorption of greater than 99.5% is obtained.</description><subject>Electromagnetism</subject><subject>Engineering Sciences</subject><subject>Optics</subject><subject>Photonic</subject><subject>Physics</subject><issn>1559-128X</issn><issn>0003-6935</issn><issn>1539-4522</issn><issn>2155-3165</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1998</creationdate><recordtype>article</recordtype><recordid>eNpFkEtLAzEURoMoVqs715KdCE7NayaZ5VAfFQpdqOAu5DU0Oo82mVHrr7dliq7ux-VwFgeAC4wmmGbstlhMKJ8ghDCiB-AEpzRPWErI4W6neYKJeBuB0xjfEaIpy_kxGGFBMpFm2Ql4vvOucqYL3sBu6RtY-qqOsGwDrNW3r_2Ps1Dp2IZV59sGfvluCWOnGquCheteVb7bQF0p8wFjH0plXDwDR6Wqojvf3zF4fbh_mc6S-eLxaVrME0MJ6ZIydxppbjOWWY4pJSplnKGc07RELBNaaKJJiawwGSdIaaUFt0ZoRpl12tAxuB68S1XJVfC1ChvZKi9nxVzufghTwjAnn3jLXg3sKrTr3sVO1j4aV1WqcW0fJacMC04Y35I3A2lCG2Nw5Z8aI7krLouFpFwOxbf45V7c69rZf3ifmP4Cpb57XQ</recordid><startdate>19980101</startdate><enddate>19980101</enddate><creator>Giovannini, H</creator><creator>Amra, C</creator><general>Optical Society of America</general><scope>NPM</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7X8</scope><scope>1XC</scope><orcidid>https://orcid.org/0000-0002-4618-5931</orcidid></search><sort><creationdate>19980101</creationdate><title>Dielectric thin films for maximized absorption with standard quality black surfaces</title><author>Giovannini, H ; Amra, C</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c322t-f9eb0b7d646d71332a547409735f0468b8b2b2f0d8c6720abab87dc8b434debc3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1998</creationdate><topic>Electromagnetism</topic><topic>Engineering Sciences</topic><topic>Optics</topic><topic>Photonic</topic><topic>Physics</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Giovannini, H</creatorcontrib><creatorcontrib>Amra, C</creatorcontrib><collection>PubMed</collection><collection>CrossRef</collection><collection>MEDLINE - Academic</collection><collection>Hyper Article en Ligne (HAL)</collection><jtitle>Applied Optics</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Giovannini, H</au><au>Amra, C</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Dielectric thin films for maximized absorption with standard quality black surfaces</atitle><jtitle>Applied Optics</jtitle><addtitle>Appl Opt</addtitle><date>1998-01-01</date><risdate>1998</risdate><volume>37</volume><issue>1</issue><spage>103</spage><epage>105</epage><pages>103-105</pages><issn>1559-128X</issn><issn>0003-6935</issn><eissn>1539-4522</eissn><eissn>2155-3165</eissn><abstract>Optical coatings deposited on rough black surfaces permit one to reduce scattering and increase absorption with broadband properties. To optimize the optogeometrical parameters (thickness, refractive index) of the coating, to obtain the best performances, it is necessary to know the refractive index of the bare surface. For this purpose we use both theoretical and experimental approaches. It is shown that with our method the total amount of scattered light from a common standard black surface can be reduced by a factor of 10. An absorption of greater than 99.5% is obtained.</abstract><cop>United States</cop><pub>Optical Society of America</pub><pmid>18268566</pmid><doi>10.1364/AO.37.000103</doi><tpages>3</tpages><orcidid>https://orcid.org/0000-0002-4618-5931</orcidid></addata></record>
fulltext fulltext
identifier ISSN: 1559-128X
ispartof Applied Optics, 1998-01, Vol.37 (1), p.103-105
issn 1559-128X
0003-6935
1539-4522
2155-3165
language eng
recordid cdi_hal_primary_oai_HAL_hal_01324172v1
source Alma/SFX Local Collection; Optica Publishing Group Journals
subjects Electromagnetism
Engineering Sciences
Optics
Photonic
Physics
title Dielectric thin films for maximized absorption with standard quality black surfaces
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-04T00%3A04%3A05IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_hal_p&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Dielectric%20thin%20films%20for%20maximized%20absorption%20with%20standard%20quality%20black%20surfaces&rft.jtitle=Applied%20Optics&rft.au=Giovannini,%20H&rft.date=1998-01-01&rft.volume=37&rft.issue=1&rft.spage=103&rft.epage=105&rft.pages=103-105&rft.issn=1559-128X&rft.eissn=1539-4522&rft_id=info:doi/10.1364/AO.37.000103&rft_dat=%3Cproquest_hal_p%3E734187247%3C/proquest_hal_p%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=734187247&rft_id=info:pmid/18268566&rfr_iscdi=true