Raman spectroscopy of Si nanoparticles embedded in silica films
The formation of crystalline silicon nanoparticles was investigated by means of Raman spectroscopy. SiOx (x = 1 and x = 1.5) films deposited by electron-gun evaporation onto silica substrates were submitted to post-deposition thermal treatments at 1000 and 1100 °C for various times. From lineshape a...
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| Veröffentlicht in: | European physical journal. Applied physics 2008-10, Vol.44 (1), p.51-57 |
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| container_title | European physical journal. Applied physics |
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| creator | Stenger, I. Gallas, B. Jusserand, B. Chenot, S. Fisson, S. Rivory, J. |
| description | The formation of crystalline silicon nanoparticles was investigated by means of Raman spectroscopy. SiOx (x = 1 and x = 1.5) films deposited by electron-gun evaporation onto silica substrates were submitted to post-deposition thermal treatments at 1000 and 1100 °C for various times. From lineshape analysis of the Raman band, it appeared that the crystalline volume fraction never excessed 30% for annealing at 1000 °C, while the mean diameter remained almost constant. Complete crystallisation was achieved after annealing at 1100 °C, accompanied by an increase of the nanoparticle size. Mean diameters of the nanoparticles obtained from Raman spectra analysis along the two main confinement models, Richter et al., Campbell, Fauchet model and bond-polarizability model, were discussed and compared to values deduced from transmission electron microscopy measurements. |
| doi_str_mv | 10.1051/epjap:2008140 |
| format | Article |
| fullrecord | <record><control><sourceid>proquest_hal_p</sourceid><recordid>TN_cdi_hal_primary_oai_HAL_hal_01281541v1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>35625675</sourcerecordid><originalsourceid>FETCH-LOGICAL-c370t-e69e44b57c7f435c625dc5987506a43c3c728dbefdb005cbe135d5581d00d2573</originalsourceid><addsrcrecordid>eNo9kE1PwzAMhiMEEmNw5N4LSBwKTtM0HRc0DcZAQ0x8HqM0SUVGv0g6xP492Vb1ZMt-_Np-ETrFcImB4ivdLEVzHQGkOIY9NMBRmoQAFPb7PI4O0ZFzSwDASUoH6OZFlKIKXKNla2sn62Yd1HnwaoJKVHUjbGtkoV2gy0wrpVVgPGwKI0WQm6J0x-ggF4XTJ10covfp3dtkFs6f7x8m43koCYM21MlIx3FGmWR5TKhMIqokHaWMQiJiIolkUaoynavMHywzjQlVlKZYAaiIMjJEFzvdL1HwxppS2DWvheGz8ZxvauA_xDTGv9iz5zu2sfXPSruWl8ZJXRSi0vXKcUL9-oRRD4Y7UPrXndV5r4yBbyzlW0t5Z6nnzzph4aQocisqaVw_FEHCRmzLdbrGtfqv7wv7zRNGGOUpfHKWPn4sbp-mfEH-AStzhKE</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>35625675</pqid></control><display><type>article</type><title>Raman spectroscopy of Si nanoparticles embedded in silica films</title><source>Bacon EDP Sciences France Licence nationale-ISTEX-PS-Journals-PFISTEX</source><source>EDP Sciences</source><creator>Stenger, I. ; Gallas, B. ; Jusserand, B. ; Chenot, S. ; Fisson, S. ; Rivory, J.</creator><creatorcontrib>Stenger, I. ; Gallas, B. ; Jusserand, B. ; Chenot, S. ; Fisson, S. ; Rivory, J.</creatorcontrib><description>The formation of crystalline silicon nanoparticles was investigated by means of Raman spectroscopy. SiOx (x = 1 and x = 1.5) films deposited by electron-gun evaporation onto silica substrates were submitted to post-deposition thermal treatments at 1000 and 1100 °C for various times. From lineshape analysis of the Raman band, it appeared that the crystalline volume fraction never excessed 30% for annealing at 1000 °C, while the mean diameter remained almost constant. Complete crystallisation was achieved after annealing at 1100 °C, accompanied by an increase of the nanoparticle size. Mean diameters of the nanoparticles obtained from Raman spectra analysis along the two main confinement models, Richter et al., Campbell, Fauchet model and bond-polarizability model, were discussed and compared to values deduced from transmission electron microscopy measurements.</description><identifier>ISSN: 1286-0042</identifier><identifier>EISSN: 1286-0050</identifier><identifier>DOI: 10.1051/epjap:2008140</identifier><language>eng</language><publisher>Les Ulis: EDP Sciences</publisher><subject>61.46.Hk ; 63.22.Kn ; 78.30.Am ; Condensed Matter ; Condensed matter: electronic structure, electrical, magnetic, and optical properties ; Condensed matter: structure, mechanical and thermal properties ; Elemental semiconductors and insulators ; Exact sciences and technology ; Infrared and raman spectra and scattering ; Lattice dynamics ; Nanocrystals and nanoparticles ; Nanoscale materials: clusters, nanoparticles, nanotubes, and nanocrystals ; Optical properties and condensed-matter spectroscopy and other interactions of matter with particles and radiation ; Optical properties of low-dimensional, mesoscopic, and nanoscale materials and structures ; Phonons in low-dimensional structures and small particles ; Physics ; Structure of solids and liquids; crystallography</subject><ispartof>European physical journal. Applied physics, 2008-10, Vol.44 (1), p.51-57</ispartof><rights>2008 INIST-CNRS</rights><rights>Distributed under a Creative Commons Attribution 4.0 International License</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c370t-e69e44b57c7f435c625dc5987506a43c3c728dbefdb005cbe135d5581d00d2573</citedby><cites>FETCH-LOGICAL-c370t-e69e44b57c7f435c625dc5987506a43c3c728dbefdb005cbe135d5581d00d2573</cites><orcidid>0000-0002-8917-5776</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>230,314,780,784,885,3725,27923,27924</link.rule.ids><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=20679740$$DView record in Pascal Francis$$Hfree_for_read</backlink><backlink>$$Uhttps://hal.science/hal-01281541$$DView record in HAL$$Hfree_for_read</backlink></links><search><creatorcontrib>Stenger, I.</creatorcontrib><creatorcontrib>Gallas, B.</creatorcontrib><creatorcontrib>Jusserand, B.</creatorcontrib><creatorcontrib>Chenot, S.</creatorcontrib><creatorcontrib>Fisson, S.</creatorcontrib><creatorcontrib>Rivory, J.</creatorcontrib><title>Raman spectroscopy of Si nanoparticles embedded in silica films</title><title>European physical journal. Applied physics</title><description>The formation of crystalline silicon nanoparticles was investigated by means of Raman spectroscopy. SiOx (x = 1 and x = 1.5) films deposited by electron-gun evaporation onto silica substrates were submitted to post-deposition thermal treatments at 1000 and 1100 °C for various times. From lineshape analysis of the Raman band, it appeared that the crystalline volume fraction never excessed 30% for annealing at 1000 °C, while the mean diameter remained almost constant. Complete crystallisation was achieved after annealing at 1100 °C, accompanied by an increase of the nanoparticle size. Mean diameters of the nanoparticles obtained from Raman spectra analysis along the two main confinement models, Richter et al., Campbell, Fauchet model and bond-polarizability model, were discussed and compared to values deduced from transmission electron microscopy measurements.</description><subject>61.46.Hk</subject><subject>63.22.Kn</subject><subject>78.30.Am</subject><subject>Condensed Matter</subject><subject>Condensed matter: electronic structure, electrical, magnetic, and optical properties</subject><subject>Condensed matter: structure, mechanical and thermal properties</subject><subject>Elemental semiconductors and insulators</subject><subject>Exact sciences and technology</subject><subject>Infrared and raman spectra and scattering</subject><subject>Lattice dynamics</subject><subject>Nanocrystals and nanoparticles</subject><subject>Nanoscale materials: clusters, nanoparticles, nanotubes, and nanocrystals</subject><subject>Optical properties and condensed-matter spectroscopy and other interactions of matter with particles and radiation</subject><subject>Optical properties of low-dimensional, mesoscopic, and nanoscale materials and structures</subject><subject>Phonons in low-dimensional structures and small particles</subject><subject>Physics</subject><subject>Structure of solids and liquids; crystallography</subject><issn>1286-0042</issn><issn>1286-0050</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2008</creationdate><recordtype>article</recordtype><recordid>eNo9kE1PwzAMhiMEEmNw5N4LSBwKTtM0HRc0DcZAQ0x8HqM0SUVGv0g6xP492Vb1ZMt-_Np-ETrFcImB4ivdLEVzHQGkOIY9NMBRmoQAFPb7PI4O0ZFzSwDASUoH6OZFlKIKXKNla2sn62Yd1HnwaoJKVHUjbGtkoV2gy0wrpVVgPGwKI0WQm6J0x-ggF4XTJ10covfp3dtkFs6f7x8m43koCYM21MlIx3FGmWR5TKhMIqokHaWMQiJiIolkUaoynavMHywzjQlVlKZYAaiIMjJEFzvdL1HwxppS2DWvheGz8ZxvauA_xDTGv9iz5zu2sfXPSruWl8ZJXRSi0vXKcUL9-oRRD4Y7UPrXndV5r4yBbyzlW0t5Z6nnzzph4aQocisqaVw_FEHCRmzLdbrGtfqv7wv7zRNGGOUpfHKWPn4sbp-mfEH-AStzhKE</recordid><startdate>20081001</startdate><enddate>20081001</enddate><creator>Stenger, I.</creator><creator>Gallas, B.</creator><creator>Jusserand, B.</creator><creator>Chenot, S.</creator><creator>Fisson, S.</creator><creator>Rivory, J.</creator><general>EDP Sciences</general><general>Springer</general><scope>BSCLL</scope><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7U5</scope><scope>8FD</scope><scope>L7M</scope><scope>1XC</scope><orcidid>https://orcid.org/0000-0002-8917-5776</orcidid></search><sort><creationdate>20081001</creationdate><title>Raman spectroscopy of Si nanoparticles embedded in silica films</title><author>Stenger, I. ; Gallas, B. ; Jusserand, B. ; Chenot, S. ; Fisson, S. ; Rivory, J.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c370t-e69e44b57c7f435c625dc5987506a43c3c728dbefdb005cbe135d5581d00d2573</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2008</creationdate><topic>61.46.Hk</topic><topic>63.22.Kn</topic><topic>78.30.Am</topic><topic>Condensed Matter</topic><topic>Condensed matter: electronic structure, electrical, magnetic, and optical properties</topic><topic>Condensed matter: structure, mechanical and thermal properties</topic><topic>Elemental semiconductors and insulators</topic><topic>Exact sciences and technology</topic><topic>Infrared and raman spectra and scattering</topic><topic>Lattice dynamics</topic><topic>Nanocrystals and nanoparticles</topic><topic>Nanoscale materials: clusters, nanoparticles, nanotubes, and nanocrystals</topic><topic>Optical properties and condensed-matter spectroscopy and other interactions of matter with particles and radiation</topic><topic>Optical properties of low-dimensional, mesoscopic, and nanoscale materials and structures</topic><topic>Phonons in low-dimensional structures and small particles</topic><topic>Physics</topic><topic>Structure of solids and liquids; crystallography</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Stenger, I.</creatorcontrib><creatorcontrib>Gallas, B.</creatorcontrib><creatorcontrib>Jusserand, B.</creatorcontrib><creatorcontrib>Chenot, S.</creatorcontrib><creatorcontrib>Fisson, S.</creatorcontrib><creatorcontrib>Rivory, J.</creatorcontrib><collection>Istex</collection><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>Hyper Article en Ligne (HAL)</collection><jtitle>European physical journal. Applied physics</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Stenger, I.</au><au>Gallas, B.</au><au>Jusserand, B.</au><au>Chenot, S.</au><au>Fisson, S.</au><au>Rivory, J.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Raman spectroscopy of Si nanoparticles embedded in silica films</atitle><jtitle>European physical journal. Applied physics</jtitle><date>2008-10-01</date><risdate>2008</risdate><volume>44</volume><issue>1</issue><spage>51</spage><epage>57</epage><pages>51-57</pages><issn>1286-0042</issn><eissn>1286-0050</eissn><abstract>The formation of crystalline silicon nanoparticles was investigated by means of Raman spectroscopy. SiOx (x = 1 and x = 1.5) films deposited by electron-gun evaporation onto silica substrates were submitted to post-deposition thermal treatments at 1000 and 1100 °C for various times. From lineshape analysis of the Raman band, it appeared that the crystalline volume fraction never excessed 30% for annealing at 1000 °C, while the mean diameter remained almost constant. Complete crystallisation was achieved after annealing at 1100 °C, accompanied by an increase of the nanoparticle size. Mean diameters of the nanoparticles obtained from Raman spectra analysis along the two main confinement models, Richter et al., Campbell, Fauchet model and bond-polarizability model, were discussed and compared to values deduced from transmission electron microscopy measurements.</abstract><cop>Les Ulis</cop><cop>Berlin</cop><pub>EDP Sciences</pub><doi>10.1051/epjap:2008140</doi><tpages>7</tpages><orcidid>https://orcid.org/0000-0002-8917-5776</orcidid></addata></record> |
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| subjects | 61.46.Hk 63.22.Kn 78.30.Am Condensed Matter Condensed matter: electronic structure, electrical, magnetic, and optical properties Condensed matter: structure, mechanical and thermal properties Elemental semiconductors and insulators Exact sciences and technology Infrared and raman spectra and scattering Lattice dynamics Nanocrystals and nanoparticles Nanoscale materials: clusters, nanoparticles, nanotubes, and nanocrystals Optical properties and condensed-matter spectroscopy and other interactions of matter with particles and radiation Optical properties of low-dimensional, mesoscopic, and nanoscale materials and structures Phonons in low-dimensional structures and small particles Physics Structure of solids and liquids crystallography |
| title | Raman spectroscopy of Si nanoparticles embedded in silica films |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-12T09%3A03%3A37IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_hal_p&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Raman%20spectroscopy%20of%20Si%20nanoparticles%20embedded%20in%20silica%20films&rft.jtitle=European%20physical%20journal.%20Applied%20physics&rft.au=Stenger,%20I.&rft.date=2008-10-01&rft.volume=44&rft.issue=1&rft.spage=51&rft.epage=57&rft.pages=51-57&rft.issn=1286-0042&rft.eissn=1286-0050&rft_id=info:doi/10.1051/epjap:2008140&rft_dat=%3Cproquest_hal_p%3E35625675%3C/proquest_hal_p%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=35625675&rft_id=info:pmid/&rfr_iscdi=true |