The 2 root 3 x 2 root 3R30 surface reconstruction of alkali/Si(111):B semiconducting surfaces

The surface structure of alkali doped Si(111): B ultra-thin films has been studied by low-energy electron diffraction (LEED), X-ray photoemission spectroscopy (XPS) and scanning tunneling microscopy (STM). A comparative study of K/Si(111)-3 x 1 and K/Si(111):B-2 root 3 x 2 root 3R30 interfaces allow...

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Veröffentlicht in:	Applied surface science 2013-02, Vol.267, p.35-39
Hauptverfasser:	Tournier-Colletta, Cédric, Chaput, Laurent, Tejeda, Antonio, Cardenas, Luis A., Kierren, Bertrand, Malterre, Daniel, Fagot-Révurat, Yannick, Le Fèvre, Patrick, Bertran, François, Taleb-Ibrahimi, Amina
Format:	Artikel
Sprache:	eng
Schlagworte:	Condensed Matter Materials Science Physics
Online-Zugang:	Volltext
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