Core-shell InGaN/GaN nanowire light emitting diodes analyzed by electron beam induced current microscopy and cathodoluminescence mapping

We report on the electron beam induced current (EBIC) microscopy and cathodoluminescence (CL) characterization correlated with compositional analysis of light emitting diodes based on core/shell InGaN/GaN nanowire arrays. The EBIC mapping of cleaved fully operational devices allows to probe the elec...

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Veröffentlicht in:	Nanoscale 2015-07, Vol.7 (27), p.11692-11701
Hauptverfasser:	Tchernycheva, M, Neplokh, V, Zhang, H, Lavenus, P, Rigutti, L, Bayle, F, Julien, F H, Babichev, A, Jacopin, G, Largeau, L, Ciechonski, R, Vescovi, G, Kryliouk, O
Format:	Artikel
Sprache:	eng
Schlagworte:	Cathodoluminescence Condensed Matter Electron beam induced current Engineering Sciences Gallium nitrides Indium gallium nitrides Light-emitting diodes Mapping Materials Science Micro and nanotechnologies Microelectronics Microscopy Nanowires Optics Photonic Physics
Online-Zugang:	Volltext
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