Characterisation of charging kinetics of dielectrics under continuous electron irradiation through real time electron emission collecting method

Dielectric materials used for spacecraft applications are often characterised under electron irradiation in order to study their physical and electrical mechanisms. For surface potential measurement, a small removable flat device based on the secondary electron spectrometer method has been developed...

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Veröffentlicht in:	Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms Beam interactions with materials and atoms, 2015-04, Vol.349, p.147-154
Hauptverfasser:	Guerch, Kévin, Paulmier, Thierry, Guillemet-Fritsch, Sophie, Lenormand, Pascal
Format:	Artikel
Sprache:	eng
Schlagworte:	Assessments Charging Devices Dielectric Dielectrics Electron emission Electron irradiation Engineering Sciences Ionisation effect Materials Mathematical models Real time Spacecraft Surface potential
Online-Zugang:	Volltext
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