Why do atomic force microscopy force curves still exhibit jump to contact ?
The force between two particles as a function of distance is one of the most fundamental curves in physics. Here, we describe how the force feedback microscope can routinely measure the tip-surface interaction in the entire range of distances with a sensitivity of 1 pN and in different media. The me...
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Veröffentlicht in: | Applied physics letters 2012-11, Vol.101 (20) |
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creator | Rodrigues, Mario S. Costa, Luca Chevrier, Joël Comin, Fabio |
description | The force between two particles as a function of distance is one of the most fundamental curves in physics. Here, we describe how the force feedback microscope can routinely measure the tip-surface interaction in the entire range of distances with a sensitivity of 1 pN and in different media. The method allows to measure simultaneously the force, force gradient, and damping from solely the knowledge of the lever spring constant. The jump to contact is avoided and thus it is possible to follow the brutal nucleation of a water bridge between the tip and the surface. |
doi_str_mv | 10.1063/1.4766172 |
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The jump to contact is avoided and thus it is possible to follow the brutal nucleation of a water bridge between the tip and the surface.</description><subject>Atomic force microscopy</subject><subject>Condensed Matter</subject><subject>Contact</subject><subject>Damping</subject><subject>Feedback</subject><subject>Levers</subject><subject>Microscopes</subject><subject>Nucleation</subject><subject>Other</subject><subject>Physics</subject><subject>Spring constant</subject><issn>0003-6951</issn><issn>1077-3118</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2012</creationdate><recordtype>article</recordtype><recordid>eNpFkM1OwzAQhC0EEqVw4A18hEOK107s5ISqCiiiEhcQR8vxj-oqqUPsVPTtSdUKTrs7Gn2rGYRugcyAcPYAs1xwDoKeoQkQITIGUJ6jCSGEZbwq4BJdxbgZz4IyNkFvX-s9NgGrFFqvsQu9tnjc-hB16PYnQQ_9zkYck28abH_WvvYJb4a2wylgHbZJ6YQfr9GFU020N6c5RZ_PTx-LZbZ6f3ldzFeZZpymLC8NM5CDIJVTVpu8Mo5TVVpFC6EMrSpei1xDxSpKDaGWa0WcqLkroTaOsSm6P3LXqpFd71vV72VQXi7nK3nQCBAyPuA7GL13R2_Xh-_BxiRbH7VtGrW1YYgSuICCEkr5P_YQPvbW_bGByEO5EuSpXPYLtYRqaw</recordid><startdate>20121112</startdate><enddate>20121112</enddate><creator>Rodrigues, Mario S.</creator><creator>Costa, Luca</creator><creator>Chevrier, Joël</creator><creator>Comin, Fabio</creator><general>American Institute of Physics</general><scope>AAYXX</scope><scope>CITATION</scope><scope>7U5</scope><scope>8FD</scope><scope>L7M</scope><scope>1XC</scope><orcidid>https://orcid.org/0000-0002-4527-0034</orcidid><orcidid>https://orcid.org/0000-0001-5609-6863</orcidid></search><sort><creationdate>20121112</creationdate><title>Why do atomic force microscopy force curves still exhibit jump to contact ?</title><author>Rodrigues, Mario S. ; Costa, Luca ; Chevrier, Joël ; Comin, Fabio</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c362t-48d3d141709faecd49df62a8ea257ad2996b74c193922d02e6ca0f7b6f81bdf33</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2012</creationdate><topic>Atomic force microscopy</topic><topic>Condensed Matter</topic><topic>Contact</topic><topic>Damping</topic><topic>Feedback</topic><topic>Levers</topic><topic>Microscopes</topic><topic>Nucleation</topic><topic>Other</topic><topic>Physics</topic><topic>Spring constant</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Rodrigues, Mario S.</creatorcontrib><creatorcontrib>Costa, Luca</creatorcontrib><creatorcontrib>Chevrier, Joël</creatorcontrib><creatorcontrib>Comin, Fabio</creatorcontrib><collection>CrossRef</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>Hyper Article en Ligne (HAL)</collection><jtitle>Applied physics letters</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Rodrigues, Mario S.</au><au>Costa, Luca</au><au>Chevrier, Joël</au><au>Comin, Fabio</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Why do atomic force microscopy force curves still exhibit jump to contact ?</atitle><jtitle>Applied physics letters</jtitle><date>2012-11-12</date><risdate>2012</risdate><volume>101</volume><issue>20</issue><issn>0003-6951</issn><eissn>1077-3118</eissn><abstract>The force between two particles as a function of distance is one of the most fundamental curves in physics. Here, we describe how the force feedback microscope can routinely measure the tip-surface interaction in the entire range of distances with a sensitivity of 1 pN and in different media. The method allows to measure simultaneously the force, force gradient, and damping from solely the knowledge of the lever spring constant. The jump to contact is avoided and thus it is possible to follow the brutal nucleation of a water bridge between the tip and the surface.</abstract><pub>American Institute of Physics</pub><doi>10.1063/1.4766172</doi><orcidid>https://orcid.org/0000-0002-4527-0034</orcidid><orcidid>https://orcid.org/0000-0001-5609-6863</orcidid></addata></record> |
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source | AIP Journals Complete; AIP Digital Archive; Alma/SFX Local Collection |
subjects | Atomic force microscopy Condensed Matter Contact Damping Feedback Levers Microscopes Nucleation Other Physics Spring constant |
title | Why do atomic force microscopy force curves still exhibit jump to contact ? |
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