Overdamped Josephson junctions for digital applications

► Properties of self-shunted sub-micron Nb/Al–AlOx/Nb SNIS junctions are studied. ► 1–100kA/cm2 current densities and 0.1–0.7mV critical voltages are obtained. ► The critical voltage-vs-temperature behavior of SNIS junctions is discussed. ► Numerical results showing an effect of the aluminum film th...

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Veröffentlicht in:	Physica. C, Superconductivity Superconductivity, 2013-01, Vol.484, p.175-178
Hauptverfasser:	Febvre, P., De Leo, N., Fretto, M., Sosso, A., Belogolovskii, M., Collot, R., Lacquaniti, V.
Format:	Artikel
Sprache:	eng
Schlagworte:	Aluminum Applied sciences Circuits Condensed matter: electronic structure, electrical, magnetic, and optical properties Digital Electronics Engineering Sciences Exact sciences and technology Josephson junctions Magnetic devices Micro and nanotechnologies Microelectronics Multilayers, superlattices , heterostructures Nanocomposites Nanostructure Niobium Physics Resistors RSFQ Self-shunted junctions Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices SNIS Superconducting electronics Superconducting films and low-dimensional structures Superconductivity Tunnel barrier
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