Supercapacitors aging diagnosis using least square algorithm

•This study permits us to insulate some parameters as good indicators of the supercapacitor aging.•The aging diagnosis method is based on an estimation of these parameters at each operating phase.•This estimation uses only the input/output signals (current and voltage). Supercapacitor aging is mainl...

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Veröffentlicht in:	Microelectronics and reliability 2013-09, Vol.53 (9-11), p.1638-1642
Hauptverfasser:	Oukaour, A., Pouliquen, M., Tala-Ighil, B., Gualous, H., Pigeon, E., Gehan, O., Boudart, B.
Format:	Artikel
Sprache:	eng
Schlagworte:	Algorithms Applied sciences Automatic Capacitors Diagnosis Dielectric, amorphous and glass solid devices Electric potential Electronics Engineering Sciences Equivalence Exact sciences and technology Least squares method Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices Supercapacitors Voltage
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