Supercapacitors aging diagnosis using least square algorithm
•This study permits us to insulate some parameters as good indicators of the supercapacitor aging.•The aging diagnosis method is based on an estimation of these parameters at each operating phase.•This estimation uses only the input/output signals (current and voltage). Supercapacitor aging is mainl...
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| Veröffentlicht in: | Microelectronics and reliability 2013-09, Vol.53 (9-11), p.1638-1642 |
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| creator | Oukaour, A. Pouliquen, M. Tala-Ighil, B. Gualous, H. Pigeon, E. Gehan, O. Boudart, B. |
| description | •This study permits us to insulate some parameters as good indicators of the supercapacitor aging.•The aging diagnosis method is based on an estimation of these parameters at each operating phase.•This estimation uses only the input/output signals (current and voltage).
Supercapacitor aging is mainly related to thermal and voltage constraints. This aging causes degradation in the supercapacitor performances which can lead to the failure of this component. To avoid this failure, it is necessary to determine the supercapacitor state of health. The aim of this study is the supercapacitor diagnosis. In this paper, aging tests of supercapacitor subjected to calendar aging constraints are presented. The supercapacitor is aged at constant temperature and constant bias voltage. During the aging process, the variations of the supercapacitor equivalent series resistance (ESR) and equivalent capacitance (C) are measured and analyzed. For diagnosis, a least square algorithm is used. This algorithm is used for ESR and C identification during the supercapacitor operation. For vehicle applications, the supercapacitor is considered as aged when the capacitance loss is in order of 20% of its initial value, or if the value of the equivalent series resistance increases by a factor of 2. |
| doi_str_mv | 10.1016/j.microrel.2013.07.032 |
| format | Article |
| fullrecord | <record><control><sourceid>proquest_hal_p</sourceid><recordid>TN_cdi_hal_primary_oai_HAL_hal_00965762v1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><els_id>S0026271413002072</els_id><sourcerecordid>1530993195</sourcerecordid><originalsourceid>FETCH-LOGICAL-c498t-cabbe4f3c90f72e9003af54cad31dd4d67898d71c61cc163c3f6fdc2a8075f353</originalsourceid><addsrcrecordid>eNqFkE1r3DAQhkVpodtt_0LxpdAe7MxItmRBDw2hbQILPbSF3sRkLG20eO2NZAf672Ozaa49DTO8H8wjxHuECgH1xaE6Rk5j8n0lAVUFpgIlX4gNtkaWtsY_L8UGQOpSGqxfizc5HwDAAOJGfP45n3xiOhHHaUy5oH0c9kUXaT-MOeZizuvee8pTke9nSr6gfj-mON0d34pXgfrs3z3Nrfj97euvq-ty9-P7zdXlruTatlPJdHvr66DYQjDSWwBFoamZOoVdV3fatLbtDLJGZtSKVdChY0ktmCaoRm3Fp3PuHfXulOKR0l83UnTXlzu33gCsboyWD7hoP561pzTezz5P7hgz-76nwY9zdtgosFahXWP1WbrQyzn58JyN4Fa07uD-oXUrWgfGLWgX44enDspMfUg0cMzPbmmsRLM8shVfzjq_wHmIPrnM0Q_su5g8T64b4_-qHgEezZLH</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>1530993195</pqid></control><display><type>article</type><title>Supercapacitors aging diagnosis using least square algorithm</title><source>Elsevier ScienceDirect Journals Complete</source><creator>Oukaour, A. ; Pouliquen, M. ; Tala-Ighil, B. ; Gualous, H. ; Pigeon, E. ; Gehan, O. ; Boudart, B.</creator><creatorcontrib>Oukaour, A. ; Pouliquen, M. ; Tala-Ighil, B. ; Gualous, H. ; Pigeon, E. ; Gehan, O. ; Boudart, B.</creatorcontrib><description>•This study permits us to insulate some parameters as good indicators of the supercapacitor aging.•The aging diagnosis method is based on an estimation of these parameters at each operating phase.•This estimation uses only the input/output signals (current and voltage).
Supercapacitor aging is mainly related to thermal and voltage constraints. This aging causes degradation in the supercapacitor performances which can lead to the failure of this component. To avoid this failure, it is necessary to determine the supercapacitor state of health. The aim of this study is the supercapacitor diagnosis. In this paper, aging tests of supercapacitor subjected to calendar aging constraints are presented. The supercapacitor is aged at constant temperature and constant bias voltage. During the aging process, the variations of the supercapacitor equivalent series resistance (ESR) and equivalent capacitance (C) are measured and analyzed. For diagnosis, a least square algorithm is used. This algorithm is used for ESR and C identification during the supercapacitor operation. For vehicle applications, the supercapacitor is considered as aged when the capacitance loss is in order of 20% of its initial value, or if the value of the equivalent series resistance increases by a factor of 2.</description><identifier>ISSN: 0026-2714</identifier><identifier>EISSN: 1872-941X</identifier><identifier>DOI: 10.1016/j.microrel.2013.07.032</identifier><identifier>CODEN: MCRLAS</identifier><language>eng</language><publisher>Kidlington: Elsevier Ltd</publisher><subject>Algorithms ; Applied sciences ; Automatic ; Capacitors ; Diagnosis ; Dielectric, amorphous and glass solid devices ; Electric potential ; Electronics ; Engineering Sciences ; Equivalence ; Exact sciences and technology ; Least squares method ; Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices ; Supercapacitors ; Voltage</subject><ispartof>Microelectronics and reliability, 2013-09, Vol.53 (9-11), p.1638-1642</ispartof><rights>2013 Elsevier Ltd</rights><rights>2014 INIST-CNRS</rights><rights>Distributed under a Creative Commons Attribution 4.0 International License</rights><lds50>peer_reviewed</lds50><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c498t-cabbe4f3c90f72e9003af54cad31dd4d67898d71c61cc163c3f6fdc2a8075f353</citedby><cites>FETCH-LOGICAL-c498t-cabbe4f3c90f72e9003af54cad31dd4d67898d71c61cc163c3f6fdc2a8075f353</cites><orcidid>0000-0002-2186-986X ; 0000-0001-9629-2199</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://www.sciencedirect.com/science/article/pii/S0026271413002072$$EHTML$$P50$$Gelsevier$$H</linktohtml><link.rule.ids>230,309,310,314,776,780,785,786,881,3537,23909,23910,25118,27901,27902,65306</link.rule.ids><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=27921716$$DView record in Pascal Francis$$Hfree_for_read</backlink><backlink>$$Uhttps://hal.science/hal-00965762$$DView record in HAL$$Hfree_for_read</backlink></links><search><creatorcontrib>Oukaour, A.</creatorcontrib><creatorcontrib>Pouliquen, M.</creatorcontrib><creatorcontrib>Tala-Ighil, B.</creatorcontrib><creatorcontrib>Gualous, H.</creatorcontrib><creatorcontrib>Pigeon, E.</creatorcontrib><creatorcontrib>Gehan, O.</creatorcontrib><creatorcontrib>Boudart, B.</creatorcontrib><title>Supercapacitors aging diagnosis using least square algorithm</title><title>Microelectronics and reliability</title><description>•This study permits us to insulate some parameters as good indicators of the supercapacitor aging.•The aging diagnosis method is based on an estimation of these parameters at each operating phase.•This estimation uses only the input/output signals (current and voltage).
Supercapacitor aging is mainly related to thermal and voltage constraints. This aging causes degradation in the supercapacitor performances which can lead to the failure of this component. To avoid this failure, it is necessary to determine the supercapacitor state of health. The aim of this study is the supercapacitor diagnosis. In this paper, aging tests of supercapacitor subjected to calendar aging constraints are presented. The supercapacitor is aged at constant temperature and constant bias voltage. During the aging process, the variations of the supercapacitor equivalent series resistance (ESR) and equivalent capacitance (C) are measured and analyzed. For diagnosis, a least square algorithm is used. This algorithm is used for ESR and C identification during the supercapacitor operation. For vehicle applications, the supercapacitor is considered as aged when the capacitance loss is in order of 20% of its initial value, or if the value of the equivalent series resistance increases by a factor of 2.</description><subject>Algorithms</subject><subject>Applied sciences</subject><subject>Automatic</subject><subject>Capacitors</subject><subject>Diagnosis</subject><subject>Dielectric, amorphous and glass solid devices</subject><subject>Electric potential</subject><subject>Electronics</subject><subject>Engineering Sciences</subject><subject>Equivalence</subject><subject>Exact sciences and technology</subject><subject>Least squares method</subject><subject>Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices</subject><subject>Supercapacitors</subject><subject>Voltage</subject><issn>0026-2714</issn><issn>1872-941X</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2013</creationdate><recordtype>article</recordtype><recordid>eNqFkE1r3DAQhkVpodtt_0LxpdAe7MxItmRBDw2hbQILPbSF3sRkLG20eO2NZAf672Ozaa49DTO8H8wjxHuECgH1xaE6Rk5j8n0lAVUFpgIlX4gNtkaWtsY_L8UGQOpSGqxfizc5HwDAAOJGfP45n3xiOhHHaUy5oH0c9kUXaT-MOeZizuvee8pTke9nSr6gfj-mON0d34pXgfrs3z3Nrfj97euvq-ty9-P7zdXlruTatlPJdHvr66DYQjDSWwBFoamZOoVdV3fatLbtDLJGZtSKVdChY0ktmCaoRm3Fp3PuHfXulOKR0l83UnTXlzu33gCsboyWD7hoP561pzTezz5P7hgz-76nwY9zdtgosFahXWP1WbrQyzn58JyN4Fa07uD-oXUrWgfGLWgX44enDspMfUg0cMzPbmmsRLM8shVfzjq_wHmIPrnM0Q_su5g8T64b4_-qHgEezZLH</recordid><startdate>20130901</startdate><enddate>20130901</enddate><creator>Oukaour, A.</creator><creator>Pouliquen, M.</creator><creator>Tala-Ighil, B.</creator><creator>Gualous, H.</creator><creator>Pigeon, E.</creator><creator>Gehan, O.</creator><creator>Boudart, B.</creator><general>Elsevier Ltd</general><general>Elsevier</general><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>8FD</scope><scope>L7M</scope><scope>1XC</scope><scope>VOOES</scope><orcidid>https://orcid.org/0000-0002-2186-986X</orcidid><orcidid>https://orcid.org/0000-0001-9629-2199</orcidid></search><sort><creationdate>20130901</creationdate><title>Supercapacitors aging diagnosis using least square algorithm</title><author>Oukaour, A. ; Pouliquen, M. ; Tala-Ighil, B. ; Gualous, H. ; Pigeon, E. ; Gehan, O. ; Boudart, B.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c498t-cabbe4f3c90f72e9003af54cad31dd4d67898d71c61cc163c3f6fdc2a8075f353</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2013</creationdate><topic>Algorithms</topic><topic>Applied sciences</topic><topic>Automatic</topic><topic>Capacitors</topic><topic>Diagnosis</topic><topic>Dielectric, amorphous and glass solid devices</topic><topic>Electric potential</topic><topic>Electronics</topic><topic>Engineering Sciences</topic><topic>Equivalence</topic><topic>Exact sciences and technology</topic><topic>Least squares method</topic><topic>Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices</topic><topic>Supercapacitors</topic><topic>Voltage</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Oukaour, A.</creatorcontrib><creatorcontrib>Pouliquen, M.</creatorcontrib><creatorcontrib>Tala-Ighil, B.</creatorcontrib><creatorcontrib>Gualous, H.</creatorcontrib><creatorcontrib>Pigeon, E.</creatorcontrib><creatorcontrib>Gehan, O.</creatorcontrib><creatorcontrib>Boudart, B.</creatorcontrib><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>Hyper Article en Ligne (HAL)</collection><collection>Hyper Article en Ligne (HAL) (Open Access)</collection><jtitle>Microelectronics and reliability</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Oukaour, A.</au><au>Pouliquen, M.</au><au>Tala-Ighil, B.</au><au>Gualous, H.</au><au>Pigeon, E.</au><au>Gehan, O.</au><au>Boudart, B.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Supercapacitors aging diagnosis using least square algorithm</atitle><jtitle>Microelectronics and reliability</jtitle><date>2013-09-01</date><risdate>2013</risdate><volume>53</volume><issue>9-11</issue><spage>1638</spage><epage>1642</epage><pages>1638-1642</pages><issn>0026-2714</issn><eissn>1872-941X</eissn><coden>MCRLAS</coden><abstract>•This study permits us to insulate some parameters as good indicators of the supercapacitor aging.•The aging diagnosis method is based on an estimation of these parameters at each operating phase.•This estimation uses only the input/output signals (current and voltage).
Supercapacitor aging is mainly related to thermal and voltage constraints. This aging causes degradation in the supercapacitor performances which can lead to the failure of this component. To avoid this failure, it is necessary to determine the supercapacitor state of health. The aim of this study is the supercapacitor diagnosis. In this paper, aging tests of supercapacitor subjected to calendar aging constraints are presented. The supercapacitor is aged at constant temperature and constant bias voltage. During the aging process, the variations of the supercapacitor equivalent series resistance (ESR) and equivalent capacitance (C) are measured and analyzed. For diagnosis, a least square algorithm is used. This algorithm is used for ESR and C identification during the supercapacitor operation. For vehicle applications, the supercapacitor is considered as aged when the capacitance loss is in order of 20% of its initial value, or if the value of the equivalent series resistance increases by a factor of 2.</abstract><cop>Kidlington</cop><pub>Elsevier Ltd</pub><doi>10.1016/j.microrel.2013.07.032</doi><tpages>5</tpages><orcidid>https://orcid.org/0000-0002-2186-986X</orcidid><orcidid>https://orcid.org/0000-0001-9629-2199</orcidid><oa>free_for_read</oa></addata></record> |
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| subjects | Algorithms Applied sciences Automatic Capacitors Diagnosis Dielectric, amorphous and glass solid devices Electric potential Electronics Engineering Sciences Equivalence Exact sciences and technology Least squares method Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices Supercapacitors Voltage |
| title | Supercapacitors aging diagnosis using least square algorithm |
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