Amorphous Y-Ba-Cu-O oxide thin films: structural, electrical and dielectric properties correlated with uncooled IR pyroelectric detection performances

Semiconducting amorphous YBa2Cu3O6 + x (x < 0.5, a-YBCO) films of 140 nm to 880 nm thickness were deposited by direct current (DC) hollow cathode sputtering at low temperature (≈ 150 °C). The film microstructure was typically granular. Dielectric measurements from 100 Hz to 2 MHz were performed i...

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Veröffentlicht in:	Thin solid films 2014-02, Vol.553
Hauptverfasser:	Dégardin, Annick, Galiano, Xavier, Gensbittel, Aurélie, Dubrunfaut, Olivier, Jagtap, Vishal, Kreisler, Alain
Format:	Artikel
Sprache:	fre
Schlagworte:	Physics
Online-Zugang:	Volltext
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