Structural characterization of sputtered single-phase γ‴ iron nitride coatings
Single-phase γ‴-FeN films were deposited by d.c. magnetron sputtering in a reactive Ar/N 2 atmosphere. The films were characterized by X-ray diffraction, scanning and transmission electron microscopies, electron energy-loss and Mössbauer spectroscopy. The average lattice parameter of the γ‴ cubic ce...
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creator | Jouanny, I. Weisbecker, P. Demange, V. Grafouté, M. Peña, O. Bauer-Grosse, E. |
description | Single-phase γ‴-FeN films were deposited by d.c. magnetron sputtering in a reactive Ar/N
2 atmosphere. The films were characterized by X-ray diffraction, scanning and transmission electron microscopies, electron energy-loss and Mössbauer spectroscopy. The average lattice parameter of the γ‴ cubic cell is 0.455
nm. Microstructure studies by electron microscopies revealed nanostructured columnar films with no preferential orientation. Diffraction peak intensities (X-ray and electron diffraction) are close to the theoretical values for a ZnS-type structure while profile analysis of the X-ray diffraction pattern using Rietveld refinement method demonstrated that the γ‴-phase is of ZnS-type. The energy-loss near-edge structures of N K-edge of the γ‴-phase is similar to those of the ZnS-type γ″-phase suggesting an identical local atomic environment for N atoms. On the contrary, Mössbauer spectra of both structures are different, which is understood as a consequence of numerous vacancies in the γ‴ structure. Investigations of magnetic properties showed that the γ‴-FeN compound is paramagnetic from room temperature to 2
K. The main conclusion of this work is that the γ‴-FeN phase is of ZnS-type, and not of NaCl-type as it is usually reported. |
doi_str_mv | 10.1016/j.tsf.2009.07.039 |
format | Article |
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2 atmosphere. The films were characterized by X-ray diffraction, scanning and transmission electron microscopies, electron energy-loss and Mössbauer spectroscopy. The average lattice parameter of the γ‴ cubic cell is 0.455
nm. Microstructure studies by electron microscopies revealed nanostructured columnar films with no preferential orientation. Diffraction peak intensities (X-ray and electron diffraction) are close to the theoretical values for a ZnS-type structure while profile analysis of the X-ray diffraction pattern using Rietveld refinement method demonstrated that the γ‴-phase is of ZnS-type. The energy-loss near-edge structures of N K-edge of the γ‴-phase is similar to those of the ZnS-type γ″-phase suggesting an identical local atomic environment for N atoms. On the contrary, Mössbauer spectra of both structures are different, which is understood as a consequence of numerous vacancies in the γ‴ structure. Investigations of magnetic properties showed that the γ‴-FeN compound is paramagnetic from room temperature to 2
K. The main conclusion of this work is that the γ‴-FeN phase is of ZnS-type, and not of NaCl-type as it is usually reported.</description><identifier>ISSN: 0040-6090</identifier><identifier>EISSN: 1879-2731</identifier><identifier>DOI: 10.1016/j.tsf.2009.07.039</identifier><identifier>CODEN: THSFAP</identifier><language>eng</language><publisher>Amsterdam: Elsevier B.V</publisher><subject>Chemical Sciences ; Condensed matter: structure, mechanical and thermal properties ; Cross-disciplinary physics: materials science; rheology ; Crystal structure ; Deposition by sputtering ; Exact sciences and technology ; Iron nitride ; Material chemistry ; Materials science ; Methods of deposition of films and coatings; film growth and epitaxy ; Nanoscale materials and structures: fabrication and characterization ; Other semiconductors ; Other topics in nanoscale materials and structures ; Physics ; Specific materials ; Sputtering ; Structure and morphology; thickness ; Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties) ; Thin film structure and morphology ; Transmission electron microscopy ; X-ray diffraction</subject><ispartof>Thin solid films, 2010-02, Vol.518 (8), p.1883-1891</ispartof><rights>2009 Elsevier B.V.</rights><rights>2015 INIST-CNRS</rights><rights>Distributed under a Creative Commons Attribution 4.0 International License</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c361t-1de4294f4270e4e1097f7ee603fa0c38640116968b472f5366c713999cdb3e533</citedby><cites>FETCH-LOGICAL-c361t-1de4294f4270e4e1097f7ee603fa0c38640116968b472f5366c713999cdb3e533</cites><orcidid>0000-0002-8153-2660</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://dx.doi.org/10.1016/j.tsf.2009.07.039$$EHTML$$P50$$Gelsevier$$H</linktohtml><link.rule.ids>230,314,780,784,885,3550,27924,27925,45995</link.rule.ids><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=22472455$$DView record in Pascal Francis$$Hfree_for_read</backlink><backlink>$$Uhttps://hal.science/hal-00829912$$DView record in HAL$$Hfree_for_read</backlink></links><search><creatorcontrib>Jouanny, I.</creatorcontrib><creatorcontrib>Weisbecker, P.</creatorcontrib><creatorcontrib>Demange, V.</creatorcontrib><creatorcontrib>Grafouté, M.</creatorcontrib><creatorcontrib>Peña, O.</creatorcontrib><creatorcontrib>Bauer-Grosse, E.</creatorcontrib><title>Structural characterization of sputtered single-phase γ‴ iron nitride coatings</title><title>Thin solid films</title><description>Single-phase γ‴-FeN films were deposited by d.c. magnetron sputtering in a reactive Ar/N
2 atmosphere. The films were characterized by X-ray diffraction, scanning and transmission electron microscopies, electron energy-loss and Mössbauer spectroscopy. The average lattice parameter of the γ‴ cubic cell is 0.455
nm. Microstructure studies by electron microscopies revealed nanostructured columnar films with no preferential orientation. Diffraction peak intensities (X-ray and electron diffraction) are close to the theoretical values for a ZnS-type structure while profile analysis of the X-ray diffraction pattern using Rietveld refinement method demonstrated that the γ‴-phase is of ZnS-type. The energy-loss near-edge structures of N K-edge of the γ‴-phase is similar to those of the ZnS-type γ″-phase suggesting an identical local atomic environment for N atoms. On the contrary, Mössbauer spectra of both structures are different, which is understood as a consequence of numerous vacancies in the γ‴ structure. Investigations of magnetic properties showed that the γ‴-FeN compound is paramagnetic from room temperature to 2
K. The main conclusion of this work is that the γ‴-FeN phase is of ZnS-type, and not of NaCl-type as it is usually reported.</description><subject>Chemical Sciences</subject><subject>Condensed matter: structure, mechanical and thermal properties</subject><subject>Cross-disciplinary physics: materials science; rheology</subject><subject>Crystal structure</subject><subject>Deposition by sputtering</subject><subject>Exact sciences and technology</subject><subject>Iron nitride</subject><subject>Material chemistry</subject><subject>Materials science</subject><subject>Methods of deposition of films and coatings; film growth and epitaxy</subject><subject>Nanoscale materials and structures: fabrication and characterization</subject><subject>Other semiconductors</subject><subject>Other topics in nanoscale materials and structures</subject><subject>Physics</subject><subject>Specific materials</subject><subject>Sputtering</subject><subject>Structure and morphology; thickness</subject><subject>Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties)</subject><subject>Thin film structure and morphology</subject><subject>Transmission electron microscopy</subject><subject>X-ray diffraction</subject><issn>0040-6090</issn><issn>1879-2731</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2010</creationdate><recordtype>article</recordtype><recordid>eNp9kM9KAzEQh4MoWKsP4G0vHjzsOkm2SYMnEbVCQUQ9hzQ7aVPW3ZKkgp58J30OH8InMaXi0dPA8H3z50fIMYWKAhVnyypFVzEAVYGsgKsdMqBjqUomOd0lA4AaSgEK9slBjEsAoIzxAbl_SGFt0zqYtrALE4xNGPybSb7vit4VcbVOuYNNEX03b7FcLUzE4uvj-_2z8CFDnU_BN1jYPkvdPB6SPWfaiEe_dUierq8eLyfl9O7m9vJiWlouaCppgzVTtauZBKyRgpJOIgrgzoDlY1EDpUKJ8ayWzI24EFZSrpSyzYzjiPMhOd3OXZhWr4J_NuFV98brycVUb3oAY6YUZS80s3TL2tDHGND9CRT0Jj-91Dk_vclPg9Q5v-ycbJ2Vida0LpjO-vgnMpbvqkejzJ1vOczPvngMOlqPncXGB7RJN73_Z8sP1j-GmA</recordid><startdate>20100201</startdate><enddate>20100201</enddate><creator>Jouanny, I.</creator><creator>Weisbecker, P.</creator><creator>Demange, V.</creator><creator>Grafouté, M.</creator><creator>Peña, O.</creator><creator>Bauer-Grosse, E.</creator><general>Elsevier B.V</general><general>Elsevier</general><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>1XC</scope><orcidid>https://orcid.org/0000-0002-8153-2660</orcidid></search><sort><creationdate>20100201</creationdate><title>Structural characterization of sputtered single-phase γ‴ iron nitride coatings</title><author>Jouanny, I. ; Weisbecker, P. ; Demange, V. ; Grafouté, M. ; Peña, O. ; Bauer-Grosse, E.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c361t-1de4294f4270e4e1097f7ee603fa0c38640116968b472f5366c713999cdb3e533</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2010</creationdate><topic>Chemical Sciences</topic><topic>Condensed matter: structure, mechanical and thermal properties</topic><topic>Cross-disciplinary physics: materials science; rheology</topic><topic>Crystal structure</topic><topic>Deposition by sputtering</topic><topic>Exact sciences and technology</topic><topic>Iron nitride</topic><topic>Material chemistry</topic><topic>Materials science</topic><topic>Methods of deposition of films and coatings; film growth and epitaxy</topic><topic>Nanoscale materials and structures: fabrication and characterization</topic><topic>Other semiconductors</topic><topic>Other topics in nanoscale materials and structures</topic><topic>Physics</topic><topic>Specific materials</topic><topic>Sputtering</topic><topic>Structure and morphology; thickness</topic><topic>Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties)</topic><topic>Thin film structure and morphology</topic><topic>Transmission electron microscopy</topic><topic>X-ray diffraction</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Jouanny, I.</creatorcontrib><creatorcontrib>Weisbecker, P.</creatorcontrib><creatorcontrib>Demange, V.</creatorcontrib><creatorcontrib>Grafouté, M.</creatorcontrib><creatorcontrib>Peña, O.</creatorcontrib><creatorcontrib>Bauer-Grosse, E.</creatorcontrib><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>Hyper Article en Ligne (HAL)</collection><jtitle>Thin solid films</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Jouanny, I.</au><au>Weisbecker, P.</au><au>Demange, V.</au><au>Grafouté, M.</au><au>Peña, O.</au><au>Bauer-Grosse, E.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Structural characterization of sputtered single-phase γ‴ iron nitride coatings</atitle><jtitle>Thin solid films</jtitle><date>2010-02-01</date><risdate>2010</risdate><volume>518</volume><issue>8</issue><spage>1883</spage><epage>1891</epage><pages>1883-1891</pages><issn>0040-6090</issn><eissn>1879-2731</eissn><coden>THSFAP</coden><abstract>Single-phase γ‴-FeN films were deposited by d.c. magnetron sputtering in a reactive Ar/N
2 atmosphere. The films were characterized by X-ray diffraction, scanning and transmission electron microscopies, electron energy-loss and Mössbauer spectroscopy. The average lattice parameter of the γ‴ cubic cell is 0.455
nm. Microstructure studies by electron microscopies revealed nanostructured columnar films with no preferential orientation. Diffraction peak intensities (X-ray and electron diffraction) are close to the theoretical values for a ZnS-type structure while profile analysis of the X-ray diffraction pattern using Rietveld refinement method demonstrated that the γ‴-phase is of ZnS-type. The energy-loss near-edge structures of N K-edge of the γ‴-phase is similar to those of the ZnS-type γ″-phase suggesting an identical local atomic environment for N atoms. On the contrary, Mössbauer spectra of both structures are different, which is understood as a consequence of numerous vacancies in the γ‴ structure. Investigations of magnetic properties showed that the γ‴-FeN compound is paramagnetic from room temperature to 2
K. The main conclusion of this work is that the γ‴-FeN phase is of ZnS-type, and not of NaCl-type as it is usually reported.</abstract><cop>Amsterdam</cop><pub>Elsevier B.V</pub><doi>10.1016/j.tsf.2009.07.039</doi><tpages>9</tpages><orcidid>https://orcid.org/0000-0002-8153-2660</orcidid></addata></record> |
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subjects | Chemical Sciences Condensed matter: structure, mechanical and thermal properties Cross-disciplinary physics: materials science rheology Crystal structure Deposition by sputtering Exact sciences and technology Iron nitride Material chemistry Materials science Methods of deposition of films and coatings film growth and epitaxy Nanoscale materials and structures: fabrication and characterization Other semiconductors Other topics in nanoscale materials and structures Physics Specific materials Sputtering Structure and morphology thickness Surfaces and interfaces thin films and whiskers (structure and nonelectronic properties) Thin film structure and morphology Transmission electron microscopy X-ray diffraction |
title | Structural characterization of sputtered single-phase γ‴ iron nitride coatings |
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