$Strain inhomogeneity in copper islands probed by coherent X-ray diffraction$

Strain inhomogeneity in copper islands probed by coherent X-ray diffraction

The strain field of individual epitaxial sub-micrometric copper islands is studied using coherent X-ray diffraction and finite element modelling. The strain inhomogeneity in each island is so large that the characteristic features of the island shape tend to disappear in the diffraction pattern, whi...

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Veröffentlicht in:	Thin solid films 2013-03, Vol.530, p.120-124
Hauptverfasser:	Beutier, G., Verdier, M., Parry, G., Gilles, B., Labat, S., Richard, M.-I., Cornelius, T., Lory, P.-F., Vu Hoang, S., Livet, F., Thomas, O., de Boissieu, M.
Format:	Artikel
Sprache:	eng
Schlagworte:	Coherence Coherent X-ray diffraction Condensed Matter Copper Cross-disciplinary physics: materials science rheology Diffraction Exact sciences and technology Inhomogeneity Islands Materials Science Mathematical analysis Nanoscale materials and structures: fabrication and characterization Nanostructures Other topics in nanoscale materials and structures Physics Strain Strain field X-rays
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