Real-time high-resolution topographic imagery using interference microscopy
New instrumentation has been developed that is dedicated to the measurement of surface morphology with high resolutions and short acquisition times. Sinusoidal phase-shifting interferometry is demonstrated to provide within an acquisition time of only a few milliseconds topographic images with ~1 nm...
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| Veröffentlicht in: | European physical journal. Applied physics 2002-12, Vol.20 (3), p.169-175 |
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| container_end_page | 175 |
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| container_issue | 3 |
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| container_title | European physical journal. Applied physics |
| container_volume | 20 |
| creator | Dubois, A. Vabre, L. Boccara, A.-C. Montgomery, P. C. Cunin, B. Reibel, Y. Draman, C. |
| description | New instrumentation has been developed that is dedicated to the measurement of surface morphology with high resolutions and short acquisition times. Sinusoidal phase-shifting interferometry is demonstrated to provide within an acquisition time of only a few milliseconds topographic images with ~1 nm height precision, ~1 μm lateral resolution, and a few tens of pm sensitivity. A white-light scanning microscope is also under development, using an in-house developed high speed, intelligent CCD camera, the first tests of which demonstrate the feasibility of providing topographic images of deep surface relief (several microns to several tens of microns) within less than 0.3 s. The useful lateral field of view can be extended by employing image “stitching” while maintaining a high lateral resolution. |
| doi_str_mv | 10.1051/epjap:2002088 |
| format | Article |
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Applied physics</jtitle><date>2002-12-01</date><risdate>2002</risdate><volume>20</volume><issue>3</issue><spage>169</spage><epage>175</epage><pages>169-175</pages><issn>1286-0042</issn><eissn>1286-0050</eissn><abstract>New instrumentation has been developed that is dedicated to the measurement of surface morphology with high resolutions and short acquisition times. Sinusoidal phase-shifting interferometry is demonstrated to provide within an acquisition time of only a few milliseconds topographic images with ~1 nm height precision, ~1 μm lateral resolution, and a few tens of pm sensitivity. A white-light scanning microscope is also under development, using an in-house developed high speed, intelligent CCD camera, the first tests of which demonstrate the feasibility of providing topographic images of deep surface relief (several microns to several tens of microns) within less than 0.3 s. 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| identifier | ISSN: 1286-0042 |
| ispartof | European physical journal. Applied physics, 2002-12, Vol.20 (3), p.169-175 |
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| language | eng |
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| source | EDP Sciences; EDP Sciences - Revues - Licences nationales - accès par la plateforme ISTEX |
| subjects | 07.60.Pb Conventional optical microscopes Cross-disciplinary physics: materials science rheology Exact sciences and technology Instruments, apparatus, components and techniques common to several branches of physics and astronomy Materials science Materials testing Nondestructive testing: optical methods Optical instruments, equipment and techniques Optics Physics |
| title | Real-time high-resolution topographic imagery using interference microscopy |
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