Effect of composition on the properties of Te–Ge thick films deposited by co-thermal evaporation
Due to their remarkable transparency in the mid to far-infrared region, telluride films are considered for the fabrication of micro-components for infrared applications. In the framework of the Darwin mission initiated by the European Space Agency, amorphous Te xGe 100 − x (with x comprised between...
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| Veröffentlicht in: | Journal of non-crystalline solids 2010-09, Vol.356 (41), p.2175-2180 |
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| container_title | Journal of non-crystalline solids |
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| creator | Barthélémy, Eléonore Albert, Stéphanie Vigreux, Caroline Pradel, Annie |
| description | Due to their remarkable transparency in the mid to far-infrared region, telluride films are considered for the fabrication of micro-components for infrared applications. In the framework of the Darwin mission initiated by the European Space Agency, amorphous Te
xGe
100
−
x
(with x comprised between 73.1 and 88.5
at.%) thick films were deposited by co-thermal evaporation from tellurium and germanium elemental powders. Homogeneous films with thickness comprised between 6 and 15
μm were obtained. Specimens deposited on microscope slide substrates were used for composition, structure, thermal properties, transmission and Vicker's microhardness measurements. Films deposited on commercial As
2Se
3 bulk glass substrates were used for refractive index measurements by the M-lines method. The different measurements revealed that the replacement of Ge by Te in the Te
xGe
100
−
x
films was responsible for a decrease in the glass transition temperature and in the stability of the glass against crystallization. Moreover a two-stage crystallization implying the presence of two crystallization peaks in the DSC curves was highlighted for x
>
80
at.% Te. The increase in x was also shown to be responsible for a decrease in the Vicker's microhardness and an increase in the linear refractive index. |
| doi_str_mv | 10.1016/j.jnoncrysol.2010.08.004 |
| format | Article |
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xGe
100
−
x
(with x comprised between 73.1 and 88.5
at.%) thick films were deposited by co-thermal evaporation from tellurium and germanium elemental powders. Homogeneous films with thickness comprised between 6 and 15
μm were obtained. Specimens deposited on microscope slide substrates were used for composition, structure, thermal properties, transmission and Vicker's microhardness measurements. Films deposited on commercial As
2Se
3 bulk glass substrates were used for refractive index measurements by the M-lines method. The different measurements revealed that the replacement of Ge by Te in the Te
xGe
100
−
x
films was responsible for a decrease in the glass transition temperature and in the stability of the glass against crystallization. Moreover a two-stage crystallization implying the presence of two crystallization peaks in the DSC curves was highlighted for x
>
80
at.% Te. The increase in x was also shown to be responsible for a decrease in the Vicker's microhardness and an increase in the linear refractive index.</description><identifier>ISSN: 0022-3093</identifier><identifier>EISSN: 1873-4812</identifier><identifier>DOI: 10.1016/j.jnoncrysol.2010.08.004</identifier><identifier>CODEN: JNCSBJ</identifier><language>eng</language><publisher>Oxford: Elsevier B.V</publisher><subject>Co-thermal evaporation ; Condensed Matter ; Condensed matter: structure, mechanical and thermal properties ; Equations of state, phase equilibria, and phase transitions ; Exact sciences and technology ; Film characterisation ; Glass transitions ; Infrared transmitting materials ; Materials Science ; Physics ; Specific phase transitions ; Telluride thick films</subject><ispartof>Journal of non-crystalline solids, 2010-09, Vol.356 (41), p.2175-2180</ispartof><rights>2010 Elsevier B.V.</rights><rights>2015 INIST-CNRS</rights><rights>Distributed under a Creative Commons Attribution 4.0 International License</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c382t-176cb9ae7fa64b3ddf04ab2fb4ba7c8930a23cbf240b8aadf0daadd32018dee83</citedby><cites>FETCH-LOGICAL-c382t-176cb9ae7fa64b3ddf04ab2fb4ba7c8930a23cbf240b8aadf0daadd32018dee83</cites><orcidid>0000-0003-1322-3089 ; 0000-0002-4588-8459</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://dx.doi.org/10.1016/j.jnoncrysol.2010.08.004$$EHTML$$P50$$Gelsevier$$H</linktohtml><link.rule.ids>230,314,780,784,885,3550,27924,27925,45995</link.rule.ids><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=23307608$$DView record in Pascal Francis$$Hfree_for_read</backlink><backlink>$$Uhttps://hal.science/hal-00524668$$DView record in HAL$$Hfree_for_read</backlink></links><search><creatorcontrib>Barthélémy, Eléonore</creatorcontrib><creatorcontrib>Albert, Stéphanie</creatorcontrib><creatorcontrib>Vigreux, Caroline</creatorcontrib><creatorcontrib>Pradel, Annie</creatorcontrib><title>Effect of composition on the properties of Te–Ge thick films deposited by co-thermal evaporation</title><title>Journal of non-crystalline solids</title><description>Due to their remarkable transparency in the mid to far-infrared region, telluride films are considered for the fabrication of micro-components for infrared applications. In the framework of the Darwin mission initiated by the European Space Agency, amorphous Te
xGe
100
−
x
(with x comprised between 73.1 and 88.5
at.%) thick films were deposited by co-thermal evaporation from tellurium and germanium elemental powders. Homogeneous films with thickness comprised between 6 and 15
μm were obtained. Specimens deposited on microscope slide substrates were used for composition, structure, thermal properties, transmission and Vicker's microhardness measurements. Films deposited on commercial As
2Se
3 bulk glass substrates were used for refractive index measurements by the M-lines method. The different measurements revealed that the replacement of Ge by Te in the Te
xGe
100
−
x
films was responsible for a decrease in the glass transition temperature and in the stability of the glass against crystallization. Moreover a two-stage crystallization implying the presence of two crystallization peaks in the DSC curves was highlighted for x
>
80
at.% Te. The increase in x was also shown to be responsible for a decrease in the Vicker's microhardness and an increase in the linear refractive index.</description><subject>Co-thermal evaporation</subject><subject>Condensed Matter</subject><subject>Condensed matter: structure, mechanical and thermal properties</subject><subject>Equations of state, phase equilibria, and phase transitions</subject><subject>Exact sciences and technology</subject><subject>Film characterisation</subject><subject>Glass transitions</subject><subject>Infrared transmitting materials</subject><subject>Materials Science</subject><subject>Physics</subject><subject>Specific phase transitions</subject><subject>Telluride thick films</subject><issn>0022-3093</issn><issn>1873-4812</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2010</creationdate><recordtype>article</recordtype><recordid>eNqFkM9OJCEQxslmTXZWfQcue_DQs9XQdjNHNf7ZZBIveiYFFJHZnqYDnUnm5jv4hj6JtGP0KCGQVH2_D-pjjNewrKFu_26WmyEONu1z7JcCShnUEqD5wRa16mTVqFr8ZAsAISoJK_mL_c55A2V1Ui2Yufae7MSj5zZux5jDFOLAy56eiI8pjpSmQHkWPNDr88stlU6w_7kP_TZzR-8MOW72xaEqVNpiz2mHY0w4m52wI499ptOP-5g93lw_XN1V6_vbf1cX68pKJaaq7lprVkidx7Yx0jkPDRrhTWOws2olAYW0xosGjEIsbVdOJ8vMyhEpeczODr5P2OsxhS2mvY4Y9N3FWs81gHPRtK3a1UWrDlqbYs6J_CdQg55z1Rv9lauec9WgikNT0D8HdMRssfcJBxvyJy-khK6F-TuXBx2VmXeBks420GDJhVQS1y6G7x97A4pqlu0</recordid><startdate>20100901</startdate><enddate>20100901</enddate><creator>Barthélémy, Eléonore</creator><creator>Albert, Stéphanie</creator><creator>Vigreux, Caroline</creator><creator>Pradel, Annie</creator><general>Elsevier B.V</general><general>Elsevier</general><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>1XC</scope><orcidid>https://orcid.org/0000-0003-1322-3089</orcidid><orcidid>https://orcid.org/0000-0002-4588-8459</orcidid></search><sort><creationdate>20100901</creationdate><title>Effect of composition on the properties of Te–Ge thick films deposited by co-thermal evaporation</title><author>Barthélémy, Eléonore ; Albert, Stéphanie ; Vigreux, Caroline ; Pradel, Annie</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c382t-176cb9ae7fa64b3ddf04ab2fb4ba7c8930a23cbf240b8aadf0daadd32018dee83</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2010</creationdate><topic>Co-thermal evaporation</topic><topic>Condensed Matter</topic><topic>Condensed matter: structure, mechanical and thermal properties</topic><topic>Equations of state, phase equilibria, and phase transitions</topic><topic>Exact sciences and technology</topic><topic>Film characterisation</topic><topic>Glass transitions</topic><topic>Infrared transmitting materials</topic><topic>Materials Science</topic><topic>Physics</topic><topic>Specific phase transitions</topic><topic>Telluride thick films</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Barthélémy, Eléonore</creatorcontrib><creatorcontrib>Albert, Stéphanie</creatorcontrib><creatorcontrib>Vigreux, Caroline</creatorcontrib><creatorcontrib>Pradel, Annie</creatorcontrib><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>Hyper Article en Ligne (HAL)</collection><jtitle>Journal of non-crystalline solids</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Barthélémy, Eléonore</au><au>Albert, Stéphanie</au><au>Vigreux, Caroline</au><au>Pradel, Annie</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Effect of composition on the properties of Te–Ge thick films deposited by co-thermal evaporation</atitle><jtitle>Journal of non-crystalline solids</jtitle><date>2010-09-01</date><risdate>2010</risdate><volume>356</volume><issue>41</issue><spage>2175</spage><epage>2180</epage><pages>2175-2180</pages><issn>0022-3093</issn><eissn>1873-4812</eissn><coden>JNCSBJ</coden><abstract>Due to their remarkable transparency in the mid to far-infrared region, telluride films are considered for the fabrication of micro-components for infrared applications. In the framework of the Darwin mission initiated by the European Space Agency, amorphous Te
xGe
100
−
x
(with x comprised between 73.1 and 88.5
at.%) thick films were deposited by co-thermal evaporation from tellurium and germanium elemental powders. Homogeneous films with thickness comprised between 6 and 15
μm were obtained. Specimens deposited on microscope slide substrates were used for composition, structure, thermal properties, transmission and Vicker's microhardness measurements. Films deposited on commercial As
2Se
3 bulk glass substrates were used for refractive index measurements by the M-lines method. The different measurements revealed that the replacement of Ge by Te in the Te
xGe
100
−
x
films was responsible for a decrease in the glass transition temperature and in the stability of the glass against crystallization. Moreover a two-stage crystallization implying the presence of two crystallization peaks in the DSC curves was highlighted for x
>
80
at.% Te. The increase in x was also shown to be responsible for a decrease in the Vicker's microhardness and an increase in the linear refractive index.</abstract><cop>Oxford</cop><pub>Elsevier B.V</pub><doi>10.1016/j.jnoncrysol.2010.08.004</doi><tpages>6</tpages><orcidid>https://orcid.org/0000-0003-1322-3089</orcidid><orcidid>https://orcid.org/0000-0002-4588-8459</orcidid></addata></record> |
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| ispartof | Journal of non-crystalline solids, 2010-09, Vol.356 (41), p.2175-2180 |
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| source | Access via ScienceDirect (Elsevier) |
| subjects | Co-thermal evaporation Condensed Matter Condensed matter: structure, mechanical and thermal properties Equations of state, phase equilibria, and phase transitions Exact sciences and technology Film characterisation Glass transitions Infrared transmitting materials Materials Science Physics Specific phase transitions Telluride thick films |
| title | Effect of composition on the properties of Te–Ge thick films deposited by co-thermal evaporation |
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