Identification of the physical signatures of CDM induced latent defects into a DC–DC converter using low frequency noise measurements

In this paper, it is demonstrated that low frequency noise measurements are an efficient tool for the detection of latent defects induced by CDM stress in a complex circuit such as a DC–DC converter. This technique is able to detect the presence of a defect whereas classical electrical testing techn...

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Veröffentlicht in:	Microelectronics and reliability 2007-09, Vol.47 (9), p.1456-1461
Hauptverfasser:	Gao, Y., Guitard, N., Salamero, C., Bafleur, M., Bary, L., Escotte, L., Gueulle, P., Lescouzeres, L.
Format:	Artikel
Sprache:	eng
Schlagworte:	Applied sciences Circuit properties Design. Technologies. Operation analysis. Testing Electric, optical and optoelectronic circuits Electronic circuits Electronics Engineering Sciences Exact sciences and technology Integrated circuits Micro and nanotechnologies Microelectronics Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices Signal convertors
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