Atomic and electrostatic force microscopy observations on gallium nitride

The aim of this paper is to precise the interest of scanning force microscopy (SFM) observations on gallium nitride films.They These observations concern the atomic force microscopy (AFM) and, more especially, the electrostatic force microscopy (EFM) and electrical force gradient microscopy (EFGM)....

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Veröffentlicht in:	Physica status solidi. A, Applications and materials science Applications and materials science, 2003-02, Vol.195 (3), p.508-515
Hauptverfasser:	Girard, P., Cadet, Ph, Ramonda, M., Shmidt, N., Usikov, A. N., Lundin, W. V., Dunaevskii, M. S., Titkov, A. N.
Format:	Artikel
Sprache:	eng
Schlagworte:	68.35.Dv 68.37.Ps 68.55.Jk 68.55.Ln Electronics Engineering Sciences
Online-Zugang:	Volltext
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