Strain-Fields Effects and Reversal of the Nature of the Fundamental Valence Band of ZnO Epilayers

Strain-Fields Effects and Reversal of the Nature of the Fundamental Valence Band of ZnO Epilayers

Authors examine the influence of strain fields in ZnO epilayers. Authors show that a reversal of the nature of the fundamental valence band can be observed similarily to what was reported in GaN epilayers. 19 refs.

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Veröffentlicht in:Japanese Journal of Applied Physics 2001-01, Vol.40 (10B), p.L1089-L1092
Hauptverfasser: Gil, Bernard, Lusson, Alain, Sallet, Vincent, Said-Hassani, Said-Assoumani, Triboulet, Robert, Bigenwald, Pierre
Format: Artikel
Sprache:eng
Schlagworte:
Engineering Sciences
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Zusammenfassung:Authors examine the influence of strain fields in ZnO epilayers. Authors show that a reversal of the nature of the fundamental valence band can be observed similarily to what was reported in GaN epilayers. 19 refs.
ISSN:0021-4922
1347-4065
DOI:10.1143/JJAP.40.L1089