$Comments on `On the reliability of fully automatic indexing of electron diffraction patterns obtained in a transmission electron microscope' by Morawiec & Bouzy (2006)$

Comments on `On the reliability of fully automatic indexing of electron diffraction patterns obtained in a transmission electron microscope' by Morawiec & Bouzy (2006)

The limitation of automatic indexing of electron diffraction patterns raised by Morawiec & Bouzy [(2006). J. Appl. Cryst.39, 101103] is discussed. The theoretical problem related to the famous 180° ambiguity may be surmounted by adequate technical improvements. Three solutions to avoid misindexi...

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Veröffentlicht in:	Journal of applied crystallography 2006-02, Vol.39 (1), p.104-105
Hauptverfasser:	Rauch, Edgar F., Dupuy, Laurent
Format:	Artikel
Sprache:	eng
Schlagworte:	automatic indexing Chemical and Process Engineering Chemical Sciences Condensed matter: structure, mechanical and thermal properties Crystalline state (including molecular motions in solids) electron diffraction patterns Electron, ion, and scanning probe microscopy Engineering Sciences Exact sciences and technology Material chemistry Physics Structure of solids and liquids crystallography Theory of crystal structure, crystal symmetry calculations and modeling Transmission, reflection and scanning electron microscopy(including ebic)
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Zusammenfassung:	The limitation of automatic indexing of electron diffraction patterns raised by Morawiec & Bouzy [(2006). J. Appl. Cryst.39, 101103] is discussed. The theoretical problem related to the famous 180° ambiguity may be surmounted by adequate technical improvements. Three solutions to avoid misindexing are briefly described.
ISSN:	1600-5767 0021-8898 1600-5767
DOI:	10.1107/S0021889805033157