Ultra-Low Dark Current HgCdTe Detector in SWIR for Space Applications

This paper presents recent developments at Commissariat à l’Energie atomique, Laboratoire d’Electronique et de Technologie de l’Information infrared laboratory on processing and characterization of p -on- n HgCdTe (MCT) planar infrared focal plane arrays (FPAs) in short-wave infrared (SWIR) spectral...

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Veröffentlicht in:	Journal of electronic materials 2017-10, Vol.46 (10), p.6142-6149
Hauptverfasser:	Cervera, C., Boulade, O., Gravrand, O., Lobre, C., Guellec, F., Sanson, E., Ballet, P., Santailler, J. L., Moreau, V., Zanatta, J. P., Fieque, B., Castelein, P.
Format:	Artikel
Sprache:	eng
Schlagworte:	Architecture Astrophysics Band spectra Cadmium zinc tellurides Characterization and Evaluation of Materials Chemistry and Materials Science Circuits Dark current Electronics and Microelectronics Engineering Sciences Epitaxial growth Flux Focal plane devices Infrared spectra Instrumentation Lattice matching Lattice vacancies Liquid phase epitaxy Materials Science Metallurgical analysis Molecular beam epitaxy Operating temperature Optical and Electronic Materials Photodiodes Solid State Physics Space applications Spectral bands
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