AODO: Secondary ion emission and surface modification
In order to study the sputtering of secondary ions from well characterized surfaces, we constructed a new UHV system named AODO. It consists of a detector chamber, a target preparation and analysis chamber, and a target transfer rod. We present the lay-out of this new instrument. The detector allows...
Gespeichert in:
| Veröffentlicht in: | Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms Beam interactions with materials and atoms, 2009-02, Vol.267 (4), p.649-651 |
|---|---|
| Hauptverfasser: | , , , , , , , , , , , , |
| Format: | Artikel |
| Sprache: | eng |
| Schlagworte: | |
| Online-Zugang: | Volltext |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| container_end_page | 651 |
|---|---|
| container_issue | 4 |
| container_start_page | 649 |
| container_title | Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms |
| container_volume | 267 |
| creator | Akcöltekin, S. Alzaher, I. Ban d’Etat, B. Been, T. Boduch, P. Cassimi, A. Hijazi, H. Lebius, H. Manil, B. Ramillon, J.M. Rothard, H. Schleberger, M. da Silveira, E.F. |
| description | In order to study the sputtering of secondary ions from well characterized surfaces, we constructed a new UHV system named AODO. It consists of a detector chamber, a target preparation and analysis chamber, and a target transfer rod. We present the lay-out of this new instrument. The detector allows measuring the time-of-flight of emitted secondary ions and their position on a 2D imaging detector (XY-TOF imaging technique). The analysis chamber can be used to study surface modification by means of LEED (low energy electron diffraction). We show preliminary results of the evolution of the LEED patterns as a function of the projectile fluence during irradiation of HOPG (highly oriented pyrolytic graphite) with slow Xe14+ ions at ARIBE (the low energy, highly charged ion beam line of the French heavy ion accelerator GANIL). |
| doi_str_mv | 10.1016/j.nimb.2008.11.018 |
| format | Article |
| fullrecord | <record><control><sourceid>elsevier_hal_p</sourceid><recordid>TN_cdi_hal_primary_oai_HAL_cea_00374510v1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><els_id>S0168583X08012615</els_id><sourcerecordid>S0168583X08012615</sourcerecordid><originalsourceid>FETCH-LOGICAL-c334t-2b3e6639ef36f6c809286f2b3c7de0507cbdd43989b59e172c75e2e9d5ee6d463</originalsourceid><addsrcrecordid>eNp9kE1LAzEQhoMoWKt_wNNePeyaj002ES-lVisUelDBW8gmE0zp7kqyFvz3Zql4dC4zzLzvMPMgdE1wRTARt7uqD11bUYxlRUiFiTxBMyIbWiou61M0yyJZcsnez9FFSjucgzM-Q3yxfdjeFS9gh96Z-F2EoS-gCylNheldkb6iNxaKbnDBB2vGPLhEZ97sE1z95jl6e1y9LtflZvv0vFxsSstYPZa0ZSAEU-CZ8MJKrKgUPndt4wBz3NjWuZopqVqugDTUNhwoKMcBhKsFm6Ob494Ps9efMXT5Qj2YoNeLjbZgNMasqTnBB5K19Ki1cUgpgv8zEKwnSHqnJ0h6gqQJ0RlSNt0fTZC_OASIOtkAvQUXIthRuyH8Z_8Bzt5uqw</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype></control><display><type>article</type><title>AODO: Secondary ion emission and surface modification</title><source>ScienceDirect Journals (5 years ago - present)</source><creator>Akcöltekin, S. ; Alzaher, I. ; Ban d’Etat, B. ; Been, T. ; Boduch, P. ; Cassimi, A. ; Hijazi, H. ; Lebius, H. ; Manil, B. ; Ramillon, J.M. ; Rothard, H. ; Schleberger, M. ; da Silveira, E.F.</creator><creatorcontrib>Akcöltekin, S. ; Alzaher, I. ; Ban d’Etat, B. ; Been, T. ; Boduch, P. ; Cassimi, A. ; Hijazi, H. ; Lebius, H. ; Manil, B. ; Ramillon, J.M. ; Rothard, H. ; Schleberger, M. ; da Silveira, E.F.</creatorcontrib><description>In order to study the sputtering of secondary ions from well characterized surfaces, we constructed a new UHV system named AODO. It consists of a detector chamber, a target preparation and analysis chamber, and a target transfer rod. We present the lay-out of this new instrument. The detector allows measuring the time-of-flight of emitted secondary ions and their position on a 2D imaging detector (XY-TOF imaging technique). The analysis chamber can be used to study surface modification by means of LEED (low energy electron diffraction). We show preliminary results of the evolution of the LEED patterns as a function of the projectile fluence during irradiation of HOPG (highly oriented pyrolytic graphite) with slow Xe14+ ions at ARIBE (the low energy, highly charged ion beam line of the French heavy ion accelerator GANIL).</description><identifier>ISSN: 0168-583X</identifier><identifier>ISSN: 1872-9584</identifier><identifier>EISSN: 1872-9584</identifier><identifier>EISSN: 0168-583X</identifier><identifier>DOI: 10.1016/j.nimb.2008.11.018</identifier><language>eng</language><publisher>Elsevier B.V</publisher><subject>Condensed Matter ; Highly charged ions ; LEED ; Materials Science ; Physics ; Sputtering ; Surface structure</subject><ispartof>Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 2009-02, Vol.267 (4), p.649-651</ispartof><rights>2008 Elsevier B.V.</rights><rights>Distributed under a Creative Commons Attribution 4.0 International License</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c334t-2b3e6639ef36f6c809286f2b3c7de0507cbdd43989b59e172c75e2e9d5ee6d463</citedby><cites>FETCH-LOGICAL-c334t-2b3e6639ef36f6c809286f2b3c7de0507cbdd43989b59e172c75e2e9d5ee6d463</cites><orcidid>0000-0002-4347-3073 ; 0000-0002-3367-4066</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://dx.doi.org/10.1016/j.nimb.2008.11.018$$EHTML$$P50$$Gelsevier$$H</linktohtml><link.rule.ids>230,314,780,784,885,3550,27924,27925,45995</link.rule.ids><backlink>$$Uhttps://cea.hal.science/cea-00374510$$DView record in HAL$$Hfree_for_read</backlink></links><search><creatorcontrib>Akcöltekin, S.</creatorcontrib><creatorcontrib>Alzaher, I.</creatorcontrib><creatorcontrib>Ban d’Etat, B.</creatorcontrib><creatorcontrib>Been, T.</creatorcontrib><creatorcontrib>Boduch, P.</creatorcontrib><creatorcontrib>Cassimi, A.</creatorcontrib><creatorcontrib>Hijazi, H.</creatorcontrib><creatorcontrib>Lebius, H.</creatorcontrib><creatorcontrib>Manil, B.</creatorcontrib><creatorcontrib>Ramillon, J.M.</creatorcontrib><creatorcontrib>Rothard, H.</creatorcontrib><creatorcontrib>Schleberger, M.</creatorcontrib><creatorcontrib>da Silveira, E.F.</creatorcontrib><title>AODO: Secondary ion emission and surface modification</title><title>Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms</title><description>In order to study the sputtering of secondary ions from well characterized surfaces, we constructed a new UHV system named AODO. It consists of a detector chamber, a target preparation and analysis chamber, and a target transfer rod. We present the lay-out of this new instrument. The detector allows measuring the time-of-flight of emitted secondary ions and their position on a 2D imaging detector (XY-TOF imaging technique). The analysis chamber can be used to study surface modification by means of LEED (low energy electron diffraction). We show preliminary results of the evolution of the LEED patterns as a function of the projectile fluence during irradiation of HOPG (highly oriented pyrolytic graphite) with slow Xe14+ ions at ARIBE (the low energy, highly charged ion beam line of the French heavy ion accelerator GANIL).</description><subject>Condensed Matter</subject><subject>Highly charged ions</subject><subject>LEED</subject><subject>Materials Science</subject><subject>Physics</subject><subject>Sputtering</subject><subject>Surface structure</subject><issn>0168-583X</issn><issn>1872-9584</issn><issn>1872-9584</issn><issn>0168-583X</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2009</creationdate><recordtype>article</recordtype><recordid>eNp9kE1LAzEQhoMoWKt_wNNePeyaj002ES-lVisUelDBW8gmE0zp7kqyFvz3Zql4dC4zzLzvMPMgdE1wRTARt7uqD11bUYxlRUiFiTxBMyIbWiou61M0yyJZcsnez9FFSjucgzM-Q3yxfdjeFS9gh96Z-F2EoS-gCylNheldkb6iNxaKbnDBB2vGPLhEZ97sE1z95jl6e1y9LtflZvv0vFxsSstYPZa0ZSAEU-CZ8MJKrKgUPndt4wBz3NjWuZopqVqugDTUNhwoKMcBhKsFm6Ob494Ps9efMXT5Qj2YoNeLjbZgNMasqTnBB5K19Ki1cUgpgv8zEKwnSHqnJ0h6gqQJ0RlSNt0fTZC_OASIOtkAvQUXIthRuyH8Z_8Bzt5uqw</recordid><startdate>20090201</startdate><enddate>20090201</enddate><creator>Akcöltekin, S.</creator><creator>Alzaher, I.</creator><creator>Ban d’Etat, B.</creator><creator>Been, T.</creator><creator>Boduch, P.</creator><creator>Cassimi, A.</creator><creator>Hijazi, H.</creator><creator>Lebius, H.</creator><creator>Manil, B.</creator><creator>Ramillon, J.M.</creator><creator>Rothard, H.</creator><creator>Schleberger, M.</creator><creator>da Silveira, E.F.</creator><general>Elsevier B.V</general><general>Elsevier</general><scope>AAYXX</scope><scope>CITATION</scope><scope>1XC</scope><orcidid>https://orcid.org/0000-0002-4347-3073</orcidid><orcidid>https://orcid.org/0000-0002-3367-4066</orcidid></search><sort><creationdate>20090201</creationdate><title>AODO: Secondary ion emission and surface modification</title><author>Akcöltekin, S. ; Alzaher, I. ; Ban d’Etat, B. ; Been, T. ; Boduch, P. ; Cassimi, A. ; Hijazi, H. ; Lebius, H. ; Manil, B. ; Ramillon, J.M. ; Rothard, H. ; Schleberger, M. ; da Silveira, E.F.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c334t-2b3e6639ef36f6c809286f2b3c7de0507cbdd43989b59e172c75e2e9d5ee6d463</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2009</creationdate><topic>Condensed Matter</topic><topic>Highly charged ions</topic><topic>LEED</topic><topic>Materials Science</topic><topic>Physics</topic><topic>Sputtering</topic><topic>Surface structure</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Akcöltekin, S.</creatorcontrib><creatorcontrib>Alzaher, I.</creatorcontrib><creatorcontrib>Ban d’Etat, B.</creatorcontrib><creatorcontrib>Been, T.</creatorcontrib><creatorcontrib>Boduch, P.</creatorcontrib><creatorcontrib>Cassimi, A.</creatorcontrib><creatorcontrib>Hijazi, H.</creatorcontrib><creatorcontrib>Lebius, H.</creatorcontrib><creatorcontrib>Manil, B.</creatorcontrib><creatorcontrib>Ramillon, J.M.</creatorcontrib><creatorcontrib>Rothard, H.</creatorcontrib><creatorcontrib>Schleberger, M.</creatorcontrib><creatorcontrib>da Silveira, E.F.</creatorcontrib><collection>CrossRef</collection><collection>Hyper Article en Ligne (HAL)</collection><jtitle>Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Akcöltekin, S.</au><au>Alzaher, I.</au><au>Ban d’Etat, B.</au><au>Been, T.</au><au>Boduch, P.</au><au>Cassimi, A.</au><au>Hijazi, H.</au><au>Lebius, H.</au><au>Manil, B.</au><au>Ramillon, J.M.</au><au>Rothard, H.</au><au>Schleberger, M.</au><au>da Silveira, E.F.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>AODO: Secondary ion emission and surface modification</atitle><jtitle>Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms</jtitle><date>2009-02-01</date><risdate>2009</risdate><volume>267</volume><issue>4</issue><spage>649</spage><epage>651</epage><pages>649-651</pages><issn>0168-583X</issn><issn>1872-9584</issn><eissn>1872-9584</eissn><eissn>0168-583X</eissn><abstract>In order to study the sputtering of secondary ions from well characterized surfaces, we constructed a new UHV system named AODO. It consists of a detector chamber, a target preparation and analysis chamber, and a target transfer rod. We present the lay-out of this new instrument. The detector allows measuring the time-of-flight of emitted secondary ions and their position on a 2D imaging detector (XY-TOF imaging technique). The analysis chamber can be used to study surface modification by means of LEED (low energy electron diffraction). We show preliminary results of the evolution of the LEED patterns as a function of the projectile fluence during irradiation of HOPG (highly oriented pyrolytic graphite) with slow Xe14+ ions at ARIBE (the low energy, highly charged ion beam line of the French heavy ion accelerator GANIL).</abstract><pub>Elsevier B.V</pub><doi>10.1016/j.nimb.2008.11.018</doi><tpages>3</tpages><orcidid>https://orcid.org/0000-0002-4347-3073</orcidid><orcidid>https://orcid.org/0000-0002-3367-4066</orcidid></addata></record> |
| fulltext | fulltext |
| identifier | ISSN: 0168-583X |
| ispartof | Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 2009-02, Vol.267 (4), p.649-651 |
| issn | 0168-583X 1872-9584 1872-9584 0168-583X |
| language | eng |
| recordid | cdi_hal_primary_oai_HAL_cea_00374510v1 |
| source | ScienceDirect Journals (5 years ago - present) |
| subjects | Condensed Matter Highly charged ions LEED Materials Science Physics Sputtering Surface structure |
| title | AODO: Secondary ion emission and surface modification |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-05T18%3A56%3A55IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-elsevier_hal_p&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=AODO:%20Secondary%20ion%20emission%20and%20surface%20modification&rft.jtitle=Nuclear%20instruments%20&%20methods%20in%20physics%20research.%20Section%20B,%20Beam%20interactions%20with%20materials%20and%20atoms&rft.au=Akc%C3%B6ltekin,%20S.&rft.date=2009-02-01&rft.volume=267&rft.issue=4&rft.spage=649&rft.epage=651&rft.pages=649-651&rft.issn=0168-583X&rft.eissn=1872-9584&rft_id=info:doi/10.1016/j.nimb.2008.11.018&rft_dat=%3Celsevier_hal_p%3ES0168583X08012615%3C/elsevier_hal_p%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rft_els_id=S0168583X08012615&rfr_iscdi=true |