Design, calibration and validation of a low-cost broadband add-on RF-EMF exposure sensor for legacy and 5G NR technologies

Design, calibration and validation of a low-cost broadband add-on RF-EMF exposure sensor for legacy and 5G NR technologies

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: Van Bladel, Han, Deprez, Kenneth, Stroobandt, Bram, Goegebeur, Samuel, Aerts, Sam, Verloock, Leen, Velghe, Maarten, Joseph, Wout
Format: Tagungsbericht
Sprache:eng
Schlagworte:
Technology and Engineering
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page
container_issue
container_start_page
container_title
container_volume
creator Van Bladel, Han
Deprez, Kenneth
Stroobandt, Bram
Goegebeur, Samuel
Aerts, Sam
Verloock, Leen
Velghe, Maarten
Joseph, Wout
description
format Conference Proceeding
fullrecord <record><control><sourceid>ghent_ADGLB</sourceid><recordid>TN_cdi_ghent_librecat_oai_archive_ugent_be_01HW2DAG5FVF77EAERZ98645D4</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>oai_archive_ugent_be_01HW2DAG5FVF77EAERZ98645D4</sourcerecordid><originalsourceid>FETCH-ghent_librecat_oai_archive_ugent_be_01HW2DAG5FVF77EAERZ98645D43</originalsourceid><addsrcrecordid>eNqtjs1OwzAQhHPhgCjvsA9ApBYaAseK2O2FHqIKJC7Wxt44lixvZbs_8PQkLY_AYTQafaPR3BY_DSVnwwNo9K6LmB0HwGDgOGZzjdwDgudTqTll6CKj6aYKGlOOuJWleJdA5z2nQyRIFBJH6Ed5sqi_L3vVGrYtZNJDYM_WUZoVNz36RPd_flcIKXZvm9IOFLKa7pDGrBidwqgHdyR1sBPqSM0Xm8_HZrWu5Iesa7ES7dfry_OyapZP_7XzC0XaXrY</addsrcrecordid><sourcetype>Institutional Repository</sourcetype><iscdi>true</iscdi><recordtype>conference_proceeding</recordtype></control><display><type>conference_proceeding</type><title>Design, calibration and validation of a low-cost broadband add-on RF-EMF exposure sensor for legacy and 5G NR technologies</title><source>Ghent University Academic Bibliography</source><creator>Van Bladel, Han ; Deprez, Kenneth ; Stroobandt, Bram ; Goegebeur, Samuel ; Aerts, Sam ; Verloock, Leen ; Velghe, Maarten ; Joseph, Wout</creator><creatorcontrib>Van Bladel, Han ; Deprez, Kenneth ; Stroobandt, Bram ; Goegebeur, Samuel ; Aerts, Sam ; Verloock, Leen ; Velghe, Maarten ; Joseph, Wout</creatorcontrib><language>eng</language><subject>Technology and Engineering</subject><creationdate>2023</creationdate><rights>No license (in copyright) info:eu-repo/semantics/openAccess</rights><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>309,315,776,4036,27837</link.rule.ids><linktorsrc>$$Uhttp://hdl.handle.net/1854/LU-01HW2DAG5FVF77EAERZ98645D4$$EView_record_in_Ghent_University$$FView_record_in_$$GGhent_University$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>Van Bladel, Han</creatorcontrib><creatorcontrib>Deprez, Kenneth</creatorcontrib><creatorcontrib>Stroobandt, Bram</creatorcontrib><creatorcontrib>Goegebeur, Samuel</creatorcontrib><creatorcontrib>Aerts, Sam</creatorcontrib><creatorcontrib>Verloock, Leen</creatorcontrib><creatorcontrib>Velghe, Maarten</creatorcontrib><creatorcontrib>Joseph, Wout</creatorcontrib><title>Design, calibration and validation of a low-cost broadband add-on RF-EMF exposure sensor for legacy and 5G NR technologies</title><subject>Technology and Engineering</subject><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2023</creationdate><recordtype>conference_proceeding</recordtype><sourceid>ADGLB</sourceid><recordid>eNqtjs1OwzAQhHPhgCjvsA9ApBYaAseK2O2FHqIKJC7Wxt44lixvZbs_8PQkLY_AYTQafaPR3BY_DSVnwwNo9K6LmB0HwGDgOGZzjdwDgudTqTll6CKj6aYKGlOOuJWleJdA5z2nQyRIFBJH6Ed5sqi_L3vVGrYtZNJDYM_WUZoVNz36RPd_flcIKXZvm9IOFLKa7pDGrBidwqgHdyR1sBPqSM0Xm8_HZrWu5Iesa7ES7dfry_OyapZP_7XzC0XaXrY</recordid><startdate>2023</startdate><enddate>2023</enddate><creator>Van Bladel, Han</creator><creator>Deprez, Kenneth</creator><creator>Stroobandt, Bram</creator><creator>Goegebeur, Samuel</creator><creator>Aerts, Sam</creator><creator>Verloock, Leen</creator><creator>Velghe, Maarten</creator><creator>Joseph, Wout</creator><scope>ADGLB</scope></search><sort><creationdate>2023</creationdate><title>Design, calibration and validation of a low-cost broadband add-on RF-EMF exposure sensor for legacy and 5G NR technologies</title><author>Van Bladel, Han ; Deprez, Kenneth ; Stroobandt, Bram ; Goegebeur, Samuel ; Aerts, Sam ; Verloock, Leen ; Velghe, Maarten ; Joseph, Wout</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-ghent_librecat_oai_archive_ugent_be_01HW2DAG5FVF77EAERZ98645D43</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2023</creationdate><topic>Technology and Engineering</topic><toplevel>online_resources</toplevel><creatorcontrib>Van Bladel, Han</creatorcontrib><creatorcontrib>Deprez, Kenneth</creatorcontrib><creatorcontrib>Stroobandt, Bram</creatorcontrib><creatorcontrib>Goegebeur, Samuel</creatorcontrib><creatorcontrib>Aerts, Sam</creatorcontrib><creatorcontrib>Verloock, Leen</creatorcontrib><creatorcontrib>Velghe, Maarten</creatorcontrib><creatorcontrib>Joseph, Wout</creatorcontrib><collection>Ghent University Academic Bibliography</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Van Bladel, Han</au><au>Deprez, Kenneth</au><au>Stroobandt, Bram</au><au>Goegebeur, Samuel</au><au>Aerts, Sam</au><au>Verloock, Leen</au><au>Velghe, Maarten</au><au>Joseph, Wout</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Design, calibration and validation of a low-cost broadband add-on RF-EMF exposure sensor for legacy and 5G NR technologies</atitle><date>2023</date><risdate>2023</risdate><oa>free_for_read</oa></addata></record>
fulltext fulltext_linktorsrc
identifier
ispartof
issn
language eng
recordid cdi_ghent_librecat_oai_archive_ugent_be_01HW2DAG5FVF77EAERZ98645D4
source Ghent University Academic Bibliography
subjects Technology and Engineering
title Design, calibration and validation of a low-cost broadband add-on RF-EMF exposure sensor for legacy and 5G NR technologies
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-13T04%3A13%3A38IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-ghent_ADGLB&rft_val_fmt=info:ofi/fmt:kev:mtx:book&rft.genre=proceeding&rft.atitle=Design,%20calibration%20and%20validation%20of%20a%20low-cost%20broadband%20add-on%20RF-EMF%20exposure%20sensor%20for%20legacy%20and%205G%20NR%20technologies&rft.au=Van%20Bladel,%20Han&rft.date=2023&rft_id=info:doi/&rft_dat=%3Cghent_ADGLB%3Eoai_archive_ugent_be_01HW2DAG5FVF77EAERZ98645D4%3C/ghent_ADGLB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true