Optimization of conditions of the direct atomic emission analysis of oxide-silicate materials
The matrix effect of silicon on the intensity of analytical lines of admixtures has been studied in the systems silicone oxide-graphite powder and silicon oxide-carrier-graphite powder. The composition of the spectroscopic buffer and the conditions of the direct spectrochemical analysis of oxide-sil...
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| Veröffentlicht in: | Journal of analytical chemistry (New York, N.Y.) N.Y.), 2012-08, Vol.67 (8), p.722-727 |
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| container_end_page | 727 |
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| container_issue | 8 |
| container_start_page | 722 |
| container_title | Journal of analytical chemistry (New York, N.Y.) |
| container_volume | 67 |
| creator | Otmakhov, V. I. Petrova, E. V. Varlamova, N. V. Anoshkina, Yu. V. |
| description | The matrix effect of silicon on the intensity of analytical lines of admixtures has been studied in the systems silicone oxide-graphite powder and silicon oxide-carrier-graphite powder. The composition of the spectroscopic buffer and the conditions of the direct spectrochemical analysis of oxide-silicate materials (brick, concrete, refractory materials, slags, glass, ceramics, etc) have been optimized. An atomic emission procedure has been proposed and its preliminary performance characteristics have been estimated. |
| doi_str_mv | 10.1134/S1061934812080059 |
| format | Article |
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An atomic emission procedure has been proposed and its preliminary performance characteristics have been estimated.</description><subject>Analysis</subject><subject>Analytical Chemistry</subject><subject>Chemical properties</subject><subject>Chemistry</subject><subject>Chemistry and Materials Science</subject><subject>Emission spectroscopy</subject><subject>Oxides</subject><subject>Silicates</subject><issn>1061-9348</issn><issn>1608-3199</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2012</creationdate><recordtype>article</recordtype><recordid>eNp9kU1LAzEQhoMoWKs_wNuCJw9bk012mxxL8aNQKFg9ypJNZmvK7qYkKbT-erPWS7FIIDOTed5hyIvQLcEjQih7WBJcEEEZJxnmGOfiDA1IgXlKiRDnMY_ttO9foivv1xhjwUkxQB-LTTCt-ZLB2C6xdaJsp01f-L4Kn5Bo40CFRAbbGpVAa7zvWdnJZu_ND2Z3RkPqTWOUDJC08XJGNv4aXdQxwM1vHKL3p8e36Us6XzzPppN5qlg2DqniBc1JNeYgBVcC4spZxQvIuIyZ5kRULMt0rmtWCaxpIZmQdZQIWimgFR2iu8PclWygNF1tg5MqbqrKCRsLhnOeF5FKT1Ar6MDJxnZQm_h8xI9O8PHo-AnqpOD-SBCZALuwklvvy9ny9ZglB1Y5672Dutw400q3Lwkue0vLP5ZGTXbQ-Mh2K3Dl2m5d9MH_I_oGK_mhgA</recordid><startdate>20120801</startdate><enddate>20120801</enddate><creator>Otmakhov, V. 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| ispartof | Journal of analytical chemistry (New York, N.Y.), 2012-08, Vol.67 (8), p.722-727 |
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| language | eng |
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| subjects | Analysis Analytical Chemistry Chemical properties Chemistry Chemistry and Materials Science Emission spectroscopy Oxides Silicates |
| title | Optimization of conditions of the direct atomic emission analysis of oxide-silicate materials |
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