Single- and multi-locus genome-wide association study reveals genomic regions of thirteen yield-related traits in common wheat

Genetic dissection of yield-related traits can be used to improve wheat yield through molecular design breeding. In this study, we genotyped 245 wheat varieties and measured 13 yield-related plant height-, grain-, and spike-related traits, in seven environments, and identified 778 loci for these tra...

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Veröffentlicht in:BMC Plant Biology 2024, Vol.24 (1)
Hauptverfasser: Lv, Yuxia, Dong, Liansheng, Wang, Xiatong, Shen, Linhong, Lu, Wenbo, Si, Fan, Zhao, Yaoyao, Zhu, Guanju, Ding, Yiting, Cao, Shujun, Cao, Jiajia, Lu, Jie, Ma, Chuanxi, Chang, Cheng, Zhang, Haiping
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Sprache:eng
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