Single- and multi-locus genome-wide association study reveals genomic regions of thirteen yield-related traits in common wheat
Genetic dissection of yield-related traits can be used to improve wheat yield through molecular design breeding. In this study, we genotyped 245 wheat varieties and measured 13 yield-related plant height-, grain-, and spike-related traits, in seven environments, and identified 778 loci for these tra...
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Veröffentlicht in: | BMC Plant Biology 2024, Vol.24 (1) |
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Hauptverfasser: | , , , , , , , , , , , , , , |
Format: | Report |
Sprache: | eng |
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Online-Zugang: | Volltext |
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