Structural features of [Sm.sub.1-x][Eu.sub.x]S thin polycrystalline films

Thin polycrystalline [Sm.sub.1-x][Eu.sub.x]S films (x = 0.1, 0.167, 0.2, 0.25, 0.33, 0.5) were prepared by evaporation of SmS and EuS powders. Structural features of the films were investigated. The influence of Eu concentration and temperature of film deposition on the value of lattice parameter an...

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Veröffentlicht in:Semiconductors (Woodbury, N.Y.) N.Y.), 2017-06, Vol.51 (6), p.828
Hauptverfasser: Kaminskii, V.V, Solovev, S.M, Khavrov, G.D, Sharenkova, N.V, Hirai, Shinji
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Sprache:eng
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