Structural features of [Sm.sub.1-x][Eu.sub.x]S thin polycrystalline films
Thin polycrystalline [Sm.sub.1-x][Eu.sub.x]S films (x = 0.1, 0.167, 0.2, 0.25, 0.33, 0.5) were prepared by evaporation of SmS and EuS powders. Structural features of the films were investigated. The influence of Eu concentration and temperature of film deposition on the value of lattice parameter an...
Gespeichert in:
| Veröffentlicht in: | Semiconductors (Woodbury, N.Y.) N.Y.), 2017-06, Vol.51 (6), p.828 |
|---|---|
| Hauptverfasser: | , , , , |
| Format: | Artikel |
| Sprache: | eng |
| Schlagworte: | |
| Online-Zugang: | Volltext |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| container_end_page | |
|---|---|
| container_issue | 6 |
| container_start_page | 828 |
| container_title | Semiconductors (Woodbury, N.Y.) |
| container_volume | 51 |
| creator | Kaminskii, V.V Solovev, S.M Khavrov, G.D Sharenkova, N.V Hirai, Shinji |
| description | Thin polycrystalline [Sm.sub.1-x][Eu.sub.x]S films (x = 0.1, 0.167, 0.2, 0.25, 0.33, 0.5) were prepared by evaporation of SmS and EuS powders. Structural features of the films were investigated. The influence of Eu concentration and temperature of film deposition on the value of lattice parameter and sizes of X-ray coherent scattering regions was studied. It is shown that formation of [Sm.sub.1-x][Eu.sub.x]S films comes about according to the theory that was previously suggested for SmS films and that the deviation of lattice parameter is explained by the variable valence of samarium ions. |
| doi_str_mv | 10.1134/S1063782617060124 |
| format | Article |
| fullrecord | <record><control><sourceid>gale</sourceid><recordid>TN_cdi_gale_infotracacademiconefile_A498316557</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><galeid>A498316557</galeid><sourcerecordid>A498316557</sourcerecordid><originalsourceid>FETCH-gale_infotracacademiconefile_A4983165573</originalsourceid><addsrcrecordid>eNqVi0sOgjAURTvQRPwswFk3APZB-Tg0BqNjnBFCam21poChJYHdC8YNmDu4Jyc5CG2BeAAB3WVAoiBO_AhiEhHw6Qw5k3Int0BLY16EACQhddAls23HbdcyjaVgIwiDG4nzrPJMd_PA7Ys87b7cFxm2T1Xjd6MH3g7GMq1VLbBUujJrNJdMG7H5_Qp5p_R6PLsPpkWpatnYlvFxd1Ep3tRirER5oPskgCgM4-Dv4ANouklJ</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype></control><display><type>article</type><title>Structural features of [Sm.sub.1-x][Eu.sub.x]S thin polycrystalline films</title><source>SpringerLink Journals - AutoHoldings</source><creator>Kaminskii, V.V ; Solovev, S.M ; Khavrov, G.D ; Sharenkova, N.V ; Hirai, Shinji</creator><creatorcontrib>Kaminskii, V.V ; Solovev, S.M ; Khavrov, G.D ; Sharenkova, N.V ; Hirai, Shinji</creatorcontrib><description>Thin polycrystalline [Sm.sub.1-x][Eu.sub.x]S films (x = 0.1, 0.167, 0.2, 0.25, 0.33, 0.5) were prepared by evaporation of SmS and EuS powders. Structural features of the films were investigated. The influence of Eu concentration and temperature of film deposition on the value of lattice parameter and sizes of X-ray coherent scattering regions was studied. It is shown that formation of [Sm.sub.1-x][Eu.sub.x]S films comes about according to the theory that was previously suggested for SmS films and that the deviation of lattice parameter is explained by the variable valence of samarium ions.</description><identifier>ISSN: 1063-7826</identifier><identifier>DOI: 10.1134/S1063782617060124</identifier><language>eng</language><publisher>Springer</publisher><subject>Rare earth metal compounds ; Solid solutions ; Thin films</subject><ispartof>Semiconductors (Woodbury, N.Y.), 2017-06, Vol.51 (6), p.828</ispartof><rights>COPYRIGHT 2017 Springer</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,780,784,27924,27925</link.rule.ids></links><search><creatorcontrib>Kaminskii, V.V</creatorcontrib><creatorcontrib>Solovev, S.M</creatorcontrib><creatorcontrib>Khavrov, G.D</creatorcontrib><creatorcontrib>Sharenkova, N.V</creatorcontrib><creatorcontrib>Hirai, Shinji</creatorcontrib><title>Structural features of [Sm.sub.1-x][Eu.sub.x]S thin polycrystalline films</title><title>Semiconductors (Woodbury, N.Y.)</title><description>Thin polycrystalline [Sm.sub.1-x][Eu.sub.x]S films (x = 0.1, 0.167, 0.2, 0.25, 0.33, 0.5) were prepared by evaporation of SmS and EuS powders. Structural features of the films were investigated. The influence of Eu concentration and temperature of film deposition on the value of lattice parameter and sizes of X-ray coherent scattering regions was studied. It is shown that formation of [Sm.sub.1-x][Eu.sub.x]S films comes about according to the theory that was previously suggested for SmS films and that the deviation of lattice parameter is explained by the variable valence of samarium ions.</description><subject>Rare earth metal compounds</subject><subject>Solid solutions</subject><subject>Thin films</subject><issn>1063-7826</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2017</creationdate><recordtype>article</recordtype><sourceid/><recordid>eNqVi0sOgjAURTvQRPwswFk3APZB-Tg0BqNjnBFCam21poChJYHdC8YNmDu4Jyc5CG2BeAAB3WVAoiBO_AhiEhHw6Qw5k3Int0BLY16EACQhddAls23HbdcyjaVgIwiDG4nzrPJMd_PA7Ys87b7cFxm2T1Xjd6MH3g7GMq1VLbBUujJrNJdMG7H5_Qp5p_R6PLsPpkWpatnYlvFxd1Ep3tRirER5oPskgCgM4-Dv4ANouklJ</recordid><startdate>20170601</startdate><enddate>20170601</enddate><creator>Kaminskii, V.V</creator><creator>Solovev, S.M</creator><creator>Khavrov, G.D</creator><creator>Sharenkova, N.V</creator><creator>Hirai, Shinji</creator><general>Springer</general><scope/></search><sort><creationdate>20170601</creationdate><title>Structural features of [Sm.sub.1-x][Eu.sub.x]S thin polycrystalline films</title><author>Kaminskii, V.V ; Solovev, S.M ; Khavrov, G.D ; Sharenkova, N.V ; Hirai, Shinji</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-gale_infotracacademiconefile_A4983165573</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2017</creationdate><topic>Rare earth metal compounds</topic><topic>Solid solutions</topic><topic>Thin films</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Kaminskii, V.V</creatorcontrib><creatorcontrib>Solovev, S.M</creatorcontrib><creatorcontrib>Khavrov, G.D</creatorcontrib><creatorcontrib>Sharenkova, N.V</creatorcontrib><creatorcontrib>Hirai, Shinji</creatorcontrib><jtitle>Semiconductors (Woodbury, N.Y.)</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Kaminskii, V.V</au><au>Solovev, S.M</au><au>Khavrov, G.D</au><au>Sharenkova, N.V</au><au>Hirai, Shinji</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Structural features of [Sm.sub.1-x][Eu.sub.x]S thin polycrystalline films</atitle><jtitle>Semiconductors (Woodbury, N.Y.)</jtitle><date>2017-06-01</date><risdate>2017</risdate><volume>51</volume><issue>6</issue><spage>828</spage><pages>828-</pages><issn>1063-7826</issn><abstract>Thin polycrystalline [Sm.sub.1-x][Eu.sub.x]S films (x = 0.1, 0.167, 0.2, 0.25, 0.33, 0.5) were prepared by evaporation of SmS and EuS powders. Structural features of the films were investigated. The influence of Eu concentration and temperature of film deposition on the value of lattice parameter and sizes of X-ray coherent scattering regions was studied. It is shown that formation of [Sm.sub.1-x][Eu.sub.x]S films comes about according to the theory that was previously suggested for SmS films and that the deviation of lattice parameter is explained by the variable valence of samarium ions.</abstract><pub>Springer</pub><doi>10.1134/S1063782617060124</doi></addata></record> |
| fulltext | fulltext |
| identifier | ISSN: 1063-7826 |
| ispartof | Semiconductors (Woodbury, N.Y.), 2017-06, Vol.51 (6), p.828 |
| issn | 1063-7826 |
| language | eng |
| recordid | cdi_gale_infotracacademiconefile_A498316557 |
| source | SpringerLink Journals - AutoHoldings |
| subjects | Rare earth metal compounds Solid solutions Thin films |
| title | Structural features of [Sm.sub.1-x][Eu.sub.x]S thin polycrystalline films |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-23T08%3A46%3A56IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-gale&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Structural%20features%20of%20%5BSm.sub.1-x%5D%5BEu.sub.x%5DS%20thin%20polycrystalline%20films&rft.jtitle=Semiconductors%20(Woodbury,%20N.Y.)&rft.au=Kaminskii,%20V.V&rft.date=2017-06-01&rft.volume=51&rft.issue=6&rft.spage=828&rft.pages=828-&rft.issn=1063-7826&rft_id=info:doi/10.1134/S1063782617060124&rft_dat=%3Cgale%3EA498316557%3C/gale%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rft_galeid=A498316557&rfr_iscdi=true |